Method for high-throughput screening of photochemical catalysts based on photoelectric property and special chip thereof
A photocatalyst and photoelectric performance technology, which is applied in the direction of measuring devices, material analysis through optical means, instruments, etc., can solve the problems of several hours to tens of hours, low photocatalyst efficiency, singleness, etc., and achieve time-consuming short effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0030] image 3 It is a typical photocurrent time domain test curve.
[0031] The ZnO sample is selected for this test, the light source is an ultraviolet LED lamp with a wavelength of 365nm, and the electric field is a DC voltage of 1V output by a common regulated power supply. During the test, the following operations are performed in sequence, the DC 1V bias is turned on at 20 seconds, the light source is turned on at 40 seconds, and the light source is turned off at 450 seconds.
[0032] The entire photocurrent time-domain test curve can be divided into three parts. After the power is turned on, the stage before the light is turned on is the dark state stable stage; the process of lighting is the photocurrent response stage; the stage after the light is turned off is the photocurrent relaxation stage. Among them, the photocurrent in the dark state stable stage indicates the dark current of the semiconductor material, which corresponds to the information of the carrier ba...
Embodiment 2
[0035] Figure 4 It is a typical photocurrent frequency domain test curve.
[0036] The ZnO sample was chosen for this test. The light source is a full-spectrum xenon lamp, followed by a monochromator to realize the output of a controllable single-wavelength light source. The bias voltage is selected as the DC voltage 1V output by the common regulated power supply. During the test process, the following operations are carried out, the voltage of 1V is always kept on, the monochromator is controlled to output a single wavelength light source from 200nm to 900nm at a rate of 1nm / s, and the current change in the circuit is recorded. This test process is called Forward photocurrent frequency domain test curve. Correspondingly, if other conditions remain unchanged, and the output wavelength is from 900nm to 200nm, we call this process the reverse photocurrent frequency domain test curve. Figure 4 That is, the forward and reverse photocurrent test curves in this typical embodim...
Embodiment 3
[0039] Figure 5 It is a typical light excitation gas sensitivity test curve.
[0040] ZnO and TiO were chosen for this test 2 For the sample, the light source is a 365nm ultraviolet LED flat light source. The bias voltage is selected as the DC voltage 1V output by the common regulated power supply. The organic atmosphere is 75ppm formaldehyde gas. During the test, the following operations are performed, the external bias voltage and the ultraviolet light source are turned on in turn, and after the photocurrent reaches a steady state, the formaldehyde atmosphere is introduced (the air flow rate is 500ml / min), and different materials will show different response dynamics. ,Such as Figure 5 shown. The relevant information of the material depletion layer can be analyzed through the difference of the response rate. The depletion layer is an important structure for separating photogenerated electron holes. Generally, the more sensitive it is to the reducing atmosphere (sensi...
PUM
| Property | Measurement | Unit |
|---|---|---|
| Wavelength | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More