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Pinpoint enhanced dark-field microscope, electrochemical testing device and leveling system

A dark-field microscope and electrochemical technology, which is applied in measuring devices, scanning probe microscopy, scanning probe technology, etc., can solve the problems of unstable test results, difficulty in approaching, and affecting the accuracy of results, etc.

Inactive Publication Date: 2012-11-28
XIAMEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This makes the tunneling / feedback current of the probe or the interaction force with the surface damage the substrate surface to a certain extent, especially disturbing the electric double layer at the electrode interface, which affects the accuracy of the results and also affects its space. resolution
In addition, the signal-to-noise ratio of dark-field optical microscopes based on SNOM cannot achieve the true dark-field effect
For the needle-tip enhancement technology developed in recent years, although it can perform nanoscale morphology characterization and nano-local spectral characterization of samples, there are still shortcomings such as unstable test results, easy damage to the needle tip, and difficulty in approaching.

Method used

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  • Pinpoint enhanced dark-field microscope, electrochemical testing device and leveling system
  • Pinpoint enhanced dark-field microscope, electrochemical testing device and leveling system
  • Pinpoint enhanced dark-field microscope, electrochemical testing device and leveling system

Examples

Experimental program
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Effect test

preparation example Construction

[0054] The preparation method for producing near-field enhanced incident optical fiber probes, that is, the method for modifying the metal nanoparticles to the tip of the hollow optical fiber probe, includes: negative pressure suction method; electrodeposition method; sol method ; laser stretching method; seed crystal growth method.

[0055] The negative pressure inhalation method for preparing the incident optical fiber probe includes: dropping a solution medium dispersed with noble metal nanoparticles on the surface of a glass slide; sealing the outer port of the drawn optical fiber probe; , the probe nozzle is aimed at the nanoparticles in the solution medium; negative pressure is applied to the fiber port; the noble metal nanoparticles are sucked into the nozzle.

[0056] The electrodeposition method for preparing the incident optical fiber probe includes: using a laser drawing method to obtain an optical fiber probe with a tip aperture; electroless silver plating on the i...

Embodiment 1

[0085] Preparation of LSPR-coupled probes

[0086] (1) Preparation of seed crystal solution:

[0087] The preparation method of the seed crystal solution under the protection of cetyltrimethylammonium bromide (CTAB): sequentially transfer 7.5mL CTAB (0.1M), 0.25mL chloroauric acid (10mM) and 2.5mL ultrapure water into a 10mL round bottom In a flask, mix evenly, place until clear, the color is bright yellow, and store in a constant temperature water bath at 28-30°C for later use. Place the ultrapure water (washing bottle) in ice water to cool for more than 15 minutes, rinse the volumetric flask for preparing sodium borohydride several times with cooled ultrapure water, then prepare 50mL of 10mM sodium borohydride solution with ice water, place in Set aside in ice water. The cooling time of ultra-pure water is better to put one or several drops of ultra-pure water on the fingers to feel freezing. Under stirring conditions, quickly inject 0.6 mL of sodium borohydride aqueous sol...

Embodiment 2

[0092] Build the inventive tip-enhanced dark-field microscope device shown in Figure 4(a). In the example shown in Figure 6, the prepared spherical gold nanoparticles with a particle size of about 150 nm were filled into the tip of the laser-drawn hollow fiber by negative pressure suction (Figure 6(b)). The particle sizes of the nanoparticles are approximately equal, and the prepared optical fiber probe is shown in Figure 6(c). The white area in the middle is confirmed to be gold nanoparticles by elemental analysis, which is used for near-field coupling with the substrate 5 . The fiber optic probe shown in Fig. 6(c) was installed on the inventive tip-enhanced dark-field microscope device shown in Fig. 4(a) as the incident fiber. As shown in Figure 4(a), six solid optical fibers 3 are placed outside the incident fiber to form a fiber bundle 4. The fiber bundle is wrapped by rubber light-proof material, and visible light passes through the incident fiber 2, and gold nanoparticle...

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Abstract

The invention provides a pinpoint enhanced dark-field microscope, an electrochemical testing device and a leveling system. The pinpoint enhanced dark-field microscope is characterized by using an optical fiber probe, wherein metal nanometer particles for decoration are arranged at the pinpoint of the optical fiber probe, incident lights are transmitted inside the optical fiber probe which is provided with the metal nanometer particles for decoration, and the distance between the pinpoint and a sample adopts a light intensity control mode; and the pinpoint enhanced dark-field microscope is a localized surface plasmon resonance dark-field coupling device which utilizes the near-field coupling function of the nanometer metal particles at the pinpoint of the probe and a metal substrate material. The microscope can be used for researching basic surface and interface chemical problems such as a double-electric-layer structure of a substrate surface, adsorption / desorption behaviors and multi-phase catalysis. In addition, based on the LSPR (Localized Surface Plasmon Resonance) distance sensitiveness principle, the pinpoint enhanced dark-field microscope can be applied to a three-probe horizontal sensor to perform self-adaptive leveling on a nanometer processing platform.

Description

technical field [0001] The invention relates to a needle-tip enhanced dark-field microscope, an electrochemical test device and a nano-processing platform leveling system using the microscope. Specifically, the tip-enhanced dark-field microscope relates to a localized surface plasmon resonance (LSPR) dark-field coupling device that utilizes the near-field coupling effect of the nano-metal particles at the tip of the probe and the base material. Background technique [0002] The development of near-field optical microscopy to photon scanning tunneling microscopy (PSTM) still uses fiber optic microprobes with holes, but because the tip of the fiber optic microprobe cannot be made very thin, the resolution can only reach more than ten nanometers , cannot achieve atomic-scale resolution like scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In addition, the scattered signal collected in the near field of the near-field optical microscope is seriously affect...

Claims

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Application Information

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IPC IPC(8): G01Q60/22
Inventor 田中群王芳芳詹东平周剑章
Owner XIAMEN UNIV
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