Thin film transistor, manufacturing method and applications
A technology for thin film transistors and manufacturing methods, which is applied in transistors, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve the problems of large residual stress in the buffer layer, affecting crystallization characteristics, and difficult metal ion diffusion, etc., to improve yield and quality, improved stability, improved reliability
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Embodiment 1
[0084] image 3 It is a process flow diagram of the method for manufacturing a thin film transistor according to Embodiment 1 of the present invention, and the specific description is as follows:
[0085] a) In the vacuum chamber, a radio frequency source with a radio frequency of 13.56MHZ is used to generate low-temperature plasma as a gas reaction energy source, and the reaction gases monosilane, ammonia and nitrogen are introduced into the multi-channel gas access device, and the monosilane The flow ratio with ammonia gas was set to 1:1 to 3, the deposition temperature was set to 420 to 430 °C, and the thickness of PECVD was used to deposit on the glass substrate with a power of 500W. The first silicon nitride layer, the deposition process parameters are shown in Table 1;
[0086] Table 1: Deposition process parameters for the first silicon nitride layer
[0087]
[0088]b) In the same chamber, keep the above process conditions, only change the radio frequency power, ...
Embodiment 2
[0097] a) In the vacuum chamber, a radio frequency source with a radio frequency of 13.56MHZ is used to generate low-temperature plasma as a gas reaction energy source, and the reaction gases monosilane, ammonia and nitrogen are introduced into the multi-channel gas access device, and the monosilane The flow ratio with ammonia gas was set to 1:1 to 3, the deposition temperature was set to 420 to 430 °C, and the thickness of PECVD was used to deposit on the glass substrate with a power of 500W. The first silicon nitride layer, the deposition process parameters are shown in Table 3;
[0098] Table 3: Deposition process parameters for the first silicon nitride layer
[0099]
[0100] b) Pour N into the above chamber at a temperature of 420-430°C 2 O, forming an interfacial oxide layer;
[0101] c) In the same chamber, keep the above process conditions, only change the radio frequency power, and use the second power of 600W to continuously deposit on the formed first silicon...
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