Oxide semiconductor film and preparation method thereof
A technology of oxide semiconductor and oxide film, which is applied in the manufacture of semiconductor/solid-state devices, semiconductor devices, ion implantation plating, etc., can solve the problems of unsuitable preparation of TFT devices, changes in performance parameters, and high carrier concentration. Achieve the effects of reducing carrier concentration, simplifying production process, and high mobility
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[0028] An embodiment of the present invention provides a method for preparing a sputtering target, including:
[0029] Will In 2 o 3 Powder, CeO 2 The powder and the ZnO powder are uniformly mixed to form a mixture, and the molar ratio of In:Ce:Zn in the mixture is 2:(0.5~2):1; and
[0030] The mixture is sintered at 1250°C~1650°C.
[0031] In this mixture, the In 2 o 3 Powder, CeO 2 The particle size of the powder and the ZnO powder is preferably less than or equal to 10 microns, more preferably 0.5 microns to 2 microns.
[0032] The In 2 o 3 Powder, CeO 2 The purity of the powder and the ZnO powder is preferably 3N (99.9% by mass) to 5N (99.999% by mass).
[0033] The In 2 o 3 Powder, CeO 2 The molar ratio of powder and ZnO powder is In 2 o 3 : CeO 2 : ZnO =2: (1 ~4): 2.
[0034] The In 2 o 3 Powder, CeO 2 Powder and ZnO powder can be in air or protective gas (such as Ar gas or N 2 gas), the mixing step may further include:
[0035] the In 2 o 3 Powde...
Embodiment 1
[0068] Embodiment 1: sputtering target and preparation method thereof
Embodiment 1-1
[0070] Weigh 209g In with a purity of 4N 2 o 3 Powder, 260g CeO 2 powder and 61g ZnO powder (the molar ratio of the three oxides is In 2 o 3 : CeO 2 : ZnO =1:2:1), put the three powders into the ball mill jar and mix. The ball milling medium is absolute ethanol, the ball milling speed is 200 rpm, and the ball milling time is 10 h. After ball milling, it was dried under the protection of Ar gas with a pressure of 1 atm and a purity of 5N for 1 h. After drying, put the powder into a hot-press sintering furnace, and carry out hot-press sintering in an atmosphere of high-purity Ar gas. . After sintering, the furnace was cooled to room temperature for sampling. The relative density of the target is >87%, and the bulk resistance is 0.75Ωcm. The target is used for medium frequency AC magnetron sputtering, the arc is easy to start and the sputtering is stable.
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