Two-dimensional material field effect transistor with transverse structure, and preparation method and application thereof
A technology of field effect transistors and two-dimensional materials, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems affecting the electrical performance of two-dimensional material field effect transistors, reduce contact barriers, and improve electrical properties. performance, easy operation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0025] A two-dimensional material field effect transistor with a lateral structure. From bottom to top, there are substrate silicon 1, dielectric layer hafnium dioxide 2, metal electrode titanium 3, and two-dimensional material titanium disulfide 4, such as figure 1 Shown. The two-dimensional material titanium disulfide is formed in the middle part of the metal titanium by the sulfidation method, and a covalent bond is formed between the two-dimensional material titanium disulfide and the metal electrode titanium, effectively forming an ohmic contact.
[0026] The manufacturing method of the above-mentioned two-dimensional material field effect transistor with lateral structure, such as figure 2 As shown, including the following steps:
[0027] In the first step, the dielectric layer 2 is plated on the substrate 1 by chemical vapor deposition, and then a layer of metal 3 is plated on the dielectric layer 2 by electron beam evaporation; the material of the substrate 1 is silicon, a...
Embodiment 2
[0032] A two-dimensional material field-effect transistor with a lateral structure. From bottom to top, there are substrate germanium 1, dielectric layer zirconium dioxide 2, metal electrode molybdenum 3, two-dimensional material molybdenum diselenide 4, such as figure 1 Shown. The two-dimensional material molybdenum diselenide is formed in the middle part of the metal molybdenum by the selenization method, and a covalent bond is formed between the two-dimensional material molybdenum diselenide and the metal electrode molybdenum, effectively forming an ohmic contact.
[0033] The manufacturing method of the above-mentioned two-dimensional material field effect transistor with lateral structure, such as figure 2 As shown, including the following steps:
[0034] In the first step, a layer of metal 3 is plated on the dielectric layer 2 by chemical vapor deposition on the substrate 1. The material of the substrate 1 is germanium, the material of the dielectric layer 2 is zirconium dio...
Embodiment 3
[0039] A two-dimensional material field-effect transistor with a lateral structure. From bottom to top, there are substrate germanium 1, dielectric layer zirconium dioxide 2, metal electrode molybdenum 3, two-dimensional material tungsten diselenide 4, such as figure 1 Shown. A two-dimensional material tungsten diselenide is formed in the middle part of the metal tungsten by the selenization method, and a covalent bond is formed between the two-dimensional material tungsten diselenide and the metal electrode tungsten, effectively forming an ohmic contact.
[0040] The manufacturing method of the above-mentioned two-dimensional material field effect transistor with lateral structure, such as figure 2 As shown, including the following steps:
[0041] In the first step, a layer of metal 3 is plated on the substrate 1 using a chemical vapor deposition method to plate the dielectric layer 2; wherein the material used for the substrate 1 is germanium, the material used for the dielectri...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com