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A method for preparing silicon carbide single crystal by continuing a single growth center

A technology of silicon carbide single crystal and central silicon carbide, which is applied in the direction of single crystal growth, single crystal growth, chemical instruments and methods, etc., to achieve the effect of improving crystal quality, ensuring uniformity and stability, and reducing dislocation defect density

Active Publication Date: 2021-03-26
HEBEI SYNLIGHT CRYSTAL CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

So far, there has been no report on the method of continuing a single growth center to prepare SiC single crystals

Method used

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  • A method for preparing silicon carbide single crystal by continuing a single growth center
  • A method for preparing silicon carbide single crystal by continuing a single growth center
  • A method for preparing silicon carbide single crystal by continuing a single growth center

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0050] (1) Screen out a 4-inch 4H crystalline silicon carbide single crystal with a single growth center grown by a conventional growth method, with a crystal convexity of 4mm, and cut the growth front of the screened silicon carbide single crystal to make a wafer, The growth front containing a single growth center is protected by curing glue to prevent damage to its natural growth surface during subsequent processing, and then the cut surface is ground and polished to make the surface roughness less than 1 μm. The wafer is cleaned and packaged for later use.

[0051] (2) Put the high-purity silicon carbide powder into the graphite barrel, and the volume of the charge accounts for about 1 / 2 of the barrel volume.

[0052] (3) Take out a piece of the wafer prepared in step (1), and stick it tightly with the graphite cover through the adhesive. The surface roughness of the graphite cover pasted with the seed crystal is 10 μm, and the seed crystal cover button On the graphite cru...

Embodiment 2

[0057] (1) Screen out a 4-inch 4H crystalline silicon carbide single crystal with a single growth center grown by a conventional growth method, with a crystal convexity of 4mm, and cut the growth front of the screened silicon carbide single crystal to make a wafer, The growth front containing a single growth center is protected by curing glue to prevent damage to its natural growth surface during subsequent processing, and then the cut surface is ground and polished to make the surface roughness less than 1 μm. The wafer is cleaned and packaged for later use.

[0058] (2) Put the high-purity silicon carbide powder into the graphite barrel, and the volume of the charge accounts for about 1 / 2 of the barrel volume.

[0059] (3) Take out a piece of the wafer prepared in step (1), and stick it tightly with the graphite cover through the adhesive. The surface roughness of the graphite cover pasted with the seed crystal is 10 μm, and the seed crystal cover button On the graphite cru...

Embodiment 3

[0063] (1) Screen out a 4-inch 4H crystalline silicon carbide single crystal with a single growth center grown by a conventional growth method, with a crystal convexity of 5 mm, and cut the growth front of the screened silicon carbide single crystal to make a wafer, The growth front containing a single growth center is protected by curing glue to prevent damage to its natural growth surface during subsequent processing, and then the cut surface is ground and polished to make the surface roughness less than 1 μm. The wafer is cleaned and packaged for later use.

[0064] (2) Put the high-purity silicon carbide powder into the graphite barrel, and the volume of the charge accounts for about 1 / 2 of the barrel volume.

[0065] (3) Take out a piece of the wafer prepared in step (1), and stick it tightly with the graphite cover through the adhesive. The surface roughness of the graphite cover pasted with the seed crystal is 10 μm, and the seed crystal cover button On the graphite cr...

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Abstract

The invention discloses a method for preparing silicon carbide monocrystallines by continuing a single growth center, and belongs to the field of crystal growth. The method comprises the following steps: selecting a silicon carbide monocrystalline growth front edge with a single growth center as a seed crystal for next growth, so that the phenomenon of multi-core growth in the early growth stage can be effectively avoided, and after the single growth center is continued for multiple times, paired reverse screw dislocation in the silicon carbide monocrystalline can be coalesced and annihilated,and the internal defect density in the monocrystallines can be reduced. By means of the method, the low-defect-density silicon carbide crystals with better and better quality can be obtained. The silicon carbide monocrystallines prepared by the method can be better applied to the national defense war industry fields of aerospace, aviation, aircraft carriers and the like, and can also be widely applied to the civil fields of industrial automation, new energy automobiles, household appliances, 5G communication and the like.

Description

technical field [0001] The invention relates to the technical field of crystal growth, in particular to a method for preparing a silicon carbide single crystal by continuing a single growth center. Background technique [0002] Silicon carbide (SiC) crystal is a third-generation semiconductor material after the first-generation semiconductor silicon and the second-generation semiconductor gallium arsenide. Silicon carbide has a unique atomic stacking crystal structure, which makes it have excellent physical and chemical properties. In terms of physical properties, it is characterized by high hardness, high thermal conductivity, high radiation resistance, and high temperature resistance; in terms of chemical properties, it is characterized by strong chemical stability, acid and alkali corrosion resistance, and difficulty in reacting with other substances at low temperatures. As an emerging semiconductor electronic material, silicon carbide is characterized by a large band ga...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C30B23/00C30B29/36
CPCC30B23/002C30B29/36
Inventor 张福生杨昆刘新辉牛晓龙路亚娟尚远航李永超
Owner HEBEI SYNLIGHT CRYSTAL CO LTD