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High-sensitivity X-ray detection method and device based on laser ionized gas

An ionized gas and high-sensitivity technology, applied in the field of X-rays, can solve problems such as the exploration of difficult ion high-order harmonic mechanisms, and achieve the effects of saving installation and adjustment time, small size, and high-sensitivity detection

Pending Publication Date: 2022-01-04
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This makes it difficult to explore the mechanism of ion generation of high-order harmonics experimentally.

Method used

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  • High-sensitivity X-ray detection method and device based on laser ionized gas
  • High-sensitivity X-ray detection method and device based on laser ionized gas
  • High-sensitivity X-ray detection method and device based on laser ionized gas

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Experimental program
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Effect test

Embodiment 1

[0059] Infrared femtosecond laser is the incident femtosecond laser 1, the center wavelength is 1450nm, the pulse width is 60fs, the repetition frequency is 20Hz, and the energy output is 7mJ. After the converging lens 6 is focused, the effective light intensity at the focal point is about 1.2×10 16 W / cm 2 . The laser focus is close to the gas outlet of the gas nozzle 7, which is filled with the first inert gas (He), and the gas pressure is 0.8Mpa. During operation, the single injection time of the gas nozzle 7 is set to 300 μs by the gas nozzle control system 17 , the working frequency is 20 Hz, and the gas nozzle 7 is set to match the operating frequency of the laser by the delay controller 171 .

[0060] The laser and the signal are coaxially transmitted to the electronic deflection system 20, passing through the center of the small hole 81 on the front surface of the electronic deflection device 8, and then passing through the deflection magnetic field composed of two ma...

Embodiment 2

[0062] The steps in the above-mentioned embodiment 1 are repeated, and the electron deflection system 8 is removed. Place the aluminum film support 85 that is coated with 150nm thick before SDD10, the signal spectrum that obtains is Figure 8 Shown in Curve B.

[0063] From Figure 8 From the comparison of curve A and curve B, it can be seen that the electronic deflection system 20 can effectively reduce the fluorescent X-ray signal (photon energy 1KeV to 5KeV), and the fluorescent X-ray signal is reduced by at least one order of magnitude.

Embodiment 3

[0065] Using the high-sensitivity X-ray detection method and device of the present invention, repeat the steps in the above-mentioned embodiment 1, replace the gas in the gas nozzle 7 with the fourth inert gas (Kr), and set the gas pressure to 0.1 MPa. The metal filter membrane holder 85 is replaced with an 8 μm thick aluminum membrane. SDD10 acquisition time is set to 1200s. Utilize the present invention, obtain Kr ion X-ray high order harmonic spectrum, spectrogram sees Figure 9 . Change the polarization state (linear polarization and circular polarization) of incident femtosecond laser 1 by 1 / 4 wave plate 3, under collecting different polarization states, the X-ray spectrogram that obtains, see Figure 10 , by comparing the linearly polarized signal (curve C) with the circularly polarized signal curve (curve D), it can be judged that the X-rays in Spectrum 9 are high-order harmonic signals generated by Kr ions through the spectra under different polarizations.

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Abstract

The invention discloses a high-sensitivity X-ray detection method and device based on laser ionized gas. An X-ray signal is generated through the laser ionized gas. And a metal filter membrane is used for filtering laser and low-energy rays. Electrons are deflected through small holes and a sintered neodymium-iron-boron magnet, fluorescent X-rays (at least one order of magnitude is weakened) generated by electron collision are filtered out, and the signal contrast is improved. And finally, the weak X-ray signal is detected by an X-ray silicon drift detector. Meanwhile, by changing laser parameters, gas types or the angle of the X-ray detector, the method can also be used for angular distribution detection of weak X-ray signals.

Description

technical field [0001] The invention belongs to the field of X-ray technology, and specifically relates to a high-sensitivity X-ray detection method and device based on laser ionized gas, which can filter signals in the X-ray band and improve the signal-to-noise ratio, thereby realizing the detection of weak high-order harmonics in the signal. signal detection. Background technique [0002] The real-time observation of electron dynamics in atoms requires an ultra-short time span from femtosecond to attosecond, which is equivalent to the photon energy span of 0.1-10KeV (KeV, kiloelectron volt, electron volt is the energy unit). The pump-probe requires extreme ultraviolet (XUV) and X-ray attosecond sources. High-order harmonics are currently an important coherent light source, but the spectrum of most high-order harmonic light sources is limited to the XUV band. However, X-rays can obtain the internal state of atomic and molecular motion, which requires the photon energy to ...

Claims

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223
Inventor 高记星郑颖辉吴家其曾志男
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI