Carrier-storing grooved gate IGBT with P-type floating layer
A carrier storage and floating layer technology, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of increased forward voltage drop and poor forward conduction characteristics of devices, so as to reduce forward voltage drop, Effect of improving forward conduction characteristics and increasing design margin
Inactive Publication Date: 2010-04-14
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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The invention relates to a carrier-storing grooved gate IGBT with a P-type floating layer, belonging to the technical field of semiconductor power devices. On a basis of the prior carrier-storing grooved gate bipolar transistor, a P-type floating layer (13) is introduced to almost free a carrier-storing layer from bearing a withstanding voltage and decrease a forward conducted voltage drop; and the P-type floating layer (13) also improves the electric-field integration effect of the bottom of the grooved gate, thereby effectively decreasing an electric filed with a maximum peak value, preventing the bottom of the grooved gate and the vicinity of the high-concentration carrier-storing layer from being broken down by an overhigh electric field and greatly increasing the breakdown voltage of the device. A JFET zone is introduced due to the existence of the P-type floating layer. When the device is forwardly conducted, the resistance of the JFET zone continuously increases along with the continuously increasing voltage of a collector so that the saturation current of the device is decreased, and a lower conducted voltage drop is obtained while maintaining a greater short-circuit safety operation area (SCSOA).
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