Preparation process of shallow junction solar battery
A technology for solar cells and preparation processes, applied in sustainable manufacturing/processing, circuits, electrical components, etc., can solve the problems of dead layer thickness, limiting efficiency, and high phosphorus atom surface concentration, achieve low emitter saturation current density, improve Open-circuit voltage and short-circuit current, the effect of improving short-wave response
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example 1
[0016] Clean the silicon wafer, remove the damaged layer, and make texture; spray phosphoric acid on the surface of the silicon wafer with a concentration of 0.5% and a thickness of 20 μm; put the silicon wafer into a chain diffusion furnace and diffuse at 900 ° C for 10 minutes. Diffusion rear resistance is 50Ω / port; Remove the phospho-silicate glass from the diffused silicon wafer and etch the surface dead layer. After etching, the surface resistance is 100Ω / port, the junction depth is 0.2μm, and the surface concentration is 1.8×1020cm -3 ; Deposit silicon nitride passivation anti-reflection layer on the emitter surface; Screen print the front electrode and back electrode or electroplate the front electrode; Sinter and test sorting.
example 2
[0018] Clean the silicon wafer, remove the damaged layer, and make texture; spray phosphoric acid on the surface of the silicon wafer with a concentration of 2% and a thickness of 20 μm; put the silicon wafer into a chain diffusion furnace and diffuse at 900 ° C for 15 minutes. Diffusion rear resistance is 20Ω / port; the diffused silicon wafer removes the phospho-silicate glass and etches the surface dead layer. After etching, the surface resistance is 50Ω / port, the junction depth is 0.18μm, and the surface concentration is 2.5×1020 cm -3 ; Deposit silicon nitride passivation anti-reflection layer on the emitter surface; Screen print the front electrode and back electrode or electroplate the front electrode; Sinter and test sorting.
example 3
[0020] Clean the silicon wafer, remove the damaged layer, and make texture; spray phosphoric acid on the surface of the silicon wafer with a concentration of 5% and a thickness of 20 μm; put the silicon wafer into a chain diffusion furnace and diffuse at 900 ° C for 15 minutes. Diffusion rear resistance is 20Ω / port; the diffused silicon wafer removes phospho-silicate glass and etches the surface dead layer. After etching, the surface resistance is 70Ω / port, the junction depth is 0.2μm, and the surface concentration is 2.1×1020 cm -3 ; Deposit silicon nitride passivation anti-reflection layer on the emitter surface; Screen print the front electrode and back electrode or electroplate the front electrode; Sinter and test sorting.
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