Inductively coupled plasma-atomic emission spectrometry (ICP-AES) method for testing chemical components of blue phosphors of plasma display panel (PDP)

Abstract

The invention discloses an inductively coupled plasma-atomic emission spectrometry (ICP-AES) method for testing chemical components of blue phosphors of a plasma display panel (PDP). The method comprises the following steps of: mixing the PDP blue phosphors and a mixed fluxing agent, melting the mixture in a high-temperature muffle furnace, cooling, adding a nitric acid solution, slowly heating, transferring the mixed solution into a 250ml volumetric flask after the mixture is dissolved, preparing a series of standard solutions of various elements, starting ICP-AES, starting ventilation, circulating water, air-conditioning and argon, setting operating parameters, turning on an ion torch, establishing an operating method of each element according to the operating instruction of the ICP-AES, sequentially injecting prepared standard solutions according to a sequence from low concentration to high concentration, drawing a working curve, detecting a sample solution, and calculating the contents of measured elements in the sample according to the working curves of the elements and the intensity value of the sample. The method has the characteristics of rapid and simultaneous measurement on multiple elements, high measurement precision, low detection limit and slight matrix effect.

Description

technical field [0001] The invention relates to the technical field of ICP-AES test system and powder sample liquefaction treatment, in particular to an ICP-AES test method for chemical components of PDP blue fluorescent powder. Background technique [0002] At present, PDP blue powder phosphor is a new type of composite luminescent material with complex components. There are few literatures on the test methods of component element content. Generally, the components of similar samples are mainly detected by X-fluorescence spectroscopy or electron energy spectroscopy. Spectrum Analysis. X-fluorescence spectroscopic analysis is mainly through the sample cake pressing and detection of powder samples. The principle is that the X-ray tube emits X-rays (high energy) once, irradiates the sample, excites the chemical elements in it, and emits secondary X-rays, also called X-rays. For ray fluorescence, its wavelength is the identification of the corresponding element—the characteris...

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Problems solved by technology

[0003] There are many disadvantages in the above two methods. The first method, because the X-fluorescence spectrometer is expensive, especially the life of the spectroscopic crystal is not long, the price is expensive, and the matrix effect is still serious in the test, and it is difficult to analyze light elements. It is at least two times lower than optical spectroscopy. Most users purchase instruments with low detection utilization due to small samples and batches, and the cost is too high to accept.

On the other hand, the X-fluorescence spectrometer is expensive, and the brand instrument is about 2 million yuan. At the same time, due to the penetration of X-rays, improper protection will easily cause harm to the test personnel, and special groups (such as pregnant women) cannot operate it. At present, most of the testers in domestic factories and mines are women, which is not conducive to the development of work

The second method, since the sample is irradiated by X-rays in the XPS electron spectrum analyzer test, the intensity of the photoelectrons emitted from the sample surface has a linear relationship with the concentration of the atom in the sample, and it can be used for semi-quantitative analysis of elements However, since the intensity of photoelectrons is not only related to the concentration of atoms, but also related to the average degree of freedom of photoelectrons, the surface finish of the sample, the chemical state of the elements, the intensity of the X-ray source, and the state of the instrument, the analyzed elements cannot be given The absolute content of each element can only provide the relative content of each element. At the same time, XPS is a surface-sensitive analysis technique, and its surface sampling depth is 2.0-5.0nm. It only provides the element content on the surface, which is related to the bulk phase composition There is a big difference, it can only be used as a reference value, and it cannot meet the requirements of accurate quantitative testing

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