Dual wavelength antireflection film for excimer laser and optical film thickness monitoring system
A technology of excimer laser and laser wavelength, which is applied in the field of deep ultraviolet excimer laser equipment, and can solve the problems of large optical loss, high absorption, and high surface scattering
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0050] To implement the present invention, it is first necessary to search for high-refractive-index thin-film materials and low-refractive-index thin-film materials that are expected to be used in the deep ultraviolet band. Since the loss at a wavelength of 193nm is always greater than that at 248nm, materials that are applicable to a wavelength of 193nm must also be applicable to a wavelength of 248nm. In this way, the photon energy with a wavelength of 193nm and the electronic band gap can be used as the basis for preliminary screening of material loss. After screening, it is concluded that the high refractive index material has LaF 3 and Al 2 o 3 , and there are many low refractive index materials, such as MgF 2 , AlF 3 , CaF 2 and SiO 2 etc., but according to the combination of mechanical, chemical and optical properties, choose MgF 2 and SiO 2 more reasonable. Then, single-layer and multi-layer film evaporation experiments and optical constant test inversion were...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com