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Post-positioned light splitting pupil differential confocal Raman and LIBS spectrum microscopic imaging method and device

A microscopic imaging and differential confocal technology, which is applied in the field of confocal microscopic imaging technology and spectral imaging, can solve the problems of low detection space resolution, large laser focus spot, drift, etc., to expand the application field, suppress drift, The effect of improving spatial resolution

Inactive Publication Date: 2019-01-11
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1) Due to the use of simple laser focusing to desorb and ionize the sample, there are still problems such as large laser focusing spot and low detection spatial resolution;
[0005] 2) The time required for Raman spectroscopy imaging is long, and the axial position of the focused spot often drifts relative to the sample to be measured;
[0006] 3) It is impossible to measure the micro-domain morphology and complex components of the sample in situ, which restricts the accurate and complete acquisition of sample micro-domain information

Method used

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  • Post-positioned light splitting pupil differential confocal Raman and LIBS spectrum microscopic imaging method and device
  • Post-positioned light splitting pupil differential confocal Raman and LIBS spectrum microscopic imaging method and device
  • Post-positioned light splitting pupil differential confocal Raman and LIBS spectrum microscopic imaging method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0045] Such as figure 1 As shown, the collection pupil 11 is placed on the pupil plane of the detection objective lens 13 . The light source system 1 selects a point light source, and the excitation beam emitted by the point light source passes through the collimator lens 2, the compressed focusing spot system 4, the beam splitter 5, the dichroic mirror A6 and the measuring objective lens 7, and converges on the measured sample 8, and the computer 34 Control the precise three-dimensional workbench 10 to drive the measured sample 8 to move up and down near the focus of the measuring objective lens 7, and the light reflected by the sample is reflected by the dichroic mirror A6, reflected by the dichroic prism 5 and passed through the D-type collector in the D-type rear pupil 11 The pupil 12, the detection objective lens 13, and the relay magnifying lens 14 converge on the two-quadrant detector 16, and the first detection quadrant 17 and the second detection quadrant 18, which ar...

Embodiment 2

[0054] Such as figure 2 As shown, in the post-divided pupil differential confocal Raman and LIBS spectral microscopy imaging device, the compressed focusing spot system 4 is replaced by a vector beam generation system 35 and a pupil filter 36, and the D-type rear pupil 11 can be replaced by a circular Shaped rear pupil 37 is replaced, and the two-quadrant detector is replaced by a CCD detector 39, wherein the first micro-area of ​​the Airy disk and the second micro-area of ​​the Airy disk detected by the CCD detector are symmetrical about the optical axis.

[0055] All the other are identical with embodiment 1 implementation.

Embodiment 3

[0057] Such as image 3 As shown, in the rear split-pupil differential confocal Raman and LIBS spectral microscopy imaging device, the point light source 1 can be replaced by a pulse laser 40, a condenser lens 41, and a light-transmitting optical fiber 42 at the focal point of the condenser lens 41. An exit beam attenuator 43 is introduced into the laser focusing system, and a detection beam attenuator 44 is introduced into the rear split pupil differential confocal detection system. The light intensity adjustment system is composed of the exit beam attenuator 43 and the detection beam attenuator 44, which are used to attenuate the focused spot and the spot intensity detected by the two-quadrant detector 16, so as to meet the light intensity requirement when the sample surface is positioned.

[0058] The remaining imaging methods and processes are the same as in Example 1.

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Abstract

The invention discloses a post-positioned light splitting pupil differential confocal Raman and LIBS spectrum microscopic imaging method and device, and belongs to the technical field of confocal microscopic imaging, spectrum imaging measurement. A post-positioned light splitting pupil differential confocal microscopic imaging technology is combined with Raman and LIBS spectrum detection technology; a tiny focusing facula of a post-positioned light splitting pupil confocal microscope processed by a superresolution technology is used for performing high spatial resolution morphological imagingon a sample; a spectrum detection system is used for motivating spectrum (Raman spectrum, LIBS spectrum) for a focusing spot to perform microdomain spectrum detection; complementary advantages and structure fusion of laser multispectral detection are used for achieving high spatial resolution and high sensitivity imaging and detection of microdomain complete component information and morphologicalparameter of the sample. According to the method and device provided by the invention, the brand new effective technical approach can be provided for morphological imaging and material component detection in the fields of biomedicine, material science, mineral products and micro and nano-fabrication.

Description

technical field [0001] The invention belongs to the field of confocal microscopic imaging technology and spectral imaging technology, and combines rear split pupil differential confocal micro imaging technology, Raman spectral imaging technology and laser induced breakdown spectral imaging technology, and relates to a rear split pupil differential Confocal Raman and LIBS spectral microscopy imaging methods and devices have broad application prospects in the fields of biomedicine, material science, physical chemistry, minerals, and micro-nano manufacturing. Background technique [0002] Laser-induced breakdown spectroscopy focuses the intense pulsed laser on the surface of the sample to ionize the sample, which can excite the sample to generate plasma. By detecting the spectrum radiated by the decay of plasma energy, the composition information of the sample’s atoms and small molecular elements can be obtained; using laser Raman spectroscopy can measure the molecular excitati...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65G01N21/71G01N21/01
CPCG01N21/65G01N21/01G01N21/71G01N21/718
Inventor 赵维谦邱丽荣王允
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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