Diffusion method suitable for selective emitter
A diffusion method and emitter technology, applied in photovoltaic power generation, climate sustainability, electrical components, etc., can solve problems such as unsatisfactory contact performance, expensive special paste, technical potential bottlenecks, etc., and achieve an increase in short-circuit current Isc , Improve the open circuit voltage, good effect of square resistance uniformity
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Embodiment 1
[0056] A diffusion method suitable for selective emitters in this embodiment includes the following steps:
[0057] Step 1: First Surface Deposition
[0058] The temperature of the furnace tube is raised to 800°C, and a mixed gas consisting of small nitrogen, large nitrogen and oxygen carrying phosphorus oxychloride is introduced into the furnace tube. The flow rate of the small nitrogen is 500 sccm, the flow rate of the large nitrogen is 800 sccm, and the flow rate of the oxygen is 600 sccm with a step run time of 12 min.
[0059] Step 2: First drive into
[0060] Raise the temperature of the furnace tube to 880°C, and feed large nitrogen, oxygen and small nitrogen gas into the furnace tube, so that the phosphorus source deposited on the surface of the silicon wafer can be driven and diffused into the silicon wafer at high temperature, and the flow rate of the large nitrogen gas is 800 sccm , the small nitrogen gas flow rate is 500 sccm, the oxygen gas flow rate is 300 sccm...
Embodiment 2
[0077] A diffusion method suitable for selective emitters in this embodiment includes the following steps:
[0078] Step 1: First Surface Deposition
[0079] The temperature of the furnace tube is raised to 790°C, and a mixed gas composed of large nitrogen, oxygen and small nitrogen carrying phosphorus oxychloride is introduced into the furnace tube. The flow rate of the small nitrogen is 400 sccm, the flow rate of the large nitrogen is 700 sccm, and the flow rate of the oxygen is 500sccm, the time of passing gas is 11min.
[0080] Step 2: First drive into
[0081] Raise the temperature of the furnace tube to 870°C, and feed large nitrogen, oxygen, and small nitrogen gases into the furnace tube, so that the phosphorus source deposited on the surface of the silicon wafer can be driven and diffused into the silicon wafer at high temperature, and the flow rate of the large nitrogen gas is 700sccm , the flow rate of oxygen gas is 200 sccm, the flow rate of small nitrogen gas is ...
Embodiment 3
[0095] A diffusion method suitable for selective emitters in this embodiment includes the following steps:
[0096] Step 1: First Surface Deposition
[0097] The temperature of the furnace tube is raised to 810°C, and a mixed gas composed of large nitrogen, oxygen and small nitrogen carrying phosphorus oxychloride is introduced into the furnace tube. The flow rate of the small nitrogen is 600 sccm, the flow rate of the large nitrogen is 900 sccm, and the flow rate of the oxygen is 700sccm, the time of passing gas is 13min.
[0098] Step 2: First drive into
[0099] Raise the temperature of the furnace tube to 890°C, and feed large nitrogen, oxygen, and small nitrogen gas into the furnace tube, so that the phosphorus source deposited on the surface of the silicon wafer can be driven and diffused into the silicon wafer at high temperature, and the flow rate of the large nitrogen gas is 900sccm , the flow rate of oxygen gas is 400 sccm, the flow rate of small nitrogen gas is 60...
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