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Thin film transistor and manufacturing method thereof

A technology of thin film transistors and crystals, which is used in the manufacture of transistors, semiconductor/solid-state devices, electrical components, etc., can solve the problems of poor large area uniformity, low mobility, and can not meet the driving requirements of flat panel display, so as to prevent the characteristics of the device from changing. Poor, improve the effect of imaging

Active Publication Date: 2019-06-04
ZHEJIANG IND POLYTECHNIC COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the low mobility of a-Si:HTFT (<1cm2 / Vs) cannot meet the driving requirements of next-generation flat panel displays, and the poor large-area uniformity of poly-Si TFT makes it mainly suitable for small-size display applications

Method used

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  • Thin film transistor and manufacturing method thereof
  • Thin film transistor and manufacturing method thereof
  • Thin film transistor and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0032] Preparation method of etch barrier layer 7

[0033] 1) Put 1.32g of epoxy acrylate, 6g of urethane acrylate, 4g of methyl methacrylate, 6g of butyl acrylate and 2g of hydroxyethyl acrylate into a glass container.

[0034] 2) Add absolute ethanol for mixing, and mechanically stir for 5 minutes.

[0035] 3) Using a press plate, preheat it to 20-25 degrees Celsius, uniformly coat the base material on the press plate with mechanical stirring, and cool naturally to prepare an etching barrier film.

[0036] Preparation method of passivation layer 8

[0037] 1) Put 3g of benzoin ethyl ether, 1g of benzophenone and 0.5g of triethanolamine into a container, add absolute ethanol and mechanically stir for 3 minutes.

[0038] 2) Add 0.5g of leveling agent into the container, mix by manual stirring, and heat to 25 degrees Celsius at the same time.

[0039] 3) Add 1 g of photosensitizer and keep stirring until it is in a saturated state to obtain a flowing liquid for the passivati...

Embodiment 1

[0041] A thin film transistor, comprising a substrate 1, a gate 2, a gate dielectric layer 3, an active layer 4, a drain 5, a source 6, an etching stopper layer 7, a passivation layer 8, a base 9, and a crystal grid 10 , a microlens 11 and a reflector 12, the gate 2 is arranged in the middle of the top of the substrate 1, the gate dielectric layer 3 is superimposed on both sides of the bottom of the substrate 1 and the top of the gate 2, and the bottom of the active layer 4 Overlaid with the top of the gate dielectric layer 3, the drain 5 and the source 6 are respectively located on both sides of the top of the active layer 4, the etch stop layer 7 is located in the middle of the top of the active layer 4, and the etch stop layer 7 The two sides of the top overlap with the bottom of the opposite side of the drain 5 and the source 6 respectively, the passivation layer 8 and the tops of the drain 5 and the source 6 form a covering state, and the base 9 is located in the middle of...

Embodiment 2

[0054] A thin film transistor, comprising a substrate 1, a gate 2, a gate dielectric layer 3, an active layer 4, a drain 5, a source 6, an etching stopper layer 7, a passivation layer 8, a base 9, and a crystal grid 10 , a microlens 11 and a reflector 12, the gate 2 is arranged in the middle of the top of the substrate 1, the gate dielectric layer 3 is superimposed on both sides of the bottom of the substrate 1 and the top of the gate 2, and the bottom of the active layer 4 Overlaid with the top of the gate dielectric layer 3, the drain 5 and the source 6 are respectively located on both sides of the top of the active layer 4, the etch stop layer 7 is located in the middle of the top of the active layer 4, and the etch stop layer 7 The two sides of the top overlap with the bottom of the opposite side of the drain 5 and the source 6 respectively, the passivation layer 8 and the tops of the drain 5 and the source 6 form a covering state, and the base 9 is located in the middle of...

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Abstract

The invention relates to the technical field of thin film transistors, and discloses a thin film transistor, which comprises a substrate, a gate, a gate dielectric layer, an active layer, a drain, a source, an etching barrier layer, a passivation layer, a substrate, a crystal grating, a microlens and a reflective sheet, wherein the gate is arranged at the central position of the top part of the substrate. Due to the arrangement of the etching barrier layer and the passivation layer, the effect of preventing deterioration of the device features can be achieved through avoiding the impact on anactive layer of an oxide semiconductor caused by an over-etching step of the source and the drain in a direct patterning process regardless of whether dry etching or wet etching is adopted. Through changing the light transmittance of the substrate by means of the crystal grating, the phenomenon of degradation of the features of the oxide TFT device under illumination conditions is avoided. In addition, the transfer features of the device under NBS are about to have a significant negative drift during illumination, thereby improving the imaging effect of the thin film transistor.

Description

technical field [0001] The invention relates to the technical field of thin film transistors, in particular to a thin film transistor and a manufacturing method thereof. Background technique [0002] A thin film transistor is an insulated gate field effect transistor. Its working state can be described by using the working principle of single crystal silicon MOSFET characterized by Weimer. When a positive voltage is applied to the gate, the gate voltage generates an electric field in the gate insulating layer, and the electric force line is directed from the gate electrode to the semiconductor surface, and induces charges on the surface. As the gate voltage increases, the semiconductor surface will change from a depletion layer to an electron. The accumulation layer forms an inversion layer. When the strong inversion is reached (that is, when the turn-on voltage is reached), carriers will pass through the channel when the voltage is applied between the drains. When the sour...

Claims

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Application Information

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IPC IPC(8): H01L29/786H01L21/34
Inventor 柳斌邓丽霞
Owner ZHEJIANG IND POLYTECHNIC COLLEGE