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Lateral transistor with Schottky barrier AlGaN/GaN heterojunctions and manufacturing method thereof

A lateral transistor, Schottky potential technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of influence, difficulty in obtaining high-quality epitaxial layers, etc., and achieve fast switching frequency, good performance, large Effect of Current Density

Active Publication Date: 2019-09-20
XIDIAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the nitride material has no natural substrate, it needs to rely on the material growth method to realize the single crystal material. In the case of no artificial doping, the grown nitride epitaxial film usually contains a variety of residual impurities, which strongly affect The background carrier concentration of the material is difficult to obtain high-quality epitaxial layers

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  • Lateral transistor with Schottky barrier AlGaN/GaN heterojunctions and manufacturing method thereof

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Embodiment Construction

[0033] The present invention will be described below by taking an N-channel lateral transistor with a Schottky barrier AlGaN / GaN heterojunction as an example in conjunction with the accompanying drawings.

[0034] Such as figure 1 As shown, the structure of this embodiment includes:

[0035] Substrates of semiconductor materials;

[0036] GaN material epitaxial layer;

[0037] The source, drain, dielectric layer and gate located on the surface of the epitaxial layer;

[0038] The surface of the epitaxial layer near the drain is also formed by heteroepitaxy to form an AlGaN layer connected to the drain to form an AlGaN / GaN heterojunction, that is, the drift region is composed of an N-type drift region and an AlGaN / GaN heterojunction; The gate is a Schottky contact (that is, a metal-semiconductor rectifying contact), and an insulating dielectric layer with a thickness of 0-0.1 μm can be provided under the gate (or not). The source and drain are ohmic contacts.

[0039] The r...

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Abstract

The invention provides a lateral transistor with Schottky barrier AlGaN / GaN heterojunctions and a manufacturing method thereof. A grid electrode of the structure adopts metal-conductor rectifying contact, the surface of an epitaxial layer on the side close to a drain electrode is further connected with the drain electrode through a heteroepitaxy formed AlGaN layer, and the AlGaN / GaN heterojunctions are formed; the grid electrode is in Schottky contact, and a source electrode and the drain electrode are in ohmic contact. High-density two-dimensional electron gas is formed by the AlGaN / GaN heterojunctions at the interfaces of the heterojunctions through spontaneous polarization and piezoelectric polarization effects, and the two-dimensional electron gas has extremely high migration rate, so that lateral transistor with AlGaN / GaN heterojunctions are extremely low in on resistance. The structure has higher voltage resistance and large current density, current collapse in conventional AlGaN / GaN can be reduced, and the performance of the device can be greatly improved.

Description

technical field [0001] The invention relates to the field of power semiconductor devices, in particular to a lateral transistor. Background technique [0002] Transverse field effect transistors have the advantages of easy integration, good thermal stability, good frequency stability, low power consumption, multi-subconduction, small power drive, and high switching speed. They are the core of intelligent power circuits and high-voltage devices. Due to the growing market demand for portable power management and automotive electronics, it is receiving increasing attention across the globe. [0003] Wide bandgap semiconductor materials have the characteristics of large bandgap width, high electron drift saturation velocity, small dielectric constant, and good electrical conductivity. GaN materials have excellent properties and potential applications in the field of power devices. One of the cores of the third-generation semiconductor materials, compared with silicon carbide (S...

Claims

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Application Information

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IPC IPC(8): H01L29/812H01L29/06H01L29/423H01L21/338
CPCH01L29/0607H01L29/0684H01L29/42316H01L29/66863H01L29/812
Inventor 段宝兴王彦东孙李诚杨银堂
Owner XIDIAN UNIV
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