Preparation method of laminated antireflection film of solar cell
A technology of solar cells and anti-reflection coatings, applied in circuits, electrical components, photovoltaic power generation, etc., can solve problems such as poor passivation quality of silicon nitride films
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Embodiment 1
[0030] A method for preparing a laminated anti-reflection film for a solar cell. The structure of the laminated anti-reflection film in this embodiment is to sequentially deposit a silicon nitride oxide thin film layer and a silicon nitride thin film layer on the back surface of a substrate by plasma chemical vapor deposition. It is a structure of double-layered anti-reflection film, the comprehensive refractive index of the whole film layer is 2.10, and the comprehensive film thickness of the whole film layer is 160nm.
[0031] The preparation method of the silicon oxynitride thin film and the silicon nitride thin film double-layer laminated anti-reflection film of this embodiment comprises the following steps:
[0032] (1) Deposit a layer of silicon oxynitride film on the back surface of silicon wafer by plasma chemical vapor deposition method through PECVD tubular plasma deposition furnace, the refractive index of the silicon oxynitride film is 2.10-2.15, and the film thickn...
Embodiment 2
[0038] A method for preparing a laminated anti-reflection film for a solar cell. The structure of the laminated anti-reflection film in this embodiment is to sequentially deposit a silicon nitride oxide film layer and a three-layer silicon nitride film on the back surface of a substrate by plasma chemical vapor deposition , which is a four-layer antireflection film structure, the comprehensive refractive index of the whole film layer is 2.08-2.10, and the comprehensive film thickness of the whole film layer is 180nm-210nm.
[0039] The preparation method of the four-layer laminated anti-reflection film of the present embodiment comprises the following steps:
[0040] (1) Deposit a layer of silicon oxynitride film on the back surface of silicon wafer by plasma chemical vapor deposition method through PECVD tubular plasma deposition furnace, the refractive index of the silicon oxynitride film is 2.25-2.30, and the film thickness is 20nm- 30nm;
[0041] The refractive index of t...
Embodiment 3
[0048] The minority carrier lifetime test was carried out on the laminated anti-reflection coatings prepared on the single crystal silicon in the above examples and comparative examples. The light irradiation wavelength in the minority carrier lifetime test was 1064nm. The results are shown in Table 1.
[0049] The minority carrier lifetime of the stacked anti-reflection coating of the embodiment and the comparative example in table 1
[0050]
[0051]
[0052] It can be seen from Table 1 that the minority carrier lifetime of the double-layer laminated anti-reflection film of the silicon oxynitride film and the silicon nitride film of embodiment 1 is increased by about 60 μ s on average compared with the comparative example; the minority carrier lifetime of the four-layer laminated anti-reflection film of embodiment 2 is shorter than The average increase of about 50μs in the comparison example.
[0053] The electrical properties and efficiency were tested after the solar...
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Abstract
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