Etching solution for photoelectrochemical etching of gallium nitride

A technology of photoelectrochemistry and etching solution, applied in the direction of chemical instruments and methods, circuits, electrical components, etc., can solve the problems of large material damage, cost and energy loss, and environmental adverse effects
CN112779013AActive Publication Date: 2021-05-11SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
Publication Date
2021-05-11

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention discloses an etching solution for photoelectrochemical etching of gallium nitride. The etching solution is formed by dissolving amino acid or derivatives thereof in a solvent. According to the invention, the amino acid or the derivative of the amino acid is used as an etching agent for photoelectrochemical etching of the gallium nitride, the gallium nitride can be effectively etched, and the etching process is low in equipment requirement, convenient to operate, simple in process, green, environmentally friendly and small in damage to the surface of a material.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to the technical field of semiconductor etching, and in particular relates to an etching solution for photoelectrochemical etching of gallium nitride. Background technique

[0002] Gallium Nitride (GaN), as a typical representative of the third-generation semiconductor materials, has excellent physical and chemical properties such as large band gap, high electron saturation shift velocity, good thermal conductivity, high hardness, and good thermal stability. It is one of the most concerned wide-bandgap and direct-bandgap semiconductor materials for making blue-green light and ultraviolet light optoelectronic devices.

[0003] Current GaN etching methods are divided into dry etching and wet etching. Due to the high thermal and chemical stability of GaN materials, dry etching was mainly used in the early days. Dry etching uses expensive, bulky equipment, complicated operations, and most methods use toxic and harmful gases. In ord...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More