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Ga2O3 metal oxide semiconductor field effect transistor based on supercritical CO2 treatment and preparation method thereof

An oxide semiconductor and field effect transistor technology, applied in the field of microelectronics, can solve problems such as reduction of carrier mobility and device switching ratio, increase of gate leakage and sub-threshold swing, and impact on device performance stability. , to reduce the possibility of gate tunneling, reduce gate leakage, and avoid premature breakdown.

Active Publication Date: 2021-10-26
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The lattice mismatch between the two materials at the interface between β-Ga2O3 and the gate insulating dielectric layer results in a large number of dangling bonds at the interface, and β-Ga Oxygen vacancy defects in >2O3 epitaxial materials also introduce a large number of deep level defects at the interface, which adversely affects device performance
There are two main reasons: one is that the existence of interface problems will lead to the increase of gate leakage and subthreshold swing, the decrease of carrier mobility and device switching ratio; the other is the occurrence of gate tunneling This leads to early breakdown of the device, which reduces the breakdown voltage. The results of these two reasons will eventually affect the performance and stability of the device.

Method used

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  • Ga2O3 metal oxide semiconductor field effect transistor based on supercritical CO2 treatment and preparation method thereof
  • Ga2O3 metal oxide semiconductor field effect transistor based on supercritical CO2 treatment and preparation method thereof
  • Ga2O3 metal oxide semiconductor field effect transistor based on supercritical CO2 treatment and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Embodiment 1, making the gate dielectric is a layer of Al 2 o 3 , and mixed with 0.5ml deionized water, supercritical CO 2 Treat Ga for 1h 2 o 3 MOSFET devices.

[0042] Step 1, perform standard cleaning on the substrate, such as figure 2 (a).

[0043] will grow with UIDβ-Ga 2 o 3 Fe / Mg doped β-Ga in the buffer layer 2 o 3 Semi-insulating substrate, put it in 50ml of acetone and ultrasonically clean it for 5min at 80W power;

[0044] Then use 50ml of ethanol and deionized water to sonicate at 80W for 1min, and finally blow dry with high-purity nitrogen.

[0045] Step 2, grow n-type β-Ga on the buffer layer 2 o 3 epitaxial layer, such as figure 2 (b).

[0046] Put the sample that has completed the standard cleaning into the MBE equipment, and heat and evaporate Ga metal with a purity of 99.9999% and SnO with a purity of 99.99% in a K chamber at 800°C 2 Powder to provide Ga element and Sn element, using 5% ozone and 95% oxygen mixture as the source of O e...

Embodiment 2

[0072] Embodiment 2, making the gate dielectric is a layer of HfO 2 , and mixed with 1ml deionized water, supercritical CO 2 Process Ga for 1.5h 2 o 3 MOSFET devices.

[0073] Step 1, perform standard cleaning on the substrate, such as figure 2 (a).

[0074] The specific implementation of this step is the same as step 1 of Embodiment 1.

[0075] Step 2, growing n-type β-Ga on the buffer layer 2 o 3 epitaxial layer, such as figure 2 (b).

[0076] Put the sample that has completed standard cleaning into the MBE equipment, and heat and evaporate Ga metal with a purity of 99.9999% and SnO with a purity of 99.99% in a K chamber at 760°C 2 Powder to provide Ga element and Sn element, using 5% ozone and 95% oxygen mixture as the source of O element;

[0077] Apply a size of 2*10 to the obtained Ga atomic beam -4 The equivalent pressure of Pa makes it enter the reaction chamber, and the O 3 and O 2 Mix the gas, and heat the substrate to a temperature of 700°C, and finally...

Embodiment 3

[0100] Embodiment 3, making the gate dielectric is Al 2 o 3 and HfO 2 Double-layer structure, and mixed with 1ml isopropanol, supercritical CO 2 Treat Ga for 2h 2 o 3 MOSFET devices.

[0101] Step A, perform standard cleaning on the substrate, such as figure 2 (a).

[0102] The specific implementation of this step is the same as step 1 of Embodiment 1.

[0103] Step B, growing n-type β-Ga on the buffer layer 2 o 3 epitaxial layer, such as figure 2 (b).

[0104] Put the sample that has completed the standard cleaning into the MBE equipment, heat and evaporate Ga metal with a purity of 99.9999% and SnO with a purity of 99.99% in a K chamber at 860°C 2 Powder to provide Ga element and Sn element, using 5% ozone and 95% oxygen mixture as the source of O element;

[0105] Apply a size of 2*10 to the obtained Ga atomic beam -4 The equivalent pressure of Pa makes it enter the reaction chamber, and the O 3 and O 2 Mix the gases, and heat the substrate to a temperature...

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Abstract

The invention discloses a Ga2O3 MOSFET device based on supercritical CO2 processing and a manufacturing method thereof, and mainly solves the problems of current leakage and large sub-threshold swing of the existing device. The method is technically characterized in that an insulated gate dielectric layer in an existing Ga2O3MOSFET device structure adopts one or more of SiO2, Al2O3, HfO2 and ZrO2, and the prepared device is subjected to supercritical carbon dioxide treatment, that is, the device is placed in a supercritical equipment chamber, deionized water or isopropyl alcohol is put into the chamber, CO2 is filled after sealing, the temperature of the equipment is increased to 118-122 DEG C, the pressure is increased to 19-21 Mpa, the supercritical state is kept for 1-2 h, the temperature of the device is reduced to the room temperature, and the device is taken out after the pressure intensity is reduced to the atmospheric pressure. According to the invention, the leakage current and the subthreshold swing are reduced, the carrier mobility is increased, the stability is improved, and the method can be used for manufacturing a high-performance Ga2O3 device.

Description

technical field [0001] The invention belongs to the technical field of microelectronics, in particular to a supercritical CO 2 Processed Ga 2 o 3 The metal oxide semiconductor field effect transistor can be used to prepare high-power switching devices. Background technique [0002] In today's era, high-power switching devices are more and more widely used in the field of power electronics, and the performance of devices made of the first-generation semiconductor materials represented by silicon materials has been difficult to meet the current needs of high-power devices. The third-generation wide-bandgap semiconductor with ultra-wide bandgap width has become a "supernova" in the field of high-power devices and has received more and more attention. Ga 2 o 3 As a wide bandgap semiconductor material, it has five isomers, of which monoclinic β-type Ga 2 o 3 The best stability, and β-Ga 2 o 3 Compared with the other two wide-bandgap semiconductors silicon carbide and gal...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/423H01L29/24H01L29/06H01L29/78H01L21/336
CPCH01L29/42364H01L29/24H01L29/0611H01L29/78H01L29/66477
Inventor 冯倩蔡云匆王正兴田旭升张春福周弘张进成
Owner XIDIAN UNIV