Low-temperature plasma cold sterilization and mycin degradation method for aspergillus flavus in coarse cereals

A low-temperature plasma and plasma cooling technology, applied in the preservation of seeds by freezing/cooling, preservation of seeds by radiation/electrical treatment, etc., can solve the problem of no simultaneous sterilization method of Aspergillus flavus, cumbersome operation, and degradation effect of plasma treatment. limited and other problems, to avoid the loss of sensory quality, low temperature rise, and shorten working time.

Pending Publication Date: 2022-07-15
SUZHOU YIRUN FOOD TECH CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Patent CN201410651104.9 discloses a kind of aflatoxin B 1 The plasma degradation method; patent CN201110254907.7 discloses a device for plasma degradation of aflatoxin and its application; these methods need to maintain a certain degree of vacuum when placing aflatoxin in the plasma, and the operation is cumbersome. The degradation effect of a single plasma treatment is limited, and these methods only illustrate the degradation of aflatoxin and there is no bactericidal method for Aspergillus flavus at the same time

Method used

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  • Low-temperature plasma cold sterilization and mycin degradation method for aspergillus flavus in coarse cereals
  • Low-temperature plasma cold sterilization and mycin degradation method for aspergillus flavus in coarse cereals
  • Low-temperature plasma cold sterilization and mycin degradation method for aspergillus flavus in coarse cereals

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] Sterilization and AFB of Aspergillus flavus in Maize by High Voltage Electric Field Dielectric Barrier Low Temperature Plasma at Different Working Voltage Intensities 1 Degradation effect:

[0033] Will Aspergillus flavus positive or AFB 1 The positive corn samples are laid flat (stacking height 0.5cm) between the high-voltage electric field dielectric barrier low-temperature plasma electrodes, the relative humidity of the environment is 40±5%, the working voltage intensity is 48, 52, 56, 60 and 64kV / cm, and the working frequency The samples were processed under the conditions of 50 Hz and 2 min working time. Counting of Aspergillus flavus was carried out by plate coating counting method; AFB was carried out by fluorescent immunoassay kit. 1 determination of concentration.

[0034] Table 1 Sterilization and AFB of Aspergillus flavus in maize under the condition of different working voltage intensity with high voltage electric field dielectric barrier low temperature ...

Embodiment 2

[0038] Sterilization and AFB of Aspergillus flavus in Maize by High Voltage Electric Field Dielectric Barrier Low Temperature Plasma at Different Operating Frequency 1 Degradation effect

[0039] Will Aspergillus flavus positive or AFB 1 The positive corn samples are laid flat (stacking height 0.5cm) between the high-voltage electric field dielectric barrier low-temperature plasma electrodes, the ambient relative humidity is 40±5%, the working frequency is 50, 60, 70, 80 and 90 Hz, and the working voltage intensity is 64kV / cm, and the samples were processed under the condition of 2 min working time. Counting of Aspergillus flavus was carried out by plate coating counting method; AFB was carried out by fluorescent immunoassay kit. 1 determination of concentration.

[0040] Table 2 Sterilization and AFB of Aspergillus flavus in corn under different working frequencies of high-voltage electric field dielectric barrier low-temperature plasma 1 Degradation effect

[0041] ...

Embodiment 3

[0044] Sterilization and AFB of Aspergillus flavus in Maize under Different Treatment Time of High Voltage Electric Field Dielectric Barrier Low Temperature Plasma 1 Degradation effect

[0045] Will Aspergillus flavus positive or AFB 1 The positive corn samples are laid flat (stacking height 0.5cm) between the high-voltage electric field dielectric barrier low-temperature plasma electrodes, the relative humidity of the environment is 40±5%, the working voltage intensity is 64kV / cm, the working frequency is 50Hz, and the working time is 1, 2, Samples were processed under 4 and 5 min conditions. Counting of Aspergillus flavus was carried out by plate coating counting method; AFB was carried out by fluorescent immunoassay kit. 1 determination of concentration.

[0046] Table 3 Sterilization and AFB of Aspergillus flavus in corn under different treatment time of high voltage electric field dielectric barrier low temperature plasma 1 Degradation effect

[0047] Proce...

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Abstract

According to the low-temperature plasma cold sterilization and mycin degradation method for the aspergillus flavus in the coarse cereals, different low-temperature plasma treatment combination modes are adopted for cold sterilization of the aspergillus flavus in the coarse cereals, and meanwhile the toxin degradation effect is achieved. The specific mode is that high-voltage electric field dielectric barrier low-temperature plasma, low-temperature plasma fusion ultraviolet airflow sterilization and high-voltage pulse electric field low-temperature plasma cold sterilization are combined to sterilize coarse cereals. Wherein the excitation conditions of the high-voltage electric field dielectric barrier low-temperature plasma are as follows: the voltage intensity is 40-70kV / cm, the frequency is 50-90Hz, and the treatment conditions of the low-temperature plasma and ultraviolet airflow combined sterilization device are as follows: the power density of the low-temperature plasma is 0.5-2.5 W / cm < 2 >, the frequency of the low-temperature plasma is 6-10kHz, the ultraviolet power density is 0.25-0.85 W / cm < 2 >, and the airflow is 6m < 3 > / min; the voltage intensity of the high-voltage pulsed electric field low-temperature plasma generator is 10-20 kV / cm, the pulse frequency is 200-300 Hz, and the power density is 2.0-4.0 W / cm < 2 >. According to the method, the treatment time is 2.5 + / -0.5 min, the killing rate of aspergillus flavus in the corn reaches 99.70 + / -0.05%, and meanwhile, the degradation rate of aflatoxin reaches 72.98 + / -0.11%.

Description

technical field [0001] The invention relates to the technical field of food sterilization, in particular to a low-temperature plasma cold sterilization of Aspergillus flavus in miscellaneous grains and a method for degrading the same. Background technique [0002] Aspergillus flavus is a kind of saprophytic aerobic fungi, which can grow and reproduce in almost all agricultural products, especially the grain crops and the food and feed that are used as raw materials are most susceptible to infection, resulting in strong toxic, carcinogenic, teratogenic Secondary metabolite aflatoxin. Aflatoxin is a group of structural analogs of difuroxaphthalene ketones, more than 20 kinds of which have been isolated and identified, among which aflatoxin B 1 (AFB 1 ) is the most toxic 10 times that of potassium cyanide and 68 times that of arsenic, and is classified as a class I carcinogen by the International Agency for Cancer. It has been reported in the literature that nearly 25% of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A23B9/10A23B9/06
CPCA23B9/10A23B9/06A23V2002/00A23V2200/10A23V2300/20A23V2300/12
Inventor 章建浩赵璐玲李善瑞
Owner SUZHOU YIRUN FOOD TECH CO LTD
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