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Method and device for atmospheric plasma processing

A technology of atmospheric pressure plasma and treatment method, which is applied in the field of atmospheric pressure plasma treatment and its device, and can solve the problems of unfavorable industrial adoption, incapable of surface modification treatment, inability to obtain high-quality semiconductor components, etc.

Inactive Publication Date: 2007-05-23
SEKISUI CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But said method all is to contain the gas atmosphere that plasma occurs in the gas atmosphere of the organic compound such as helium or xenon is limited
In addition, helium is not suitable for industrial use due to its high price, and in the case of containing organic compounds, the organic compounds themselves often react with the gas to be treated, so that the required surface modification treatment cannot be performed
[0004] Moreover, for the formation of thin films in the manufacture of semiconductor elements, etc., the existing atmospheric pressure plasma treatment method is unfavorable to industrial processes because of its slow processing speed.
In addition, in the process of forming a film at high temperature and dry etching, the object to be processed is often oxidized due to the gas atmosphere near the processing part where the plasma is in contact with the object to be processed, the formed film is oxidized, and the corrosion part is oxidized, etc. Therefore, there is a problem that high-quality semiconductor elements cannot be obtained
In order to solve these problems, once the processing is performed under vacuum in a closed container, it will be the same as the processing under low pressure, and cannot be adapted to high-speed processing and large-area substrate processing.

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  • Method and device for atmospheric plasma processing
  • Method and device for atmospheric plasma processing
  • Method and device for atmospheric plasma processing

Examples

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Embodiment 1

[0115] Using the apparatus shown in FIG. 11, using nitrogen as a specific gas, plasma was generated under the following conditions while exhausting, and a 2-inch (100) silicon wafer was dry-etched. Where the solid dielectric is Al 2 O 3 , The plasma emission aperture is set to 1 mm, and the distance from the plasma blowing port to the base material is set to 2 mm.

[0116] Plasma treatment conditions:

[0117] Processing gas: oxygen 0.1SLM+CF 4 0.4SLM+argon 9.5SLM mixed gas

[0118] Discharge conditions: waveform a, rise / fall time 5 microseconds, output 200 watts, frequency 10kHz, treatment time 20 seconds, the plasma generated is uniform discharge without arc.

[0119] The surface of the obtained silicon wafer was measured by a scanning electron microscope cross-sectional observation method, and the etching depth was 0.2 microns.

Embodiment 2

[0125] 4 Parallel plate electrodes made of stainless steel are used as the upper electrode 2 and the lower electrode 3, and aluminum with a thickness of 1 mm is used as the solid dielectric 4. In the space with a distance of 2 mm between the electrodes, a polyimide film 14 (size: The device shown in Figure 14 is used to contact the plasma with the object to be processed in a container filled with a specific gas, and nitrogen is formed on the base material. Silicon film. In the device shown in Figure 14, SUS30100×100mm, thickness 50 microns (300 mm wide×100 mm long×20 mm thick) is used as the film-forming base material, and conveyed by conveying rollers and winding rollers.

[0126] Using 0.16% tetramethylsilyl and 16% ammonia diluted with argon as the processing gas, it is supplied along the white empty arrow, and the waveform of Figure 1(a) is applied between the upper electrode 2 and the lower electrode 3. A pulse waveform, a rise time of 5 microseconds, and a pulsed electric fi...

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Abstract

The present invention provides a method and an equipment for plasma treatment under the atmospheric pressure for treating an article to be treated comprising: providing a solid dielectric on at least one opposing face of a pair of opposing electrodes under a pressure near the atmospheric pressure; introducing a treatment gas between said a pair of opposing electrodes; generating plasma by applying an electric field between said electrodes; and contacting said plasma with said article to be treated, wherein an used gas is exhausted from the vicinity of treatment section where said plasma and said article to be treated are in contact, and said vicinity of treatment section is maintained under a specified gas atmosphere by a gas atmosphere control mechanism.

Description

Technical field [0001] The present invention relates to an atmospheric pressure plasma processing method at a pressure near atmospheric pressure. The processed gas is discharged from the vicinity of the processing part and the atmospheric pressure plasma is equipped with a gas atmosphere adjustment mechanism that maintains a specific gas atmosphere in the vicinity of the processing part. Body treatment method and device. Background technique [0002] In the past, methods of modifying the surface of the object to be processed or forming a thin film on the object to be processed by generating glow discharge plasma under low-pressure conditions have also been put into practical use. However, processing under these conditions requires a vacuum chamber and a vacuum exhaust device, and the processing operation becomes complicated. Therefore, the surface processing device becomes a high-priced product and is hardly used for processing large-area substrates. For this reason, a method of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C16/54H01L21/205H01L21/31H01L21/302C23C16/44C23C16/455C23C16/50C23C16/515G21C3/08H01J37/32H05H1/24
CPCG21C3/08H01J37/32357C23C16/50H05H1/24C23C16/4409C23C16/45595C23C16/4412H01J37/3244C23C16/545C23C16/515H01J37/32449Y02E30/40H01J2237/188H05H2240/10Y02E30/30
Inventor 屋良卓也汤浅基和本间孝治高妻诚
Owner SEKISUI CHEM CO LTD
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