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Preparation method of nitrogen-doped zinc oxide film

A nitrogen-doped zinc oxide and thin film technology, which is applied in the fields of final product manufacturing, gaseous chemical plating, sustainable manufacturing/processing, etc., can solve problems such as complex process and unsatisfactory effect, and achieve complete film structure, remarkable performance, The effect of simple method

Active Publication Date: 2012-01-04
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

However, the methods currently used are more complicated, and the effect is not very ideal. The N atoms doped into the molecular gap are more than the N atoms that replace O. Therefore, another method is needed to convert the doped N atoms Injected into the molecular structure by growth

Method used

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  • Preparation method of nitrogen-doped zinc oxide film
  • Preparation method of nitrogen-doped zinc oxide film
  • Preparation method of nitrogen-doped zinc oxide film

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Embodiment Construction

[0028] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0029] An embodiment of the present invention provides a method for preparing a nitrogen-doped zinc oxide film, which specifically includes the following steps:

[0030] Step 101, treating the surface of the silicon substrate with a standard solution and hydrofluoric acid to form a silicon-hydrogen bond on the surface of the silicon substrate, such as figure 1 As shown, wherein, the standard solution refers to: No. 1 liquid, concentrated sulfuric acid: hydrogen peroxide = 4: 1; No. 2 liquid, ammonia water: pure water: hydrogen peroxide = 1: 5: 1; No. 3 liquid, hydrochloric acid: hydrogen peroxide: pure water =1:1:6; place the hydrogenated silicon substrate in the reaction chamber of the atomic layer deposition equipment;

[0031] Step 102, turn on the atomic layer deposition equipment, adjust the working parameters to achiev...

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Abstract

The invention relates to the technical field of zinc oxide preparation, and in particular relates to a preparation method of a nitrogen-doped zinc oxide film. The preparation method comprises: placing a silicon substrate in the reaction cavity of atomic layer deposition (ALD) equipment; introducing gas containing a zinc source into the reaction cavity of the ALD equipment, wherein the zinc atoms in the gas containing the zinc source are adsorbed to the silicon substrate; conveying hydrogen to the reaction cavity of the ALD equipment based on nitrogen as a carrier gas, and simultaneously carrying out plasma discharge; introducing an oxygen-containing source to the reaction cavity of the ALD equipment, wherein the zinc atoms which do not react with nitrogen atoms form zinc-oxygen bonds withthe oxygen atoms in the oxygen-containing source; and repeating the steps, so as to grow the zinc oxide film containing the nitrogen atoms layer by layer. In the preparation method provided by the invention, nitrogen doping is carried out on the zinc oxide film by utilizing the ALD equipment; the method is simple and practicable; by utilizing the characteristic of atomic layer deposition and single-layer cycle growth, the uniform nitrogen doping in the whole film structure can be achieved in the process of zinc oxide film growth so that the doped film is complete in structure and excellent inproperty.

Description

technical field [0001] The invention relates to the technical field of zinc oxide preparation, in particular to a method for preparing a nitrogen-doped zinc oxide thin film. Background technique [0002] ZnO thin film is an important photoelectric device material, and it is an important research direction in the field of optoelectronics after GaN. It is a direct bandgap material with wide bandgap, hexagonal wurtzite structure, and exciton binding energy up to 60meV. Due to the existence of defects in intrinsic ZnO, ZnO is n-type, and it is difficult to prepare p-type thin films. The theoretical calculation of nitrogen doping makes the preparation of p-type ZnO possible. At present, the thin film has been prepared by pulsed laser deposition, metal organic chemical vapor deposition (MOCVD), molecular beam epitaxy and other methods. while N 2 , NO, NH 3 and other gases as nitrogen sources have also been studied. However, the methods currently used are more complicated in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/40H01L21/365H01L31/0296H01L31/18
CPCY02P70/50
Inventor 刘键饶志鹏万军夏洋李超波陈波黄成强石莎莉李勇滔
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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