Method for removing surface line marks of diamond linear cutting polycrystalline silicon chip through wet method

A technology of polycrystalline silicon wafers and diamond wires, which is applied in the manufacture of electrical components, semiconductor/solid-state devices, circuits, etc., can solve the problems of long cutting time, difficult separation and purification of silicon powder, low cutting efficiency, etc., and achieve high repeatability Effect

Active Publication Date: 2017-01-18
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] 1. The cutting efficiency is relatively low
The reason is that mortar cutting is a three-body cutting of abrasive-steel wire-silicon interaction, and the contact interface during cutting is very small, resulting in long cutting time and low efficiency
[0004] 2. Silicon sawdust is difficult to recover and purify
Because they are mixed with silicon carbide abrasive powder, and the physical and chemical properties of silicon carbide and silicon are very close, it is difficult to separate, purify and recycle silicon powder. Some studies have found that the abrasives that are not fully utilized are as high as 90%.
[0005] 3. Large environmental load
However, this method cannot effectively remove the cutting marks on the surface after diamond wire cutting, resulting in a polycrystalline solar cell with an efficiency of only 16.54%.

Method used

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  • Method for removing surface line marks of diamond linear cutting polycrystalline silicon chip through wet method
  • Method for removing surface line marks of diamond linear cutting polycrystalline silicon chip through wet method
  • Method for removing surface line marks of diamond linear cutting polycrystalline silicon chip through wet method

Examples

Experimental program
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Effect test

Embodiment 1

[0048] (1) First use acidic hydrogen peroxide containing sulfuric acid for acid oxidation cleaning, then use weak alkaline hydrogen peroxide containing amine for alkaline oxidation cleaning, then use dilute hydrofluoric acid solution for cleaning, and finally use hydrochloric acid Acidic hydrogen peroxide is used for acidic oxidation cleaning, rinsing with ultrapure water (DI water) in the middle of each cleaning, and finally drying with low boiling point organic solvents.

[0049] (2) Dip the cleaned silicon wafer into solution 1 for pre-texturing treatment, HF: HNO 3 :H 2 O=1:3:2, the reaction time is 180s, and the micron worm-like structure is obtained

[0050] (3) Dip the cleaned silicon wafer into solution 2 for corrosion, 0.1mM AgNO 3 +24mM Cu(NO 3 ) 2 +5M HF+0.4MH 2 o 2 , controlling the molar ratio of silver and copper ions to be 1:240 to obtain nanopore and nanogroove structures, the reaction time is 180s, and the reaction temperature is room temperature;

[00...

Embodiment 2

[0056] (1) First use acidic hydrogen peroxide containing sulfuric acid for acid oxidation cleaning, then use weak alkaline hydrogen peroxide containing amine for alkaline oxidation cleaning, then use dilute hydrofluoric acid solution for cleaning, and finally use hydrochloric acid Acidic hydrogen peroxide is used for acidic oxidation cleaning, rinsing with ultrapure water (DI water) in the middle of each cleaning, and finally drying with low boiling point organic solvents.

[0057] (2) Dip the cleaned silicon wafer into solution 1 for pre-texturing treatment, HF: HNO 3 :H 2 O=1:3:2, the reaction time is 90s, and the micron worm-like structure is obtained

[0058] (3) Dip the cleaned silicon wafer into solution 2 for corrosion, 0.1mM AgNO 3 +24mMCu(NO 3 ) 2 +5M HF+0.4MH 2 o 2 , controlling the molar ratio of silver and copper ions to be 1:240 to obtain nanopore and nanogroove structures, the reaction time is 180s, and the reaction temperature is room temperature;

[0059...

Embodiment 3

[0064] (1) First use acidic hydrogen peroxide containing sulfuric acid for acid oxidation cleaning, then use weak alkaline hydrogen peroxide containing amine for alkaline oxidation cleaning, then use dilute hydrofluoric acid solution for cleaning, and finally use hydrochloric acid Acidic hydrogen peroxide is used for acidic oxidation cleaning, rinsing with ultrapure water (DI water) in the middle of each cleaning, and finally drying with low boiling point organic solvents.

[0065] (2) Dip the cleaned silicon wafer into solution 1 for pre-texturing treatment, HF: HNO 3 :H 2 O=1:3:2, the reaction time is 180s, and the micron worm-like structure is obtained

[0066] (3) Dip the cleaned silicon wafer into solution 2 for corrosion, 0.1mM AgNO 3 +24mM Cu(NO 3 ) 2 +10M HF+0.4M H 2 o 2 , controlling the molar ratio of silver and copper ions to be 1:240 to obtain nanopore and nanogroove structures, the reaction time is 180s, and the reaction temperature is room temperature;

[...

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Abstract

The invention discloses a method for removing cutting marks generated at the back surface of diamond linear cutting polycrystalline silicon. The method comprises the following steps: 1, pre-cleaning a silicon chip; 2, placing the cleaned silicon chip in an HF/HNO3/H2O mixed solution for texturing processing; 3, placing the textured silicon chip in a mixed solution of H2O2/HF/AgNO3/Cu(NO3)2 and ultrapure water for corrosion so as to prepare a nanometer structure; and 4, performing expansion processing on the nanometer structure by use of a nanometer reconstruction solution, and performing anisotropic corrosion so as to remove the cutting marks at the surface of the polycrystalline silicon. According to the invention, on the basis that a black silicon anti-reflection structure is prepared based on MACE (metal-assisted chemical etching), the cutting marks at the surface of the diamond linear cutting polycrystalline silicon chip by use of anisotropy in a corrosion process, at the same time, the reflectivity of the surface of the silicon chip is also greatly reduced, and the method has important application potential in future preparation of low-cost high-conversion-efficiency diamond linear cutting polycrystalline silicon solar batteries.

Description

technical field [0001] The invention discloses a method for removing cutting marks produced on the surface of polysilicon after diamond wire cutting. On the basis of MACE (metal-assisted chemical etching method) to prepare black silicon anti-reflection structure, the anisotropy in the corrosion process is used to remove the diamond. The cutting marks on the surface of wire-cut polycrystalline silicon wafers also greatly reduce the reflectivity of the surface of silicon wafers, which has important application potential for the preparation of low-cost, high-conversion-efficiency diamond wire-cut polycrystalline silicon solar cells in the future. Background technique [0002] At present, the photovoltaic power generation of crystalline silicon (single crystal and polycrystalline) solar cells is the mainstream field of photovoltaic power generation, but because its cost is too high to replace traditional energy sources, cost reduction has become the biggest problem in this indust...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02
Inventor 沈鸿烈郑超凡蒲天蒋晔吴兢
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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