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A method for studying the oxidation process of a metal thin film transmission electron microscope sample

A technology for transmission electron microscope samples and metal thin films, applied in the field of detection, can solve the problems of complex structure of oxide layer on the surface of metal materials, high cost, long sample time, etc., and achieves easy preparation of metal oxides, simple test steps, and simple test instruments. Effect

Active Publication Date: 2022-04-19
YANSHAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Scientists have been committed to studying the high-temperature oxidation process of metal materials through transmission electron microscopy. However, due to the complex structure and unmeasured thickness of the oxide layer on the surface of metal materials, conventional transmission electron microscope sample preparation methods cannot prepare transmission samples of the surface oxide layer.
In recent years, with the application of new technologies, it has been possible to study the oxidation process of metal materials in transmission electron microscopy, which is mainly due to the emergence of focused ion beam cutting sample preparation equipment and the emergence of in-situ environment transmission electron microscopy: focused ion beam cutting technology can The preparation of transmission electron microscope samples under scanning electron microscope can prepare transmission samples of the surface layer of metal materials for electron microscope analysis, but the focused ion beam cutting equipment is expensive, and it takes too long to prepare samples; Conduct oxidation tests on metal materials in the laboratory and analyze oxidation products
However, the cost of environmental transmission electron microscope equipment is also expensive. The price of ordinary environmental transmission electron microscope is close to 10 million, while the environmental transmission electron microscope with spherical aberration correction is as high as more than 20 million
Therefore, the use of transmission electron microscopy to study the oxidation process of metal materials can only be carried out in very few universities and research institutes, and cannot be popularized.

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  • A method for studying the oxidation process of a metal thin film transmission electron microscope sample
  • A method for studying the oxidation process of a metal thin film transmission electron microscope sample
  • A method for studying the oxidation process of a metal thin film transmission electron microscope sample

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Embodiment 1

[0035] The material is stainless steel with a single-phase face-centered cubic structure. Thin slices of 3 mm × 5 mm × 0.5 mm were cut by electric discharge, and ground with water sandpaper to a thickness of 50 μm. The Φ3 mm sample was cut and double-jet thinned to prepare a thin area: the electrolyte was 10% methanol solution of perchloric acid, the polishing voltage was 24 V, the current was 85 mA, and the temperature was -20°.

[0036] Step 1. Load the above prepared transmission electron microscope into FEI Talos F200X transmission electron microscope for microstructure characterization. The typical structure is single-phase austenite. Select a region near a crack to collect transmission electron microscope images. figure 1 As shown in a, and photographed the diffraction spots of austenite obtained by electron diffraction, figure 1 as shown in b.

[0037] Step 2, the sample in step 1 is taken out from the transmission electron microscope, and placed on the steel sheet st...

Embodiment 2

[0041] The material is stainless steel with a single-phase face-centered cubic structure. Thin slices of 3 mm × 5 mm × 0.5 mm were cut by electric discharge, and ground with water sandpaper to a thickness of 50 μm. The Φ3 mm sample was cut and double-jet thinned to prepare a thin area: the electrolyte was 10% methanol solution of perchloric acid, the polishing voltage was 24 V, the current was 85 mA, and the temperature was -20°.

[0042] Step 1. Load the above prepared transmission electron microscope into FEI Talos F200X transmission electron microscope for microstructure characterization. The typical structure is single-phase austenite. Select two grain boundary regions of coarse grains to collect transmission electron microscope images. Figure 4 As shown in a, and photographed the diffraction spots of austenite obtained by electron diffraction, Figure 4 as shown in b.

[0043] Step 2, the sample in step 1 is taken out from the transmission electron microscope, and placed...

Embodiment 3

[0047] The material is a CoCrFeNi high-entropy alloy with a single-phase face-centered cubic structure. Thin slices of 10 mm × 10 mm × 0.4 mm were cut by electric discharge and ground with water sandpaper to a thickness of 60 μm. The Φ3 mm sample was cut and double-jet thinned to prepare a thin area: the electrolyte was 10% methanol solution of perchloric acid, the polishing voltage was 26 V, the current was 100 mA, and the temperature was -20°.

[0048] Step 1. Load the above prepared transmission electron microscope into FEI Talos F200X transmission electron microscope for microstructure characterization. The typical structure is single-phase austenite. Select the vicinity of the thin area containing square holes to collect transmission electron microscope images. Figure 7 As shown in a, and photographed the diffraction spots of austenite obtained by electron diffraction, Figure 7 as shown in b.

[0049] Step 2, the sample in step 1 is taken out from the transmission ele...

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Abstract

The invention discloses a method for studying the oxidation process of a metal thin film transmission electron microscope sample, which belongs to the technical field of detection. Through the results of two transmission electron microscope observations on metal materials, the oxidation process of metal materials is compared and studied. The invention provides a method for studying the oxidation process of a metal thin film transmission electron microscope sample, which has the advantages of convenient preparation of the transmission electron microscope sample, simple instrument, simple test steps and convenient operation.

Description

technical field [0001] The invention belongs to the technical field of detection, and in particular relates to a method for studying the oxidation process of a metal thin film transmission electron microscope sample. Background technique [0002] Metal materials have good specific strength and specific stiffness, and as structural materials with excellent mechanical properties, they are widely used in the field of building decoration and instrument manufacturing. The problem of high-temperature oxidation often occurs in the production and manufacturing process of metal materials. For example, in the casting process, high-temperature forging process, high-temperature rolling process and high-temperature extrusion molding process of metal materials, oxide layers of different thicknesses will be formed on the surface of the material. . In addition, metal materials used in high-temperature environments will also form an oxide layer on the surface during service, such as: metal ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04G01N23/20058G01N23/20008G01N1/44
CPCG01N23/04G01N23/20058G01N23/20008G01N1/44
Inventor 于鹏飞闫志刚郑春雷
Owner YANSHAN UNIV