90 results about "EM - Electron microscopy" patented technology

The invention discloses a toughening forming method of a high-performance PEI plate for a high-heat-resistance structural part, and particularly relates to the technical field of high-performance composite material forming. Pre-embedding a PEI toughening layer between thermosetting prepreg layers, and controlling the temperature, the pressure, the pressure maintaining time and the heating rate in the hot pressing process; carrying out infrared spectrum or solid nuclear magnetic resonance testing on the interface area sample subjected to hot press molding, and calculating the chain segment residual rate Rp; determining the interface penetration depth Di through a transmission electron microscope in combination with energy spectrum analysis; inputting the Rp and the Di into an interface coupling model, and outputting an interface combination quality factor Q by the model in a form of combining weighted linearity and logarithmic functions; the interface bonding grade is judged according to the Q value, and when the Q value is lower than a threshold value, hot-pressing process parameters are backtracked for optimization; according to the method, quantitative evaluation of the interface performance and process closed-loop optimization are realized, and the interface bonding strength and service reliability of the composite material can be effectively improved.

This invention relates to a method for locating characteristic defects in cadmium zinc telluride (CZT) samples and a method for preparing CZT samples. The location method includes the following steps: determining the positions of internal feature points on the sample under an infrared transmission microscope; establishing marking features on the sample surface using FIB-SEM; and determining the relative position of the internal feature points projected onto the sample surface by establishing a geometric relationship between the virtual position of the internal feature points projected onto the sample surface and the marking features. The preparation method uses these relative positions to prepare CZT samples. The location method of this invention can simply and effectively establish the positional relationship between internal feature points and surface features, accurately locating internal defect features in CZT samples. This allows for convenient and rapid determination of the specific location for preparing transmission electron microscopy (TEM) samples, thus improving the quality of TEM samples.

This invention provides a rapid preparation method for steel samples for transmission electron microscopy (TEM), relating to the field of physical analysis of steel materials. It is applied to the preparation of various steel samples, including heat-sensitive steels, using a composite binder of cellulose acetate, acetone, silica, and alumina. The binder is used to adhere one side of a wire-cut steel sample sheet to the sheet fixing surface of a grinding aid. A grinding aid area, parallel to the bottom surface of the sheet fixing surface, is provided on the grinding aid device. The grinding aid area is pressed, and sandpaper with progressively increasing grit is used to grind one side until a first preset thickness is reached. Then, the other side is switched, and sandpaper with progressively increasing grit is used to grind the second side until a second preset thickness is reached. The ground sheet is removed, thinned, punched, and electropolished to obtain the target steel sample. This invention can rapidly prepare steel sample sheets with a thickness of 30-50 µm, and the method is simple and has a high success rate.

A method for analyzing a sample using an electron microscope includes: generating ions, molecules, or other particles, such as droplets, from a target sample; introducing the ions, molecules, or other particles into a vacuum cavity of a transmission electron microscope (TEM) in a direction intersecting the path of a pulsed electron beam; recording an electron diffraction pattern associated with the ions through which the pulse passes at each pulse of the electron beam; and calculating the three-dimensional (3D) structure of the ion species based on the recorded electron diffraction pattern.

The invention belongs to the technical field of reliability analysis of devices, and particularly relates to a quantitative analysis method for migration characteristics of an indium component in an epitaxial wafer. Comprising the following steps: providing epitaxial wafers with consistent initial characteristics, and carrying out uniform cleavage; taking one small block as a reference sample, and performing external disturbance treatment on other small blocks; the method comprises the following steps: respectively carrying out non-destructive structure characterization treatment on a reference sample and a sample subjected to external disturbance treatment, including high-resolution X-ray diffraction test, photoluminescence and cathode fluorescence combined test and time-resolved photoluminescence spectrum measurement; comprising high-resolution transmission electron microscope and EDS energy spectrum combined imaging and secondary ion mass spectrum; finally, FP lasers are prepared respectively, and electrical characterization processing is carried out. And quantitatively analyzing the influence of indium component migration on the electrical properties of the FP laser according to the result. The method has the advantages that the migration of indium atoms is analyzed according to a method for changing the microstructure in the quantum well and changing the dynamic behavior of a carrier.

The present application provides a kind of negative electrode for reducing the initial resistance of non-aqueous electrolyte secondary battery and achieving the improvement of durability.The negative electrode for non-aqueous electrolyte secondary battery disclosed herein has a negative electrode current collector and a negative electrode active material layer formed on the negative electrode current collector, and the negative electrode active material layer at least contains a first negative electrode active material and a second negative electrode active material.The first negative electrode active material is composed of agglomerates of flaky graphite coated with low-crystallinity carbon on at least part of the surface, and the interlayer distance of graphite of the low-crystallinity carbon based on the electron diffraction image obtained by transmission electron microscopy is 0.3375 nm.The second negative electrode active material is natural graphite or artificial graphite with an interlayer distance of graphite based on the electron diffraction image obtained by transmission electron microscopy of 0.3375 nm.Here, the mass ratio of the first negative electrode active material to the second negative electrode active material is 50:50 to 90:10.

The invention discloses a large-view-field and high-temporal-spatial-resolution transmission electron microscope in-situ imaging method for a microcosmic electrochemical process, which comprises the following steps: step 1, loading an electrode material particle sample to be detected on a carrying table, inserting the sample into a transmission electron microscope vacuum lens cone along with a sample rod, identifying a target sample under low magnification, and carrying out basic adjustment on an electron microscope; 2, adjusting magnification times to ensure that an observation area is completely incorporated into an imaging view field, selecting an imaging mode, eliminating astigmatism, and adjusting the focal length of an objective lens until a sample particle image interface is clear; and step 3, selecting a CCD camera, setting an acquisition frame rate, and performing ultrafast acquisition of images or videos. The transmission electron microscope in-situ imaging technology giving consideration to both the large view field and the high space-time resolution has practical application value in research of the electrochemical reaction kinetics process of the granular material.

The invention discloses a construction method of a COL4A5-K229X point mutation X-linked Alport syndrome mouse model. The construction method comprises the following steps: aiming at c.685Agt of a No.12 exon of a mouse COL4A5 gene; carrying out T point mutation, and designing and preparing Cas9 mRNA, gRNA and a donor vector; the components are mixed and then microinjected into fertilized eggs of a C57BL / 6J mouse to obtain an F0-generation mouse; identifying the genotype through PCR (Polymerase Chain Reaction) amplification and Sanger sequencing, and screening positive mice; mating the positive F0-generation mice with the wild-type mice, and breeding F1-generation and subsequent generations; the phenotype of the model is further verified through qPCR, biochemical analysis, light microscopic examination, transmission electron microscope and immunofluorescence. The model constructed by the invention shows hematuria, proteinuria, azemia, podocyte loss and irregular thickening and layering of glomerular basement membrane, is consistent with phenotypes of human XLAS patients, and provides an animal model tool for analyzing pathogenesis and developing treatment strategies.

The present application relates to the field of transmission electron microscopy characterization of two-dimensional material structure, and particularly to a method for efficiently obtaining cross-section characteristic crystal orientation of two-dimensional material, which is suitable for two-dimensional van der Waals layered material and two-dimensional non-layered material. A focused ion beam microscope (FIB) is used to sample in the direction perpendicular to (or parallel to) the long straight edge of the two-dimensional material edge, and the two-dimensional material sampling direction is parallel to the half-moon-shaped carrier net string length direction for welding, so as to prepare a cross-section sample capable of reflecting atomic layer stacking sequence; the half-moon-shaped carrier net string length direction is placed perpendicular to the TEM sample rod axial direction, and then small-angle tilting is performed to quickly realize sample crystallographic orientation. The present application lays a foundation for efficiently analyzing crystallographic information such as crystal structure, stacking defects and surface reconstruction of the material by observing the cross-section sample of the two-dimensional material.

The invention provides a coenzyme Q10 nano-liposome capable of being endocytosed by brain neurons as well as a preparation method and application of the coenzyme Q10 nano-liposome, and belongs to the technical field of biological medicines. According to the coenzyme Q10 nano-liposome and the preparation method thereof, polycarbonate filter membranes of 220 nm, 100 nm and 50 nm are adopted to sequentially extrude a solution, the coenzyme Q10 nano-liposome which has the particle size range of 30-50 nm, is not prone to melt collapse and can be endocytosed by neurons is prepared, and the preparation method is simple and efficient. According to the invention, nano-liposomes simultaneously wrapping 5nm gold and coenzyme Q10 are further prepared, distribution of the nano-liposomes can be traced through a transmission electron microscope, and whether the drug coenzyme Q10 enters extracellular gaps of brain cells and whether the drug coenzyme Q10 is endocytosed into neurons or not is verified. The coenzyme Q10 nano-liposome disclosed by the invention can penetrate through a blood brain barrier, enter extracellular gaps and are endocytosed by neurons to eliminate formaldehyde accumulated in the brain, so that a foundation is provided for research and development of drugs for brain diseases such as Alzheimer's disease.

This invention discloses a method for preparing amorphous Cu-MOFs and their applications, relating to the field of metal-organic framework materials technology. The key technical points are: CuCl2 is used as the copper source and 4,4′-bipyridine as the ligand, and Cu-MOFs are synthesized via a solvothermal method. Transmission electron microscopy shows that the obtained material exhibits a typical micron-scale sheet-like morphology. After etching with ammonia, the sample morphology transforms into rough-surfaced nanospheres with a significantly increased pore size, indicating a local rearrangement of its framework structure. X-ray diffraction analysis shows that the original Cu-MOF has high crystallinity, while the diffraction peaks of the etched aCu-MOF essentially disappear, exhibiting amorphous characteristics. As a signal conversion element in a colorimetric sensor, aCu-MOF can achieve reliable detection of ampicillin under neutral conditions. Using thiram as a cofactor, a highly selective thiram colorimetric sensing system can be constructed.

An electron microscope system including a sample holder, a shared camera, a correlative light electron microscope (CLEM), a focused ion beam scanning electron microscope (FIB-SEM), and a transmission electron microscope (TEM). The CLEM includes a CLEM electron source to generate a first electron beam towards a sample and cause a first scattered beam for capture by the shared camera, and a light source configured to cause at least a portion of the sample to fluoresce for capture by the shared camera. The FIB-SEM includes a SEM electron source and a plasma source, the plasma source configured to generate an ion beam to mill the sample while supported by the sample holder. The TEM includes a TEM electron source to generate an electron beam towards the sample on the sample holder and cause a scattered beam for capture by the shared camera as a diffraction pattern.

Herein is reported a method for determining the amount or / and ratio of filled recombinant virus particles, such as recombinant adeno-associated virus particles (rAAVps), compared to empty and partially filled viral particles in a sample using transmission electron microscopy (TEM) with an EM grid without chemical staining, wherein the method comprises the step of drying the sample, preferably air-drying the sample, on the EM grid.

The application discloses a kind of measurement methods of interfacial exchange current density, belong to electrochemical test field.The method for realizing of the present application is: using self-built three-electrode single particle electrochemical test system to measure the electrochemical impedance spectroscopy of multiple micron scale particles, obtain the current density of multiple single crystal particles;X-ray diffraction technique is used to obtain material crystal structure information;Using high-resolution transmission electron microscopy to measure the crystal face type of any exposed surface of single particle;The three-dimensional reconstruction of single crystal particle is carried out to obtain the geometric information of particle;Through crystal structure information, the crystal face type information of exposed surface and the angle information between each exposed surface, the crystal face type of all exposed surfaces is calibrated;According to the crystal face type of all exposed surfaces of multiple particles, the area of corresponding exposed surface and the current density of particle, the exchange current density of different crystal faces of crystal material is calculated.The present application can be used for the measurement of micron scale crystal material crystal face exchange current density, quantitative analysis of the electrochemical activity of material.

The application discloses a preparation method and application of an r-MIL-88A / OV-BiOBr photo-Fenton catalyst rich in oxygen vacancies. The photo-Fenton catalyst rich in oxygen vacancies is characterized in that, as shown by transmission electron microscopy and scanning electron microscopy, the morphology of an optimal ratio catalyst OV-BM-25 is that a certain amount of OV-BiOBr flower balls are attached to the surface of the r-MIL-88A rod-shaped structure. Under the irradiation of a low-power white light-emitting diode (LED), the optimal ratio catalyst OV-BM-25 prepared exhibits good photo-Fenton degradation activity, and can degrade and convert organic pollutants in pharmaceutical wastewater containing chloroquine phosphate and the like into non-toxic or low-toxic substances. The photo-Fenton catalyst preparation method provided by the application is simple, has high photo-catalytic efficiency, good mineralization effect, good stability, reusability and the like, has a good application prospect, and is easy to prepare on a large scale.

A separator for alkaline hydrolysis comprising a porous layer, the porous layer comprising inorganic particles, characterized in that the inorganic particles have a fraction of primary particles having a diameter above 100 nm of lower than 3% by number, as measured by Transmission Electron Microscopy (TEM).

The application provides a preparation method of a transmission electron microscope sample, which comprises the following steps: forming at least two layers of stacked ion beam protective layers on a target layer, each layer of the ion beam protective layers comprising a first protective layer and a second protective layer made of different materials; etching at least one layer of the ion beam protective layers by using a focused ion beam; and judging whether the etching angle of the focused ion beam is a preset etching angle according to the etching image of the surface of the etched ion beam protective layer. Since the contrast of the images of the first protective layer and the second protective layer is also different, the etching angle of the focused ion beam can be judged according to the contrast of the etching image, and when the etching angle does not conform to the preset etching angle, the etching angle of the focused ion beam can be adjusted according to the judgment result in time, so that the observation target unit is prevented from being damaged or deformed, the information integrity of the transmission electron microscope sample is ensured, and the success rate of the sample preparation of the transmission electron microscope sample is improved.

This invention provides an in-situ heating and electrical testing apparatus and method for scanning electron microscopy (SEM). The apparatus includes a T-shaped sample stage, an in-situ heating and electrical testing chip, a probe card, wires, a vacuum flange with a BNC interface, a signal source meter, pins, and fixing studs. The in-situ heating and electrical testing chip is placed on the T-shaped sample. The probe card presses into contact with the heating and testing electrodes on the in-situ heating and electrical testing chip and leads out wires, simultaneously fixing the chip. The fixing studs secure the probe card to the T-shaped sample stage. The vacuum flange with the BNC interface connects the probe card and the signal source meter via wires. This invention provides in-situ heating, electrical testing, and microstructure observation functions for SEM, offering advantages such as rapid heating and cooling, low thermal drift, and low electromagnetic interference. It provides a platform for testing the performance of micro and nanomaterials and an experimental platform for preliminary screening of transmission electron microscopy (TEM) samples.

A method for fast laser heating and cooling for nano / micro diamond is provided. The method includes performing laser irradiation and thermal dissipation on a reduced graphene oxide (rGO) sample. The rGO sample is dispersed on transmission electron microscopy (TEM) copper grids and nanodiamonds containing nitrogen-vacancy (NV) centers are dispersed on the rGO sample. The rGO sample is placed in a vacuum chamber and NV spins are polarized and read out by green laser. Further, the spin states of NV spins are manipulated by microwave. The polarizing and reading out are conducted at room temperature, while the manipulating spin states is conducted at high temperatures. The heating and cooling rates are significantly improved using reduced graphene oxide as the laser absorber and heat drain, enabling coherent quantum operation at temperatures up to 1400 Kelvin, surpassing the Curie temperatures of all known magnetic materials.

A method for preparing a porous carbon membrane transmission electron microscopy grid using a soft template having a porous array structure. The method comprises the following steps: transferring a soft template having a porous array structure onto a grid surface of a transmission electron microscopy grid, depositing a carbon membrane on the surface of the transmission electron microscopy grid, and removing the soft template to obtain a carbon membrane transmission electron microscopy grid having a porous array structure. The preparation method is simple and practical, highly reproducible, and broadly applicable. The obtained carbon membrane transmission electron microscopy grid exhibits an excellent grid structure quality, has the potential for batch preparation, and can also be directly used for the preparation of a graphene electron microscopy grid meeting transmission electron microscopy sample preparation requirements; and the latter can be applied to single-particle cryo-electron microscopy three-dimensional structural analysis and high-resolution imaging of nanoparticles and single atoms.

This invention provides a method for preparing transmission electron microscopy (TEM) samples suitable for in-situ compression experiments. The method involves mechanically thinning the sample for in-situ compression experiments and cutting it into a special convex shape. This convex shape is then attached to half a molybdenum ring and placed in an ion thinner to achieve direct thinning of the sample edges. Furthermore, this invention departs from the traditional dual-gun mode, employing a single-gun mode for ion thinning. This overcomes the interference of sputtering phenomena present in the dual-gun mode and results in a larger and more uniform thin area. This method is also applicable to the preparation of TEM samples from biomineralized materials. Biomineralized materials are fragile; this invention avoids the disadvantages of traditional thinning methods, conveniently preparing TEM samples with larger thin areas and better quality by directly thinning at the sample edges. This method has significant reference value for the preparation of TEM samples for in-situ compression experiments.

Electrode catalyst layer for a fuel cell, comprising: a catalyst support material (30) with a catalyst support (32) and a catalyst metal (36) supported on the catalyst support (32); and an ionomer (38) that partially covers the catalyst support material (30). The ionomer coverage is not less than 25% and not more than 50%, wherein the ionomer coverage is the ratio of the surface area covered by the ionomer (38) to the surface area of ​​the catalyst support (32), obtained by three-dimensional transmission electron microscopy.

A transmission electron microscope is provided for imaging a sample. The microscope has a stage to hold a sample and an electron beam column to direct an electron beam onto a field of view on the sample. The electron beam column includes an electron beam source to generate an electron beam, and electron beam optics to converge the electron beam onto a field of view on the sample. The microscope also has a beam scanner to scan the electron beam across multiple fields of view on the sample. The microscope additionally has a detector to detect radiation emanating from the sample to generate an image. A controller is provided to analyze the detected radiation to generate an image of the sample.

The present disclosure relates to a method for manufacturing a transmission electron microscope grid oxide sample and a structure thereof. The method comprises the following steps: providing a sample; selecting a detection area on the sample; exposing an active area; and exposing a single row of active areas. The present disclosure removes the peripheral part of the initial protective layer of the sample along the length direction of the detection area, removes part of the sample along the arrangement direction of the active area on the sample, and exposes the active area on the sample. By adjusting the angle of the sample relative to the electron beam emitted by the transmission electron microscope, for example, rotating the machine table of the transmission electron microscope to the same angle as the angle between the length direction of the detection area and the length direction of the wire on the sample, the electron beam can be perpendicular to the length direction of the wire on the sample or perpendicular to the arrangement direction of the active area on the sample. The purpose of having a cross section along the arrangement direction of the active area and a cross section along the length direction of the wire on the same sample is achieved, and different angle detection is realized by single sample preparation.

A sample carrier storage rack for continuous sectioning transmission electron microscopy imaging. Carrier base frame units (9) for loading sample carriers (3) are stacked into a tower structure, each carrier base frame unit (9) is provided with a base portion, a central hole (11) is provided in the center of the base portion, the base portion extends centrally symmetrically in a radial outward direction from the central hole (11) to form a plurality of fins, each fin is formed by means of connection and enclosure of an outer peripheral side surface of the central hole (11) and an inner side surface of a side ridge extending radially from the fin, a loading slot (15) for loading the sample carrier (3) is provided on the outer peripheral surface of each fin, and a plurality of stations for placement of sample sections are provided on each sample carrier (3). The problems of an excessively large volume of the sample carrier storage rack and a small number of samples loaded per loading cycle of an automatic sample loading device under the condition of the same number of samples are solved, the space volume of the sample carrier storage rack is reduced while the throughput is increased, and the sample carrier storage rack has the characteristics of flexible operation and cost saving, and is suitable for popularization and application.

The invention relates to a construction method and application of a mitochondrial micro-autophagy animal model, and belongs to the technical field of radiation biology and cell biology. The model can stably induce repeatable mitochondrial micro-autophagy reaction in a plurality of high-sensitivity tissues such as parotid gland, mandibular gland, heart, thymus gland and the like of an experimental animal or a cell line through microwave radiation exposure with set specific parameters. A transmission electron microscope observation shows that after radiation, a plurality of lysosome-like small bodies appear in a mitochondrial membrane in the tissue, a typical inclusion structure is formed, and an ultrastructure characteristic of mitochondrial micro-autophagy is achieved; molecular level detection results show that the expression of a micro-autophagy characteristic signal molecule MIEAP is significantly up-regulated, and activation of a micro-autophagy signal channel and occurrence of micro-autophagy are further verified.

The invention relates to an improved purification environment and pure bacterium source extracellular vesicle method, and relates to the technical field of biology, the method comprises the following steps: S1, obtaining a first crude extraction extracellular vesicle sample, carrying out exploratory multi-layer density gradient ultracentrifugation on the first sample, and carrying out characterization analysis on each centrifuged component, to determine an enrichment zone of extracellular vesicles; and S2, obtaining an extracellular vesicle sample of a second crude extraction homologous with the extracellular vesicle sample of the first crude extraction, constructing an optimized simplified density gradient according to the enrichment regions determined in the step S1, and carrying out optimized simplified density gradient ultracentrifugation on the second sample to collect and purify the extracellular vesicles. According to the method disclosed by the invention, a standardized scheme is established for a specific sample through two steps of exploratory purification and purification after optimization, and enrichment regions of the extracellular vesicles are determined by adopting an identification method combining a transmission electron microscope and nanoflow cytometry, so that the repeatability of a purification result is improved.

An electrode catalyst layer for a fuel cell, including: a catalyst supporting material having a catalyst support, and a catalyst metal supported on the catalyst support; and an ionomer partially covering the catalyst supporting material. An ionomer coverage is not less than 25% and not more than 50%, the ionomer coverage being a ratio of a surface area covered by the ionomer relative to a surface area of the catalyst support obtained by three-dimensional transmission electron microscopy.