Semiconductor chip assembly with post/base/post heat spreader and asymmetric posts

Abstract

A semiconductor chip assembly includes a semiconductor device, a heat spreader, a conductive trace and first and second adhesives. The heat spreader includes a first post, a second post and a base. The conductive trace includes a pad and a terminal. The semiconductor device is electrically connected to the conductive trace and thermally connected to the heat spreader. The first post extends from the base in a first vertical direction into a first opening in the first adhesive and is located within a periphery of the second post, the second post extends from the base in a second vertical direction into a second opening in the second adhesive and the base is sandwiched between and extends laterally from the posts. The conductive trace provides signal routing between the pad and the terminal.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application is a continuation-in-part of U.S. application Ser. No. 12 / 616,773 filed Nov. 11, 2009 and a continuation-in-part of U.S. application Ser. No. 12 / 616,775 filed Nov. 11, 2009, each of which is incorporated by reference. This application also claims the benefit of U.S. Provisional Application Ser. No. 61 / 410,932 filed Nov. 7, 2010 and U.S. Provisional Application Ser. No. 61 / 350,923 filed Jun. 3, 2010, each of which is incorporated by reference.[0002]U.S. application Ser. No. 12 / 616,773 filed Nov. 11, 2009 and U.S. application Ser. No. 12 / 616,775 filed Nov. 11, 2009 are each a continuation-in-part of U.S. application Ser. No. 12 / 557,540 filed Sep. 11, 2009 and a continuation-in-part of U.S. application Ser. No. 12 / 557,541 filed Sep. 11, 2009.[0003]U.S. application Ser. No. 12 / 557,540 filed Sep. 11, 2009 and U.S. application Ser. No. 12 / 557,541 filed Sep. 11, 2009 are each a continuation-in-part of U.S. application Ser. No. 1...

AI Technical Summary

Benefits of technology

[0091]The present invention has numerous advantages. The heat spreader can provide excellent heat spreading and heat dissipation without heat flow through the adhesives. As a result, the adhesives can be a low cost dielectric with low thermal conductivity and not prone to delamination. The posts and the base can be integral with one another, thereby enhancing reliability. The first post can provide thermal expansion matching with a semiconductor device mounted thereon, thereby increasing reliability. The first cap can be customized for the semiconductor device, thereby enhancing the thermal connection. The first adhesive can be sandwiched between the base and the pad and the second adhesive can be sandwiched between the base and the terminal, thereby providing a robust mechanical bond between the heat spreader and the conductive trace. The conductive trace can provide signal routing with simple circuitry patterns or flexible multi-layer signal routing with complex circuitry patterns. The conductive trace can also provide vertical signal routing between the pad and the terminal. The electrical interconnect can be a plated through-hole formed after the adhesives are solidified and remain a hollow tube or be split at a peripheral edge of the assembly. As a result, a solder joint subsequently reflowed on the terminal can wet and flow into the plated through-hole without creating a buried void in the solder joint beneath the plated through-hole that might otherwise occur if the plated through-hole is filled with the adhesives or another non-wettable insulator, thereby increasing reliability. The base can provide mechanical support for the conductive layers and the adhesives, thereby preventing warping. The assembly can be manufactured using low temperature processes which reduces stress and improves reliability. The assembly can also be manufactured using well-controlled processes which can be easily implemented by circuit board, lead frame and tape manufacturers.

Problems solved by technology

Semiconductor devices are susceptible to performance degradation as well as short life span and immediate failure at high operating temperatures.

The heat not only degrades the chip, but also imposes thermal stress on the chip and surrounding elements due to thermal expansion mismatch.

LEDs include high power chips that generate high light output and considerable heat.

Unfortunately, LEDs exhibit color shifts and low light output as well as short lifetimes and immediate failure at high operating temperatures.

Furthermore, LED light output and reliability are constrained by heat dissipation limits.

However, since the plastic and the dielectric layer typically have low thermal conductivity, the PBGA provides poor heat dissipation.

However, since the lead frame type interposer has limited routing capability, the QFN package cannot accommodate high input / output (I / O) chips or passive elements.

However, manually dropping the heat slug into the central opening is prohibitively cumbersome and expensive for high volume manufacture.

Furthermore, since the heat slug is difficult to accurately position in the central opening due to tight lateral placement tolerance, voids and inconsistent bond lines arise between the substrate and the heat slug.

The substrate is therefore partially attached to the heat slug, fragile due to inadequate support by the heat slug and prone to delamination.

The heat slug is therefore non-planar and difficult to bond to.

As a result, the assembly suffers from high yield loss, poor reliability and excessive cost.

However, the insulating layer sandwiched between the metal core layer and the PCB limits the heat flow to the PCB.

As a result, the heat spreader releases the heat by thermal convection rather than thermal conduction which severely limits the heat dissipation.

Consequently, the substrate is unbalanced and wobbles and warps during manufacture.

This creates enormous difficulties with chip mounting, wire bonding and encapsulant molding.

Furthermore, the expanded base may be bent by the encapsulant molding and may impede soldering the package to the next level assembly as the solder balls collapse.

As a result, the package suffers from high yield loss, poor reliability and excessive cost.

However, the electrical contacts are difficult to mount on the insulating layer, difficult to electrically connect to the next level assembly and fail to provide multi-layer routing.

Conventional packages and thermal boards thus have major deficiencies.

For instance, dielectrics with low thermal conductivity such as epoxy limit heat dissipation, whereas dielectrics with higher thermal conductivity such as epoxy filled with ceramic or silicon carbide have low adhesion and are prohibitively expensive for high volume manufacture.

The dielectric may delaminate during manufacture or prematurely during operation due to the heat.

The substrate may have single layer circuitry with limited routing capability or multi-layer circuitry with thick dielectric layers which reduce heat dissipation.

The heat spreader may be inefficient, cumbersome or difficult to thermally connect to the next level assembly.

The manufacturing process may be unsuitable for low cost, high volume manufacture.

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