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A kind of ingot crucible film and preparation method thereof

A technology of crucible and film, which is applied in chemical instruments and methods, self-solidification, electrophoretic plating, etc., to achieve high conversion efficiency, improve purity, and improve yield

Active Publication Date: 2021-03-23
CHANGZHOU UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the ingot crucible is still a one-time consumable in the production process

Method used

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  • A kind of ingot crucible film and preparation method thereof
  • A kind of ingot crucible film and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] Electrophoretic Deposition of Silicon Dioxide Thin Film Containing Al Powder on the Upper Layer

[0026] The specific solution components are ultrapure water, silica sol, high-purity silica, and Al powder. The preparation of the slurry is as follows: ultrapure water, silica sol, high-purity silica (purity is 99.999%, particle diameter is 10 μm-20 μm), and Al powder are weighed in a weight ratio of 100:1:5:0.1, Put the ultrapure water, silica sol, and Al powder into the mixer and stir evenly for 30 minutes to form a stable suspension, then add high-purity silica particles and stir evenly for 30 minutes, then let it stand for later use.

[0027] When performing electrophoretic deposition of thin films, the reference process parameters are as follows: the working voltage is 10-20V, the working current is 4-5A, the solution temperature is 80°C, and the time is 30min.

[0028] The prepared crucible film, the upper layer of the film is the consistent arrangement of crystall...

Embodiment 2

[0036] Electrophoretic Deposition of Silicon Dioxide Film Containing Ni Powder on the Upper Layer

[0037] The specific solution components are ultrapure water, silica sol, silica powder, and Ni powder. The preparation of the slurry is as follows: After the ultrapure water, silica sol, silica powder (particle diameter is 10 μm-20 μm), and Ni powder are weighed in a weight ratio of 100:1:5:0.1, the ultrapure water, silica sol 1. Put the Ni powder into the mixer and stir evenly for 30 minutes to form a stable suspension, then add silicon powder (particle diameter is 10 μm-20 μm) and stir evenly for 30 minutes, then let it stand for later use.

[0038] When performing electrophoretic deposition of thin films, the reference process parameters are as follows: the working voltage is 10-20V, the working current is 4-5A, the solution temperature is 80°C, and the time is 30min.

[0039] The prepared crucible film has a silicon powder particle film thickness of 100 μm on the upper laye...

Embodiment 3

[0047] Electrophoretic Deposition of Upper Silicon Dioxide Film

[0048] The specific solution components are ultrapure water, silica sol, and high-purity silica. The preparation of the slurry is as follows: Ultrapure water, silica sol, and high-purity silica (purity 99.999%, particle diameter 10 μm-20 μm) are weighed in a weight ratio of 100:1:5, and the ultrapure water 1. Put the silica sol into a stirrer and stir evenly for 30 minutes to form a stable suspension, then add high-purity silica particles and stir evenly for 30 minutes, then let it stand for later use.

[0049] When performing electrophoretic deposition of thin films, the reference process parameters are as follows: the working voltage is 10-20V, the working current is 4-5A, the solution temperature is 80°C, and the time is 30min.

[0050] The prepared crucible film, the upper layer of the film is dense silicon dioxide particle film with a thickness of 100 μm, the middle layer of the film is a carbon fiber stru...

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Abstract

The invention belongs to the technical field of silicon wafer preparation for crystalline silicon solar cells, and particularly relates to a novel ingot casting crucible sticking film and a preparation method thereof. An existing crucible inside surface costing process is replaced with the process of sticking a film to the inner wall surface of an existing ingot casting crucible. The type of filmspasted on the inner wall of the crucible can be selected according to the ingot casting requirements multiply, and the films of which the silicon lattice constant is larger 50% than the mismatch degree can be pasted on the side wall of the crucible; and the films of which the silicon lattice constant is smaller 10% than the mismatch degree can be pasted on the bottom of the crucible. The lowermost layer of the film is binding agents containing silica gel components, and the middle layer is high purity fiber fabric; the uppermost layer can be silicon nitride, zirconia, silicon oxide and the like. Materials of the uppermost layer of the film can be deposited on the surface of the fiber fabric through electrophoresis, PEVCD and other methods, and the film has the characteristic of crystallographic consistency. According to the novel ingot casting crucible sticking film, through fine preparation, silicon crystal defects can be reduced, and the overall quality of silicon crystal is improved, so that the overall economic benefits of silicon ingots are improved.

Description

technical field [0001] The invention belongs to the technical field of silicon chip preparation for crystalline silicon solar cells, and relates to an ingot crucible film for improving the yield of crystalline silicon ingots and a preparation method thereof, in particular to an ingot crucible film and a preparation method thereof. Background technique [0002] Crystalline silicon solar cells currently dominate the photovoltaic industry. The cost of silicon wafers accounts for more than half of the cost of crystalline silicon solar cells. Therefore, reducing the cost of silicon wafers and improving the quality of silicon wafers are of great significance to the development of the solar energy industry. Reducing the internal defects of silicon wafers, improving the quality of crystalline silicon wafers, and increasing the yield of ingots are carried out as technical research directions for technological improvement. [0003] In the crystalline silicon of traditional polysilico...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C25D13/02C25D13/12C23C16/513C30B11/00C30B29/06
Inventor 袁宁一权祥丁建宁
Owner CHANGZHOU UNIV