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Preparation method of wavelength selective response type photoelectric detector

A photodetector, wavelength-selective technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problem that incident photons cannot selectively identify response signals

Active Publication Date: 2021-04-02
SUZHOU UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention aims to solve the problem that photodetectors in the prior art cannot automatically selectively identify incident photons in the visible-near-infrared range and output response signals

Method used

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  • Preparation method of wavelength selective response type photoelectric detector
  • Preparation method of wavelength selective response type photoelectric detector
  • Preparation method of wavelength selective response type photoelectric detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033]The preparation method of the wavelength selective response of the photodetector, including the following steps:

[0034]1) RCA standardized cleaning of the transparent substrate;

[0035]2) Treatment of ultraviolet-ozone treatment on the substrate after cleaning;

[0036]3) Self-assembly arrangement of polystyrene micro / nanospheres having a raw diameter of 200 to 4000 nm on the quartz glass substrate;

[0037]4) The reactive ion beam etching is carried out to the reactive ion beam etching for the macrosphere array of macroblus, so that the diameter is reduced as 30% to 70% of the original value;

[0038]5) The quartz glass covered with a decreased polystyrene microd / nanosphere array is a substrate, and the electron beam tapipites / gold film, and the thickness is from 0 to 5 nm and 50 to 150 nm, respectively;

[0039]6) Remove the polystyrene micro / nanosphere array to obtain different sizes of nanoporous patterning gold film layer. Different sizes of nanopore patterning gold film deposit...

Embodiment 2

[0052]Method for preparing a photodetector of wavelength selective response compared to an example,

[0053]Replace step 5): quartz glass covered with a decreased polystyrene microd / nanosphere array, using electron beam touched chrome / silver (or chromium / aluminum) film, thickness is 0 ~ 5 nm, respectively, and 50 ~ 150 nm.

[0054]Replace step 7): quartz glass covered with a nanoporous patterned metal film is a substrate, using a common evaporation method or a plasma reaction method to deposit a P-type (or sedimentary n-type) in the nanopore pattern. P-type) amorphous, microcrystalline silicon, Cu (in, ga) SE2Cuinse2Cuinte2Aginse2Or agalte2film. By regulating the doping concentration of the semiconductor material directly in contact with the nanopore pattern metal film layer, the p-type semiconductor film forms a Schottky contact with silver (or aluminum); when deposited by N, P-type semiconductor film, nanohole pattern The silver (or aluminum) film forms ohmic contact with the n-ty...

Embodiment 3

[0056]Method for preparing a photodetector of wavelength selective response compared to an example,

[0057]The photosensitive semiconductor material layer is not a substrate that is substrate in a nanoporous pattern of a metal film layer, but directly adopts the growth of N-type or PN junction silicon, germanium, gallium arsenide, indium gallium arsenic or phosphorus. The indium sub-wafer is a photosensitive layer. The main process of prepared includes:

[0058]1) Directly employ the front side of the N-type or PN junction semiconductor single wafer and a nanoporous pattern of quartz glass as a substrate [Preparation steps to 1) to step 1) to step 6)] Close fit. By simulation, the transmission spectrum of quartz glass covered by the metal film layer through the nanohole is likeFigure 6 As shown (at this time, the corresponding nanopore period is 550 nm, the diameter is 280 nm, the thickness is 100 nm, and the light is exposed in the exposed glass surface).

[0059]2) In the back surface of ...

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Abstract

The invention belongs to the field of photoelectric devices, and discloses a preparation method of a wavelength selective response type photoelectric detector. A nanopore patterned metal film layer, aphotosensitive semiconductor material layer, a compact metal film layer and an insulating protective layer are sequentially arranged on a transparent substrate, and two lead ends are led out of the nanopore patterned metal film layer and the compact metal film layer respectively; and the nanopore patterned metal film layer and the compact metal film layer form a Fabry-Perot resonant cavity. Due to the fact that the nanopores are of a symmetrical array structure, the nanopores have the characteristic of not remarkably depending on the polarization angle of incident photons, then the photoelectric detector can achieve polarization-insensitive wavelength selective response, the Fabry-Perot resonant cavity enables target photons to be subjected to optical resonance in the photosensitive semiconductor material layer. And the absorptivity of the photosensitive semiconductor material layer to target photons is enhanced.

Description

Technical field[0001]The present invention belongs to the field of photoelectric devices, and is related to a preparation method of photoders having a selective response in the range of visible-near infrared wave bands, and more particularly to spectral regulation techniques in the range of narrowband band.Background technique[0002]The transparent conductive layer is a high light transmittance of a photon in the range of a certain wave section, and has a film layer having a good conductivity. The transparent conductive layer is widely used as the front electrode of the solar cell, photoelectric detector, light emitting diode, photocatalytic and other optoelectronic devices. Typically, the ideal transparent conductive layer requires high transparency (ie, light transmittance) and high conductivity (i.e., block resistance) in as wide as possible. At present, there are mainly two types of transparent conductive materials, one is a metal-doped wide-binding semiconductor film, such as an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0224H01L31/108H01L31/102H01L31/18B82Y30/00B82Y40/00
CPCH01L31/022408H01L31/108H01L31/102H01L31/18B82Y30/00B82Y40/00Y02P70/50
Inventor 吴绍龙詹纯王冬唤
Owner SUZHOU UNIV