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Preparation method of AlN/ZnO/InGaN/diamond/Si multilayer-structure surface acoustic wave filter

A technology of surface acoustic wave filtering and multi-layer structure, which is applied in the direction of metal material coating process, coating, electrical components, etc., can solve the problems of increasing non-radiative recombination centers, no piezoelectricity, low surface roughness, etc. Achieve the effect of good uniformity, high electromechanical coupling coefficient and low loss

Active Publication Date: 2013-04-03
SHENYANG INST OF ENG +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But diamond is not a piezoelectric material, it does not have piezoelectricity itself, and cannot excite and receive surface waves. It is necessary to deposit a layer of piezoelectric film on its surface to make a multi-layer thin-film SAW filter. Therefore, how to use high-sonic material diamond The key issue of current research is to deposit piezoelectric films with high c-axis orientation, low surface roughness and high resistance so that they can be applied to the multi-layer film system of high-frequency SAW filters.
[0004] AlN is an electrical insulator with good dielectric properties, high sound propagation rate, low transmission loss, good chemical stability, good permeability and small absorption in the short infrared band to long infrared band, and excellent high temperature oxidation resistance. However, due to the high lattice fit between the diamond film substrate and the AlN material, such a large lattice fit causes a high dislocation density, which will make the surface acoustic wave filter device The increase of non-radiative recombination centers limits the further improvement of its internal quantum efficiency, which is not conducive to the transmission of sound waves. Therefore, how to integrate high-quality AlN piezoelectric films that meet the requirements of SAW devices into diamond films has become a key technical problem to be solved urgently.

Method used

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  • Preparation method of AlN/ZnO/InGaN/diamond/Si multilayer-structure surface acoustic wave filter
  • Preparation method of AlN/ZnO/InGaN/diamond/Si multilayer-structure surface acoustic wave filter
  • Preparation method of AlN/ZnO/InGaN/diamond/Si multilayer-structure surface acoustic wave filter

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Embodiment 1

[0024] The Si substrate was ultrasonically cleaned with acetone, ethanol and deionized water, dried with nitrogen and sent to the hot-wire chemical vapor deposition reaction chamber, and the reaction chamber was evacuated to 9.0×10 -4 After Pa, heat the Si substrate to 500°C, and pass CH with a flow rate of 1.6 sccm into the reaction chamber 4 And H with a flow rate of 200sccm 2 , Control the microwave power to 650W, and deposit a 100nm thick diamond film on the Si substrate;

[0025] Rinse the above-mentioned diamond / Si substrate with deionized water, send it to the metal organic compound chemical vapor deposition reaction chamber, heat the diamond / Si substrate to 300°C, control the equipment with a microwave power of 650W, and flow into the reaction chamber respectively 0.6sccm of trimethylindium, 0.3sccm of trimethylgallium, and 100sccm of nitrogen, deposit an InGaN film with a thickness of 20nm on a diamond / Si substrate;

[0026] Then, argon and oxygen carrying diethylzinc were...

Embodiment 2

[0029] The Si substrate was ultrasonically cleaned with acetone, ethanol and deionized water, dried with nitrogen and sent to the hot-wire chemical vapor deposition reaction chamber, and the reaction chamber was evacuated to 9.0×10 -4 After Pa, heat the Si substrate to 500°C, and pass CH with a flow rate of 1.6 sccm into the reaction chamber 4 And H with a flow rate of 200sccm 2 , Control the microwave power to 650W, deposit a 200nm thick diamond film on the Si substrate;

[0030] Rinse the above-mentioned diamond / Si substrate with deionized water, send it to the metal organic compound chemical vapor deposition equipment, heat the diamond / Si substrate to 400℃, control the microwave power of the equipment to 650W, and pass the flow rate into the reaction chamber respectively. 1.0sccm of trimethylindium, 0.5sccm of trimethylgallium, and 100sccm of nitrogen, deposit an InGaN film with a thickness of 30nm on a diamond / Si substrate;

[0031] Then, argon and oxygen carrying diethylzinc a...

Embodiment 3

[0034] The Si substrate was ultrasonically cleaned with acetone, ethanol and deionized water, dried with nitrogen and sent to the hot-wire chemical vapor deposition reaction chamber, and the reaction chamber was evacuated to 9.0×10 -4 After Pa, heat the Si substrate to 500°C, and pass in CH with a flow of 1.6 sccm 4 And H with a flow rate of 200sccm 2 , Control the microwave power to 650W, and deposit a 300nm thick diamond film on the Si substrate;

[0035] Rinse the above-mentioned diamond / Si substrate with deionized water, send it to the metal organic compound chemical vapor deposition equipment, heat the diamond / Si substrate to 600℃, control the microwave power of the equipment at 650W, and pass the flow rate into the reaction chamber respectively. 2.0sccm of trimethylindium, 1.0sccm of trimethylgallium, and 150sccm of nitrogen, deposit an InGaN film with a thickness of 100nm on a diamond / Si substrate;

[0036] Then, argon and oxygen carrying diethylzinc are introduced into the ...

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Abstract

The invention belongs to the field of piezoelectric film materials, and particularly relates to a preparation method of an AlN / ZnO / InGaN / diamond / Si multilayer-structure surface acoustic wave filter. The method comprises the following steps: cleaning an Si substrate, sending the Si substrate into a hot-wire chemical vapor deposition reaction chamber, depositing a diamond film with the thickness of 100-300nm on the Si substrate, sending the substrate into a metal organic compound chemical vapor deposition reaction chamber, introducing trimethyl indium, trimethyl gallium and nitrogen gas into the reaction chamber, depositing an InGaN film with the thickness of 20-100nm on the diamond / Si substrate, simultaneously introducing argon carrying diethyl zinc and oxygen into the reaction chamber, depositing a ZnO film with the thickness of 20-100nm on the InGaN / diamond / Si substrate, and finally, introducing trimethyl aluminum and nitrogen gas into the reaction chamber to obtain the AlN / ZnO / InGaN / diamond / Si multilayer-structure surface acoustic wave filter. In the method, the diamond film is firstly deposited on the Si substrate, and the smooth high-crystallization-degree high-quality AlN nano piezoelectric film with high C-axis preferred orientation is deposited by using nano ZnO and InGaN films with high C-axis preferred orientation as buffer layers.

Description

Technical field [0001] The invention belongs to the field of piezoelectric film materials, and specifically relates to a preparation method of an AlN / ZnO / InGaN / diamond / Si multilayer structure surface acoustic wave filter device. Background technique [0002] A surface acoustic wave filter is a frequency-selective device prepared by using the surface acoustic wave effect and resonance characteristics. It is the most widely used SAW (surface acoustic wave) device, and its function is to allow signals of a certain frequency band to pass , And prevent the signal of other frequency bands from passing, the center frequency of the SAW filter made by the interdigital transducer (IDT) f Is the surface acoustic wave propagation velocity of the material V And IDT electrode period L Decided, namely f = V / L . [0003] As we all know, diamond is the material with the fastest sound propagation speed among all substances, which is higher than 10000m / s. When using it to make 2.5GHz high frequency...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/30H03H9/64
Inventor 赵琰张东王存旭韩希昌尹常永迟新利邓玮赵丹高庆忠王刚张玉燕林盛
Owner SHENYANG INST OF ENG