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Method for growing pure-phase Ga2O3 film on sapphire substrate and solar-blind ultraviolet detector

A sapphire substrate, sapphire technology, applied in semiconductor/solid-state device manufacturing, semiconductor device, sustainable manufacturing/processing and other directions, can solve the problems of difficult to control the growth thickness of the buffer layer, difficult to meet the needs of device research and development, target pollution, etc. To achieve the effect of tight integration, easy operation and stable product performance

Active Publication Date: 2022-03-04
北京铭镓半导体有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, Ga grown based on the above techniques 2 o 3 Thin film materials often contain other crystal forms or distorted structures, so they are all polycrystalline or non-pure phase crystals
[0006] Although a buffer layer α-Fe was inserted between the epitaxial film and the substrate 2 o 3 Afterwards, phase-pure α-Ga can be grown on the base layer of the buffer layer 2 o 3 film, but the growth thickness of the buffer layer is difficult to control, and the growth conditions are different from those of α-Ga 2 o 3 It is not the same, if the growth of the buffer layer is completed in the same reaction chamber at the same time, it will also cause pollution to the target
[0007] Relatively speaking, the direct epitaxial growth of pure phase α-Ga on sapphire substrate 2 o 3 The study of thin films is of great significance to this field, but because α-Ga 2 o 3 It is a thermodynamically metastable phase, which will be transformed into a β-phase crystal under certain conditions, which leads to the successful growth of α-Ga on the current sapphire substrate. 2 o 3 Thin films, but most of them have a mixed phase structure, the purity is very low, and it is difficult to meet the research and development needs of devices

Method used

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  • Method for growing pure-phase Ga2O3 film on sapphire substrate and solar-blind ultraviolet detector
  • Method for growing pure-phase Ga2O3 film on sapphire substrate and solar-blind ultraviolet detector
  • Method for growing pure-phase Ga2O3 film on sapphire substrate and solar-blind ultraviolet detector

Examples

Experimental program
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Effect test

Embodiment 1-9

[0056] Growth of phase-pure Ga on a sapphire substrate 2 o 3 A thin film method comprising the steps of:

[0057]Take the size as 10 mm × 10 mm × 0.5 mm, (0006), (30 0), (01 2) For each oriented sapphire wafer, soak the wafer in acetone, absolute ethanol, and deionized water for 15 minutes respectively, take it out, rinse it with flowing deionized water, and dry it with dry nitrogen.

[0058] Then put the wafer into 98% H with a volume ratio of 3:1 2 SO 4 and 30%H 3 PO 4 The mixed acid mixture solution was kept at 85°C for 5 minutes, and the residual reagent was rinsed with flowing deionized water after taking it out, and finally dried with dry nitrogen. The sapphire wafer treated by this process was used as the substrate.

[0059] Put the above-mentioned cleaned sapphire substrate into the deposition chamber, with a purity of 99.99% Ga 2 o 3 The ceramic is used as the target, and Ga is grown on it by magnetron sputtering 2 o 3 film, set the growth parameters of t...

Embodiment 10

[0064] Growth of phase-pure Ga on a sapphire substrate 2 o 3 The method of the thin film is carried out according to the method in Example 3, the difference is that the sapphire wafer is ultrasonically soaked, cleaned and dried and directly put into the deposition chamber as a substrate for magnetron sputtering without pickling.

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Abstract

The invention relates to the technical field of semiconductor materials, and particularly discloses a method for growing a pure-phase Ga2O3 film on a sapphire substrate and a solar-blind ultraviolet detector, the method comprises the following steps: depositing on the sapphire substrate through a magnetron sputtering method to obtain the pure-phase Ga2O3 film, and magnetron sputtering parameters are as follows: the temperature of the substrate is 500-800 DEG C; the sapphire substrate is selected from any one or more of sapphire wafers with orientations of (0006), (300) and (012); the solar-blind ultraviolet detector disclosed in the invention comprises the sapphire substrate and a pure-phase Ga2O3 film epitaxially grown on the surface of the sapphire substrate. The method has the advantages that the pure-phase Ga2O3 film can grow on the sapphire substrate, and the device requirement is met.

Description

technical field [0001] This application relates to the technical field of semiconductor materials, more specifically, it relates to a kind of sapphire substrate growth pure phase Ga 2 o 3 Thin-film methods and solar-blind UV detectors. Background technique [0002] The solar-blind ultraviolet detector is not affected by the sunlight background, and can work around the clock. It has the characteristics of high sensitivity and low false alarm rate. The advantages of ultraviolet light detection devices based on wide bandgap semiconductor materials are mainly reflected in small size, light weight, high gain, fast response, low noise, shock resistance, vibration resistance, and no influence of magnetic fields, etc., especially suitable for equipment integration. [0003] To realize the detection of solar-blind ultraviolet light, it is required that the core semiconductor material of the device has a forbidden band width greater than 4.4 eV (corresponding to the detection wavele...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18H01L21/02H01L31/032H01L31/09C23C14/08
CPCH01L21/0242H01L21/02433H01L21/02565H01L21/02631H01L21/02609H01L31/18H01L31/032H01L31/09C23C14/08Y02P70/50
Inventor 孟冬冬葛坤鹏陈旭陈政委赵德刚
Owner 北京铭镓半导体有限公司
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