Method for preparing of low stress chromium nitride multilayer hard film
A chromium nitride and low stress technology, which is applied in the field of preparation of low stress chromium nitride multilayer hard films, can solve problems such as stress reduction and hardness limitation of Cr/CrN films, and achieves low internal stress, smooth surface, combined with high intensity effect
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Embodiment 1
[0021] A kind of embodiment of the present invention is, a kind of preparation method of low-stress chromium nitride multilayer hard film, adopts unbalanced magnetron sputtering equipment to carry out, and its specific method is:
[0022] A. Cleaning Place the workpiece cleaned with acetone and absolute ethanol in a vacuum chamber, use more than 99.99% pure chromium as the target material, close the vacuum chamber, and evacuate to 3.0×10 -3 At Pa, argon gas is introduced to make the pressure in the vacuum chamber reach 1-2Pa, the bias power is turned on, and a bias voltage of -1500V is applied to the workpiece, and argon plasma is formed by glow discharge, and the workpiece is cleaned by argon plasma sputtering 10 minutes; turn on the power of the target, apply a current of 3A to pre-sputter and clean the target for 5 minutes, and remove impurities such as oxides and nitrides on the surface of the target.
[0023] B. After the deposition and cleaning of the chromium transition...
Embodiment 2~12
[0027] Embodiments 2 to 12 are basically the same as Embodiment 1, except that in the C-step chromium nitride film deposition process, the workpiece bias voltage amplitude is set differently, the deposition time is different, the thickness of the deposition is different, and the number of repetitions is different. Its concrete numerical value is shown in the following table (in order to better represent the different processing conditions of each embodiment, the relevant parameters of embodiment 1 are also listed in the following table, and the number of repetitions in the table includes the first time):
[0028] The process parameter of embodiment 1~12 and the thickness of the chromium nitride multilayer hard film that deposits
[0029]
[0030] Figure 1a It is the bonding force test result of the low-stress chromium nitride hard film prepared by the method of Example 1 of the present invention. When the load increased to 1200mN in the scratch test, the friction coefficie...
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Abstract
Description
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Application Information
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