Wet method etching process
A wet etching and process technology, applied in the field of solar cells, can solve the problems of reducing quantum efficiency in the long-wave band, increasing back recombination, and reducing Isc, and achieves the effects of increasing Voc, strengthening back reflection, and increasing Isc
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Embodiment 1
[0025] The wet etching process of the crystalline silicon wafer provided in this embodiment comprises the following steps:
[0026] (1) Select cells after doping and diffusion treatment;
[0027] (2) Etch the above cell to remove the surrounding PN junction, etch by chain wet etching, using 3% HF and 40% HNO by mass percentage 3 Mix the solution to remove the PN junction around the silicon wafer;
[0028] (3) Polish the backside of the cell with the peripheral PN junction removed at 5°C for 10 seconds using a polishing solution. The polishing solution used contains the following components in mass percentage: HF10%, HNO 3 55%, H 2 SO 4 10%, acetic acid 5%, and additives ammonium fluoride, potassium nitrite, potassium sulfate 10%;
[0029] (4) 10% HF is used to remove phosphosilicate glass PSG;
[0030] (5) Dry the above-mentioned cell sheets by air drying.
[0031] Such as figure 1 As shown in , after removing the edge junction, increasing the back polishing process c...
Embodiment 2
[0033] The wet etching process of the crystalline silicon wafer provided in this embodiment comprises the following steps:
[0034] (1) Select cells after doping and diffusion treatment;
[0035] (2) Etch the above cell to remove the surrounding PN junction, etch by chain wet etching, using 3% HF and 40% HNO by mass percentage 3 Mix the solution to remove the PN junction around the silicon wafer;
[0036] (3) Remove phosphosilicate glass PSG by mass percentage content 5% HF;
[0037] (4) Polish the backside of the cell with the peripheral PN junction removed at 30°C for 10 minutes with a polishing solution. The polishing solution used contains the following components in mass percentage: HF 0.5%, HNO 3 5%, H 2 SO 4 50%, acetic acid 30% and additives potassium nitrite, potassium citrate, potassium lauryl sulfate 10%;
[0038] (5) Dry the above-mentioned cells by spinning.
[0039] Such as figure 1 As shown in , after removing the edge junction, increasing the back poli...
Embodiment 3
[0042] The wet etching process of the crystalline silicon wafer provided in this embodiment comprises the following steps:
[0043] (1) Select cells after doping and diffusion treatment;
[0044] (2) Etch the above-mentioned cells to remove the surrounding PN junctions, and dry plasma etching is used for etching;
[0045] (3) 20% HF by mass percentage is used to remove phosphosilicate glass PSG;
[0046] (4) Polish the backside of the cell with the peripheral PN junction removed at 15°C for 5 minutes using a polishing solution. The polishing solution used contains the following components in mass percentage: HF 1%, HNO 3 30%, H 2 SO 4 5%, acetic acid 25% and additives ammonium fluoride, potassium nitrite, potassium citrate, potassium lauryl ether phosphate and potassium lauryl sulfate 20%;
[0047] (5) Dry the above-mentioned cell sheets by air drying.
[0048] Such as figure 1 As shown in , after removing the edge junction, increasing the back polishing process can ma...
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