Low-temperature liquid-phase preparation method of indium gallium zinc oxide thin film transistor with high migration rate

A thin film transistor, indium gallium zinc oxide technology, used in semiconductor/solid state device manufacturing, semiconductor devices, electrical components and other directions, can solve the problems of increasing equipment complexity and increasing costs, avoiding high-temperature solution processes, low cost, and high performance. Effect

Inactive Publication Date: 2016-12-07
QILU UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, these gas-phase methods usually require a vacuum environment,

Method used

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  • Low-temperature liquid-phase preparation method of indium gallium zinc oxide thin film transistor with high migration rate
  • Low-temperature liquid-phase preparation method of indium gallium zinc oxide thin film transistor with high migration rate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] Weigh 1.106 g of indium chloride, 0.88 g of gallium chloride, and 0.682 g of zinc chloride, measure 10 ml of ethylene glycol methyl ether solution, and prepare an indium gallium zinc oxide precursor solution with a concentration of 0.5 mol / L. After 2 hours The magnetic stirring and ultrasonic dispersion formed a clear and transparent indium gallium zinc oxide precursor solution. The indium gallium zinc oxide precursor solution was coated on the indium tin oxide glass pre-coated with silicon oxide to form the indium gallium zinc oxide precursor thin film, which was preheated at 100 °C, and then subjected to a light wave of 300W, 60 minutes and 200 °C. After annealing, the indium gallium zinc oxide transparent semiconductor thin film is obtained. The source and drain electrodes are deposited on the indium gallium zinc oxide transparent semiconductor thin film to obtain the indium gallium zinc oxide thin film transistor.

Embodiment 2

[0029] Weigh 0.032 g of indium nitrate, 0.0256 g of gallium nitrate, and 0.0136 g of zinc chloride, measure 10 ml of ethanol solution, and prepare an indium gallium zinc oxide precursor solution with a concentration of 0.01 mol / L. After 0.5 hours of magnetic stirring and ultrasonic dispersion A clear and transparent indium gallium zinc oxide precursor solution is formed. The indium gallium zinc oxide precursor solution was coated on the indium tin oxide glass pre-coated with zirconia to form the indium gallium zinc oxide precursor thin film, which was preheated at 50 °C, and then subjected to a light wave of 700 W, 30 minutes and 280 °C. After annealing, the indium gallium zinc oxide transparent semiconductor thin film is obtained. The source and drain electrodes are deposited on the indium gallium zinc oxide transparent semiconductor thin film to obtain the indium gallium zinc oxide thin film transistor.

Embodiment 3

[0031] Weigh 0.146 g of indium acetate, 0.123 g of gallium acetate, and 0.1488 g of zinc nitrate, weigh 5 ml of aqueous solution, and prepare a solution of indium gallium zinc-oxygen precursor with a concentration of 0.1 mol / L. After 1 hour of magnetic stirring and ultrasonic dispersion, a clear solution was formed. Transparent indium gallium zinc oxide precursor solution. The indium gallium zinc oxide precursor solution was coated on a single crystal silicon substrate pre-coated with aluminum oxide to form an indium gallium zinc oxide precursor thin film, which was preheated at 90 ℃, and then subjected to 900 W, 5 minutes and 300 ℃ of temperature. Light wave annealing, that is, the indium gallium zinc oxide transparent semiconductor thin film is obtained. The source and drain electrodes are deposited on the indium gallium zinc oxide transparent semiconductor thin film to obtain the indium gallium zinc oxide thin film transistor.

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PUM

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Abstract

The invention belongs to the field of semiconductors and microelectronic devices, and particularly relates to a low-temperature liquid-phase preparation method of an indium gallium zinc oxide thin film transistor with the high migration rate. The method comprises the following steps that soluble zinc salt and tin salt are weighed, a solvent is measured, an indium gallium zinc oxide precursor solution with the concentration of 0.01-0.5 mol/L is prepared, and a clear and transparent indium gallium zinc oxide precursor solution is formed through 0.1-2 hour of magnetic stirring and ultrasonic dispersing; an indium gallium zinc oxide thin film is prepared; the indium gallium zinc oxide precursor solution is applied to a substrate precoated with a dielectric layer-grid thin film, preheating treatment at the temperature of 50 DEG C to 150 DEG C is conducted, light wave annealing at certain power, time and temperature is conducted, the indium gallium zinc oxide precursor solution is applied multiple times and annealing treatment is conducted according to the thickness requirement of the indium gallium zinc oxide thin film, and then an indium gallium zinc oxide transparent semiconductor thin film is obtained; source electrode and drain electrodes are deposited on the indium gallium zinc oxide transparent semiconductor thin film, and then the indium gallium zinc oxide thin film transistor is obtained. The indium gallium zinc oxide thin film transistor obtained through the method is high in performance and has an important application prospect in the electronic information field. Through a process of the method, the problems of a general high-temperature solution process, the long process cycle or expensive equipment and the like can be avoided, the cost is low, and the method is suitable for industrialized large-scale production.

Description

technical field [0001] The invention belongs to the field of semiconductors and microelectronic devices, and particularly relates to a low-temperature liquid phase preparation method of a high-mobility indium gallium zinc oxide thin film transistor. The indium gallium zinc oxide thin film transistor has important application prospects in the fields of information electronics and the like. Background technique [0002] After entering the 21st century, display devices have become the main terminal equipment for people to obtain information and exchange information. Thin Film Transistor (Thin Film Transistor), as the key device of active driving technology, has a decisive impact on the overall performance of display devices. So far, the most mature ones are amorphous silicon thin film transistors and polysilicon thin film transistors. However, the disadvantage of amorphous silicon transistors is the low carrier mobility (<1cm 2 / Vs), it is difficult to meet the current driv...

Claims

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Application Information

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IPC IPC(8): H01L21/331
CPCH01L29/66462
Inventor 夏国栋张倩王素梅
Owner QILU UNIV OF TECH
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