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Miniature spectrum testing system and testing method

A spectral testing and miniature technology, applied in the field of spectral analysis, can solve problems such as limited spectral resolution, low correlation, and narrow working wavelength range, and achieve the effects of enhancing photoelectric conversion, realizing performance, and increasing the working wavelength range

Active Publication Date: 2019-09-20
JINAN UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In 2008, at the International Conference on Optical Instruments, American scholars reported a micro-spectral analysis technology based on an on-chip liquid crystal waveguide structure. By adjusting the refractive index of the liquid crystal through a bias voltage, the transmission phase of the waveguide can be changed, and the on-chip Fourier spectrum analysis capability can be obtained, but limited by The distance spectral resolution of the on-chip waveguide routing is insufficient; in 2015, an American scholar reported a spectrometer based on a colloidal quantum dot array on page 67 of volume 524 of the journal Nature. By continuously adjusting the absorption wavelength of the quantum dots, a series of spectra with low correlation can be obtained , and achieve spectral analysis through algorithms, but it is necessary to synthesize a large number of colloidal quantum dots, and the preparation of large arrays is very difficult; in 2017, Dutch scholars reported a GaAs substrate-based The microelectromechanical on-chip spectrometer can achieve continuous scanning of a single wavelength by changing the distance between two resonant photonic crystal cavities, thereby obtaining spectral information, but the working wavelength range is only 30nm, which requires the preparation of a very complex double-layer air bridge structure, and the photoelectric The response rate is very low; in 2017, American scholars reported an integrated spectroscopic system based on Fabry-Perot etalon filter array and image sensor on page 40793 of volume 7 of the journal "Scientific Reports", but it requires a difficult gray-scale exposure process, and the optical efficiency is limited by the reflection loss of the metal mirror on the etalon; in 2018, a Swiss scholar reported a spectral analysis method based on computational image technology on page 1105 of volume 360 ​​of the journal Science, which will narrow the Line-width metamaterial resonant structure array chip assembled with CMOS image sensor through imaging optical path
[0004] It can be seen that although the existing technologies represented by the above examples all show miniature spectral testing systems, the spectral resolution is limited, the working wavelength range is narrow, and the system is complicated.

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Embodiment 1

[0042] refer to figure 2 As shown, the present embodiment provides a kind of miniature spectrum testing system, and the first surface of rotatable silicon wafer facing the beam collimation module forms a one-dimensional silicon material grating 3-1, wherein the period is 1.1 microns, and the width of the silicon material grating is 0.5 μm. Micron, the depth of the silicon material grating is 35 nanometers; the silicon material grating is covered with a gold film 3-2 with a thickness of 60 nanometers. The silicon material grating and the gold film together form the grating and form a Schottky junction. The gold film is used as the first electrode of the photodetection module, and the second electrode 4 of the photodetection module is formed on the second surface of the backlight of the silicon wafer, which is gold material. The thickness is 200 nm.

[0043] The incident light of different wavelengths resonates with the surface plasmon wave of the grating at a specific inciden...

Embodiment 2

[0051] Figure 10 It is a schematic cross-sectional structure diagram of the photodetection module of the miniature spectrum testing system of this embodiment. As shown in the figure, the preparation of the photodetection module in this embodiment is by covering the surface of the silicon wafer with a gold film, and then forming a silicon dioxide grating 3-3 on the gold film, wherein the thickness of the gold film is 80 nanometers, and the silicon dioxide grating 3-3 has a depth of 155 nm and a width of 360 nm. Figure 11 It is the calculation result of the absorption spectrum of the photodetection module of this embodiment under normal incident light irradiation. The resonance occurs at a wavelength of 1068 nm, the absorption at the peak is greater than 95%, the full width at half maximum is <10 nm, and the quality factor Q is greater than 100. The formation and working principles of the first and second electrodes are the same as those in the first embodiment.

Embodiment 3

[0053] Figure 12 It is a schematic diagram of the horizontal cross-sectional structure of the two-dimensional grating of the photodetection module of the micro spectrum testing system of this embodiment. In the preparation of the photoelectric detection module in this embodiment, a gold film with a thickness of 180 nanometers is deposited on a silicon wafer, and then a two-dimensional disk array 3-4 is etched on the gold film, the height of the disk is 100 nanometers, and the radius is 500 nanometers. The disc period is 1400 nm. Figure 13 It is the calculation result of the absorption spectrum of the miniature spectrum testing system of this embodiment under normal incident light irradiation. Resonance between incident light and surface plasmon waves occurs at 1412 nm at normal incidence. The absorption at the peak is greater than 98%, and the full width at half maximum is 4 nm. The quality factor Q is as high as 300. The formation and working principles of the first and...

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Abstract

The invention discloses a miniature spectrum testing system. The system comprises a light beam collimation module and a photoelectric detection module; light to be tested is collimated by the light beam collimation module, and then the collimated light to be tested is projected to the photoelectric detection module; the photoelectric detection module comprises a rotatable semiconductor substrate layer and a metal or metal-like material film covering the semiconductor substrate layer; and the light facing surface of the photoelectric detection module is prepared into a grating. The invention further discloses a spectrum testing method. The method comprises the following steps that: a light beam of a to-be-tested spectrum is collimated; the photoelectric detection module is rotated, and electric signals corresponding to each rotating angle are recorded and analyzed, and the light intensity information of each wavelength light in the to-be-tested spectrum is realized according to the light intensity information corresponding to the wavelengths in the spectrum. The method has the advantages of high-spectral resolution, large-working wavelength range and high-integration level spectral testing capability.

Description

technical field [0001] The invention relates to the field of spectrum analysis, in particular to an integrated miniature spectrum testing system and testing method. Background technique [0002] A spectrometer is a device that analyzes the relative strength of different wavelengths of incident light in a wide spectral range. It is one of the most common optical detection devices in scientific research. , agriculture and forestry have important applications. According to the working mode, it is divided into Fourier transform infrared spectrometer, Raman spectrometer, fiber optic spectrometer and spectrophotometer. These systems either use gratings or prisms to spatially disperse the incident light, so that light of different wavelengths is projected onto different detectors, thereby achieving spectral information acquisition; or use mechanical transmission motors to control the movement of mirrors to generate optical path differences between The time-domain function interfe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31
CPCG01N21/31G01N2021/3125
Inventor 陈沁文龙南向红
Owner JINAN UNIVERSITY
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