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A miniature spectrum testing system and testing method

A spectroscopic testing and miniature technology, applied in the field of spectral analysis, can solve the problems of limited spectral resolution, low correlation, narrow working wavelength range, etc., to achieve the effect of enhancing photoelectric conversion, realizing performance, and increasing working wavelength range.

Active Publication Date: 2022-03-25
JINAN UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In 2008, at the International Conference on Optical Instruments, American scholars reported a micro-spectral analysis technology based on an on-chip liquid crystal waveguide structure. By adjusting the refractive index of the liquid crystal through a bias voltage, the transmission phase of the waveguide can be changed, and the on-chip Fourier spectrum analysis capability can be obtained, but limited by The distance spectral resolution of the on-chip waveguide routing is insufficient; in 2015, an American scholar reported a spectrometer based on a colloidal quantum dot array on page 67 of volume 524 of the journal Nature. By continuously adjusting the absorption wavelength of the quantum dots, a series of spectra with low correlation can be obtained , and achieve spectral analysis through algorithms, but it is necessary to synthesize a large number of colloidal quantum dots, and the preparation of large arrays is very difficult; in 2017, Dutch scholars reported a GaAs substrate-based The microelectromechanical on-chip spectrometer can achieve continuous scanning of a single wavelength by changing the distance between two resonant photonic crystal cavities, thereby obtaining spectral information, but the working wavelength range is only 30nm, which requires the preparation of a very complex double-layer air bridge structure, and the photoelectric The response rate is very low; in 2017, American scholars reported an integrated spectroscopic system based on Fabry-Perot etalon filter array and image sensor on page 40793 of volume 7 of the journal "Scientific Reports", but it requires a difficult gray-scale exposure process, and the optical efficiency is limited by the reflection loss of the metal mirror on the etalon; in 2018, a Swiss scholar reported a spectral analysis method based on computational image technology on page 1105 of volume 360 ​​of the journal Science, which will narrow the Line-width metamaterial resonant structure array chip assembled with CMOS image sensor through imaging optical path
[0004] It can be seen that although the existing technologies represented by the above examples all show miniature spectral testing systems, the spectral resolution is limited, the working wavelength range is narrow, and the system is complicated.

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Embodiment 1

[0042] refer to figure 2 As shown in the figure, this embodiment provides a miniature spectral testing system, where a rotatable silicon wafer faces the first surface of the beam collimation module to form a one-dimensional silicon grating 3-1, wherein the period is 1.1 microns, and the width of the silicon grating is 0.5 Micron, the depth of the silicon grating is 35 nanometers; the silicon grating is covered with a gold film 3-2 with a thickness of 60 nanometers. The silicon grating and the gold film together form a grating and form a Schottky junction. The gold film is used as the first electrode of the photoelectric detection module, and the second electrode 4 of the photoelectric detection module is formed on the second surface of the silicon wafer backlight, which is made of gold material. Thickness 200 nanometers.

[0043] Incident light of different wavelengths resonates with the surface plasmon wave of the grating at a specific incident angle, and the resonance cond...

Embodiment 2

[0051] Figure 10 It is a schematic cross-sectional structure diagram of the photoelectric detection module of the micro-spectroscopy test system of the present embodiment. As shown in the figure, the photoelectric detection module in this embodiment is prepared by covering the surface of the silicon wafer with a gold film, and then forming a silicon dioxide grating 3-3 on the gold film, wherein the thickness of the gold film is 80 nanometers, and the silicon dioxide grating is 3-3 is 155nm deep and 360nm wide. Figure 11 This is the calculation result of the absorption spectrum of the photoelectric detection module of this embodiment under normal incident light irradiation. The resonance occurs at a wavelength of 1068 nm, the absorption at the peak is greater than 95%, the full width at half maximum is <10 nm, and the quality factor Q is greater than 100. The formation and working principles of the first and second electrodes are the same as those of the first embodiment. ...

Embodiment 3

[0053] Figure 12 A schematic diagram of the horizontal cross-sectional structure of the two-dimensional grating of the photoelectric detection module of the micro-spectroscopy testing system of the present embodiment. In the preparation of the photoelectric detection module in this embodiment, a gold film with a thickness of 180 nanometers is deposited on a silicon wafer, and then a two-dimensional disk array 3-4 is etched on the gold film. The height of the disks is 100 nanometers and the radius is 500 nanometers. The disk period is 1400 nanometers. Figure 13 This is the calculation result of the absorption spectrum of the micro-spectroscopy testing system of this embodiment under normal incident light irradiation. The incident light resonates with the surface plasmon wave at 1412 nm at normal incidence. The absorptivity at the peak is greater than 98%, and the full width at half maximum is 4 nm. Quality factor Q up to 300. The formation and working principles of the fi...

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Abstract

The invention discloses a miniature spectrum testing system, which includes a beam collimation module and a photoelectric detection module, wherein the light to be measured is collimated by the beam collimation module and then projected to the photoelectric detection module; the photoelectric detection module includes a rotatable semiconductor The base layer and the metal or metal-like material thin film covered on the semiconductor base layer, and the photodetection module is prepared as a grating facing the light side. The invention also discloses a spectrum testing method, which includes the steps of: collimating the light beam of the spectrum to be measured; rotating the photoelectric detection module, recording and analyzing the electrical signal output corresponding to each rotation angle, corresponding to the light intensity information of the wavelength in the spectrum, Realize the light intensity information test of each wavelength light in the spectrum to be tested. The invention has high spectral resolution, large working wavelength range and high integrated spectral testing capability.

Description

technical field [0001] The invention relates to the field of spectral analysis, in particular to an integrated miniature spectral testing system and a testing method. Background technique [0002] A spectrometer is a device that analyzes the relative strength of different wavelengths of incident light in a wide spectral range. It is one of the most common optical detection equipment in scientific research, and is also used in optical communication, remote sensing mapping, pharmaceutical development, medical diagnosis, and environmental monitoring. , agriculture and forestry have important applications. According to the working mode, it is divided into Fourier transform infrared spectrometer, Raman spectrometer, fiber optic spectrometer and spectrophotometer. These systems either use gratings or prisms to spatially disperse the incident light, so that different wavelengths of light are projected to different detectors, so as to achieve spectral information acquisition; The ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/31
CPCG01N21/31G01N2021/3125
Inventor 陈沁文龙南向红
Owner JINAN UNIVERSITY
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