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Method for manufacturing silicon solar cell

A technology of silicon solar cells and silicon wafers, which is applied in the manufacture of circuits, electrical components, and final products, can solve the problems of reducing short-circuit current, increasing silicon wafer carriers, and high production costs, and achieves improved parallel resistance and short-circuit current, Effect of reduction of ohmic contact, increase of open circuit voltage

Inactive Publication Date: 2011-09-28
SUN EARTH SOLAR POWER
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1) In the process of making a semiconductor PN junction on a silicon wafer, it adopts the conventional diffusion process in the semiconductor industry to use phosphorus oxychloride (POCl 3 ) carry out high-temperature diffusion for the phosphorus source, and the n+ layer of the emission region formed in this way will increase the sheet resistance and dead layer of the silicon solar cell, thereby affecting the performance of the silicon solar cell;
[0005] 2) The de-edge junction process in this method is performed by inductively coupled plasma etching. Although the inductively coupled plasma etching method can also better remove the PN junctions around the silicon wafer that can cause front and back short circuits , but at the same time it also destroys the n+ layer in the emitter region, thereby reducing the performance of silicon solar cells;
[0006] 3), the coating silicon nitride thin film (ARC) process in this method has adopted the plasma enhanced chemical vapor deposition process, and it is mainly to deposit silicon nitride thin film on the positive surface of silicon wafer, so not only is unfavorable for silicon wafer The passivation of the back will also increase the generation of carriers on the back of the silicon wafer, which will affect the performance of silicon solar cells;
[0007] In addition to the shortcomings listed in the above-mentioned manufacturing method of crystalline silicon solar cells, the following defects generally exist in the existing solar cell manufacturing methods: in the existing manufacturing methods, the front and back electrodes are directly printed by screen printing technology, and the grid The line width is generally 120μ, and the line height is generally 25μ. Wider grid lines increase the shading area on the surface of the battery, which is extremely unfavorable for increasing the photogenerated current, thereby reducing the short-circuit current; In the previous chemical pretreatment process, the mixture of sodium hydroxide or potassium hydroxide, water and isopropanol is usually used to form a pyramid structure. Due to the high price of isopropanol, the production cost is also high

Method used

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Examples

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Effect test

Embodiment 1

[0025] A preparation method of a silicon solar cell, which is divided into the following steps according to the production sequence of the process line: carrying out front-end chemical pretreatment on the silicon wafer; making a PN junction on the silicon wafer; performing edge removal treatment on the silicon wafer; The surface is passivated; the front electrode and the back electrode are made; the front electrode and the back electrode are metallized and the silicon nitride film is burned through.

[0026] In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 22% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slices are removed. The damaged layer produced on the surface of the silicon wafer during the process, the thickness of the damaged layer removed is 20 μm, the temperature of the sodium hydroxide solution is 8...

Embodiment 2

[0033] In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 20% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slices are removed. The damaged layer produced on the surface of the silicon chip during the process, the thickness of the damaged layer removed is 25 μm, the temperature of the sodium hydroxide solution is 80 ° C, and the soaking time is 5 minutes; it is 2% by volume The diluted sodium hydroxide solution and A mixed solution of alcohol with a volume percentage of 20% is used to carry out surface structural treatment on silicon wafers. The treatment temperature is 80°C and the treatment time is 22 minutes; the silicon wafers are cleaned at room temperature with a diluted hydrochloric acid solution with a volume percentage of 15% to remove silicon. For the metal ions on the chip, remove the silicon oxide lay...

Embodiment 3

[0040]In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 25% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slice is removed. The damaged layer produced on the surface of the silicon wafer during the process, the thickness of the removed damaged layer is 23 μm, the temperature of the sodium hydroxide solution is 90 ° C, and the soaking time is 4 minutes; A mixed solution of alcohol with a volume percentage of 22% is used to carry out surface structural treatment on silicon wafers. The treatment temperature is 90°C and the treatment time is 20 minutes; the silicon wafers are cleaned at room temperature with 24% volume percentage of dilute hydrochloric acid aqueous solution to remove silicon. For the metal ions on the chip, remove the silicon oxide layer on the surface of the silicon chip with a diluted hydrofluoric...

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PUM

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Abstract

The invention discloses a method for manufacturing a silicon solar cell. In the process of manufacturing a PN junction on a silicon wafer, a selective diffusion technology method is adopted, i,e. laser is utilized to heat a position, on which a positive electrode intends to be manufactured, on the surface of the silicon wafer; and under the action of heating, phosphorus in a phosphorus source uniformly adhered on the surface diffuses towards the inner of the silicon wafer, thus a heavy doping zone with smaller sheet resistance is formed at the position on which the positive electrode intends to be manufactured to effectively reduce the sheet resistance of the silicon solar cell, thereby not only being beneficial for increasing the open-circuit voltage of the silicon solar cell; the increase of the open-circuit voltage effectively improves the conversion efficiency of the silicon solar cell, reduces ohmic contact of a metal electrode and the silicon solar cell, thereby reducing the series resistance of the silicon solar cell, and being capable of meeting the demand of industrialized production better.

Description

technical field [0001] The invention relates to a method for preparing a solar cell, in particular to a method for preparing a high-efficiency silicon solar cell. Background technique [0002] With the increasing shortage of conventional energy sources, renewable energy has attracted more and more attention from human beings. In the past 10 years, the amount of solar power generation has shown an exponential growth. With the continuous improvement of the preparation method of crystalline silicon solar cells, the production cost has been continuously reduced. , solar power generation will be more and more popular. [0003] At present, in the mass production process of silicon solar cells, due to the continuous upgrading of production equipment and the continuous improvement of new production and preparation methods, the production cost of silicon solar cells is further reduced, and the photoelectric conversion efficiency of cells is also continuously improved. New The prepar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/18
CPCY02P70/50
Inventor 肖剑峰周体黄志林夏金才
Owner SUN EARTH SOLAR POWER
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