Method for manufacturing silicon solar cell
A technology of silicon solar cells and silicon wafers, which is applied in the manufacture of circuits, electrical components, and final products, can solve the problems of reducing short-circuit current, increasing silicon wafer carriers, and high production costs, and achieves improved parallel resistance and short-circuit current, Effect of reduction of ohmic contact, increase of open circuit voltage
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Embodiment 1
[0025] A preparation method of a silicon solar cell, which is divided into the following steps according to the production sequence of the process line: carrying out front-end chemical pretreatment on the silicon wafer; making a PN junction on the silicon wafer; performing edge removal treatment on the silicon wafer; The surface is passivated; the front electrode and the back electrode are made; the front electrode and the back electrode are metallized and the silicon nitride film is burned through.
[0026] In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 22% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slices are removed. The damaged layer produced on the surface of the silicon wafer during the process, the thickness of the damaged layer removed is 20 μm, the temperature of the sodium hydroxide solution is 8...
Embodiment 2
[0033] In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 20% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slices are removed. The damaged layer produced on the surface of the silicon chip during the process, the thickness of the damaged layer removed is 25 μm, the temperature of the sodium hydroxide solution is 80 ° C, and the soaking time is 5 minutes; it is 2% by volume The diluted sodium hydroxide solution and A mixed solution of alcohol with a volume percentage of 20% is used to carry out surface structural treatment on silicon wafers. The treatment temperature is 80°C and the treatment time is 22 minutes; the silicon wafers are cleaned at room temperature with a diluted hydrochloric acid solution with a volume percentage of 15% to remove silicon. For the metal ions on the chip, remove the silicon oxide lay...
Embodiment 3
[0040]In this specific embodiment, the specific process of performing the front chemical pretreatment on the silicon wafer is as follows: the silicon wafer is soaked in a 25% by weight sodium hydroxide solution, the silicon wafer is etched and thinned, and the silicon wafer slice is removed. The damaged layer produced on the surface of the silicon wafer during the process, the thickness of the removed damaged layer is 23 μm, the temperature of the sodium hydroxide solution is 90 ° C, and the soaking time is 4 minutes; A mixed solution of alcohol with a volume percentage of 22% is used to carry out surface structural treatment on silicon wafers. The treatment temperature is 90°C and the treatment time is 20 minutes; the silicon wafers are cleaned at room temperature with 24% volume percentage of dilute hydrochloric acid aqueous solution to remove silicon. For the metal ions on the chip, remove the silicon oxide layer on the surface of the silicon chip with a diluted hydrofluoric...
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