Wet electron chemical silicon-based material etching solution and preparation method thereof
A silicon-based material and electronic chemical technology, applied in the field of etching solution, can solve problems such as pipeline blockage, high toxicity of hydrofluoric acid, and environmental pollution
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Embodiment 1
[0039] The wet electronic chemical etching solution for silicon-based materials provided in this embodiment includes, in parts by weight: 25 parts of methanesulfonic acid; 13 parts of trifluoromethanesulfonic acid; 25 parts of nitric acid and 5 parts of citric acid ; Hydrochloric acid: 5 parts; Q75 (tetrahydroxypropyl ethylenediamine): 3 parts; Sodium alkyl sulfate: 3 parts;
[0040] The components are obtained according to the above proportions, mixed at 20-30° C., and then left to stand for aging to obtain the wet electronic chemical etching solution for silicon-based materials.
[0041] The detection method for etching the silicon substrate is as follows:
[0042] The silicon substrate is first polished for 20-30 minutes, then the polished silicon substrate is washed with pure water, and then dried with cold air. The dried silicon substrate is etched.
[0043] A silicon substrate with a thickness of 1 mm after drying was selected for etching, placed in an etching tank con...
Embodiment 2
[0047] The wet electronic chemical etching solution for silicon-based materials in this embodiment includes, in parts by weight: 30 parts of methanesulfonic acid; 10 parts of trifluoromethanesulfonic acid; 35 parts of nitric acid; and 5 parts of citric acid; Hydrochloric acid: 10 parts; Q75: 3 parts; Sodium alkyl sulfate: 3 parts; water balance to 100 parts in total.
[0048] The etching solution was prepared according to the method of Example 1, and the silicon substrate was tested.
[0049] The thickness of the obtained silicon substrate was 0.84 mm, no concave and convex points were found on the surface of the silicon substrate, the thickness uniformity of the silicon substrate was less than 1%, and the etching solution contained a small amount of white flocs.
Embodiment 3
[0051] The wet electronic chemical etching solution for silicon-based materials in this embodiment includes, in parts by weight: 40 parts of methanesulfonic acid; 15 parts of trifluoromethanesulfonic acid; 25 parts of nitric acid; and 10 parts of hydrochloric acid; Q75: 5 parts; sodium alkyl sulfate: 3 parts; water balance to 100 parts in total.
[0052] The etching solution was prepared according to the method of Example 1, and the silicon substrate was tested.
[0053] The thickness of the silicon substrate obtained by measurement was 0.81 mm. There were no pits and bumps on the surface of the silicon substrate. The thickness uniformity of the silicon substrate was less than 1%. The etching solution contained a small amount of white flocs.
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