Selective etching solution for metal tungsten and copper

A selective etching solution technology, applied in the field of etching solution for tungsten film, can solve the problems of shortening the life of etching solution, difficulty in controlling the concentration of hydrogen peroxide in etching solution, and slow etching speed, etc., to achieve stable etching rate and good contact , Inhibit the effect of etching

Inactive Publication Date: 2021-04-13
湖北兴福电子材料股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Yet for hydrogen peroxide solution, if contain such as metals such as copper, silver, gold, then can promote the decomposition of hydrogen peroxide, not only can shorten the life-span of etching solution, also have difficulty in controlling the concentration of hydrogen peroxide in etching solution, etch Slow down etc.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] Described embodiment 1 is the etching solution and its etching effect thereof without adding copper etching inhibitor azole compounds, specifically as follows:

[0033] The etching solution is composed of hydrogen peroxide, citric acid, aminodimethylidene phosphonic acid, imidazole, sodium alkylphenylsulfonate and deionized water.

[0034] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenylsulfonate is 0.5%, and the balance for deionized water.

[0035] The etching solution configured according to the above ratio was used to perform etching experiments on metallic copper on a glass substrate at 35°C (cut the copper sheet into regular squares with a size of 2*2cm). In order to avoid the inaccurate test of the copper sheet due to oxidation in the natural environment, the copper sheet was first ...

Embodiment 2

[0039] Described embodiment 2 is to add the etchant of 0.1% mass content aminotetrazole copper ion etch inhibitor and etching effect thereof, specifically as follows:

[0040] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenyl sulfonate is 0.5%, amino tetra The mass content of azole is 0.1%, and the balance is deionized water.

[0041] Metal copper was etched according to the method of Example 1, and the etching rate of metal copper by the etching solution configured in the above ratio was 250 Å / min.

[0042] According to the above etching method, the etching solution configured in the above ratio was used to etch the metal tungsten on the silicon substrate at 35°C, and the etching rate of the metal tungsten was 51 Å / min.

[0043] It can be seen that the etching selectivity ratio of the above formu...

Embodiment 3

[0045]Described embodiment 3 is to add the etchant of 0.5% mass content aminotetrazole copper ion etch inhibitor and etching effect thereof, specifically as follows:

[0046] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenyl sulfonate is 0.5%, amino tetra The mass content of azole is 0.5%, and the balance is deionized water.

[0047] The metal copper was etched according to the method of Example 1, and the etching rate of the metal copper was 44 Å / min by the etching solution configured in the above ratio.

[0048] According to the above etching method, the etching solution configured in the above ratio was used to etch the metal tungsten on the silicon substrate at 35°C, and the etching rate of the metal tungsten was 25 Å / min.

[0049] It can be seen that the etching selectivity ratio of the above...

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PUM

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Abstract

The invention discloses an etching solution capable of selectively etching metal copper and metal tungsten. The etching solution comprises an oxidant, an organic acid, a chelating agent, a pH regulator and a copper etching inhibitor. According to the selective etching solution for the metal copper and the tungsten disclosed by the invention, the low etching rate of the metal copper can be guaranteed while the metal tungsten is efficiently etched, and etching of the metal copper is avoided to the maximum extent. In the etching process, the pH regulator such as imidazole stabilizes the pH value of the etching solution, and large fluctuation of the pH value of the etching solution is avoided, so that large fluctuation is caused to the etching rate and the etching stability of metal copper and tungsten; the chelating agent and copper ions generated in the etching solution rapidly form coordination bonds to be chelated, and decomposition of an oxidizing agent hydrogen peroxide and stability of a hard etching solution caused by accumulation of the copper ions in the etching solution are avoided; in the etching process of copper ion etching inhibitors such as aminotetrazole, etching of copper ions is inhibited, and high-selectivity etching of metal tungsten relative to copper is guaranteed.

Description

technical field [0001] The present invention relates to the processing of a semiconductor substrate formed with a tungsten film, especially the processing of a semiconductor substrate provided with copper (Cu) wiring, and mainly relates to an etchant for a tungsten film. Background technique [0002] For silicon wafer-based equipment related to semiconductors, it is necessary to design patterns, superimpose various metal layers through sputtering or other processes, and etch with wet chemical liquid to form wiring according to the difference in function and application. or protrusions. [0003] Tungsten (W) or tungsten alloys are commonly used in gate electrodes, lines, and barrier layers of thin film transistors, or for filling contact holes or via holes in PRAM and other semiconductor devices. [0004] Examples of etching solutions for tungsten-based metal films include acid etching solutions such as hydrogen peroxide etching solutions, hydrofluoric acid-hydrogen peroxide...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/18C23F1/26
CPCC23F1/18C23F1/26
Inventor 王书萍钟昌东冯凯贺兆波张庭尹印万杨阳李鑫
Owner 湖北兴福电子材料股份有限公司
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