Selective etching solution for metal tungsten and copper
A selective etching solution technology, applied in the field of etching solution for tungsten film, can solve the problems of shortening the life of etching solution, difficulty in controlling the concentration of hydrogen peroxide in etching solution, and slow etching speed, etc., to achieve stable etching rate and good contact , Inhibit the effect of etching
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Embodiment 1
[0032] Described embodiment 1 is the etching solution and its etching effect thereof without adding copper etching inhibitor azole compounds, specifically as follows:
[0033] The etching solution is composed of hydrogen peroxide, citric acid, aminodimethylidene phosphonic acid, imidazole, sodium alkylphenylsulfonate and deionized water.
[0034] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenylsulfonate is 0.5%, and the balance for deionized water.
[0035] The etching solution configured according to the above ratio was used to perform etching experiments on metallic copper on a glass substrate at 35°C (cut the copper sheet into regular squares with a size of 2*2cm). In order to avoid the inaccurate test of the copper sheet due to oxidation in the natural environment, the copper sheet was first ...
Embodiment 2
[0039] Described embodiment 2 is to add the etchant of 0.1% mass content aminotetrazole copper ion etch inhibitor and etching effect thereof, specifically as follows:
[0040] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenyl sulfonate is 0.5%, amino tetra The mass content of azole is 0.1%, and the balance is deionized water.
[0041] Metal copper was etched according to the method of Example 1, and the etching rate of metal copper by the etching solution configured in the above ratio was 250 Å / min.
[0042] According to the above etching method, the etching solution configured in the above ratio was used to etch the metal tungsten on the silicon substrate at 35°C, and the etching rate of the metal tungsten was 51 Å / min.
[0043] It can be seen that the etching selectivity ratio of the above formu...
Embodiment 3
[0045]Described embodiment 3 is to add the etchant of 0.5% mass content aminotetrazole copper ion etch inhibitor and etching effect thereof, specifically as follows:
[0046] Wherein the mass content of hydrogen peroxide is 9%, the mass content of citric acid is 4%, the mass content of aminodimethylidene phosphonic acid is 1.5%, the mass content of imidazole is 2%, the mass content of sodium alkylphenyl sulfonate is 0.5%, amino tetra The mass content of azole is 0.5%, and the balance is deionized water.
[0047] The metal copper was etched according to the method of Example 1, and the etching rate of the metal copper was 44 Å / min by the etching solution configured in the above ratio.
[0048] According to the above etching method, the etching solution configured in the above ratio was used to etch the metal tungsten on the silicon substrate at 35°C, and the etching rate of the metal tungsten was 25 Å / min.
[0049] It can be seen that the etching selectivity ratio of the above...
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