The invention relates to the technical field of
electromagnetic compatibility testing, in particular to a
chip radiation immunity testing method, device and equipment, a medium and a product, and the method comprises the steps: designing a testing tool according to the size information of a circuit board in a
current electric drive controller, and designing a first insulating plate and a second insulating plate, an opening is formed in a corresponding position on the insulating plate on the same side as the cover plate according to the position information of the
chip to be tested; and assembling the circuit board, the first insulating plate, the second insulating plate and the test tool, placing the assembled to-be-tested product in a preset test mechanism, applying a
radio frequency interference
signal to the to-be-tested
chip, and monitoring the working state parameters of the to-be-tested chip so as to evaluate the
radiation immunity performance of the to-be-tested chip. Therefore, the problems that an existing chip
radiation immunity testing method is long in testing period, the chip is prone to being damaged, and adaptability is poor are solved, radiation
immunity testing is carried out on the premise that the chip is not disassembled and a circuit board is not redesigned, and therefore the checking period is remarkably shortened.