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Preparation method of high-speed low-power-consumption phase change memory

A technology of phase-change memory and phase-change materials, which is applied in the field of microelectronics technology, can solve the problems of reducing operating current, reducing the size of phase-change units, and not having good consistency, so as to achieve low operating current, great flexibility, and fast effect

Active Publication Date: 2014-08-27
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Compared with the stripping process, this method has better controllability for the sidewall of the film, but the corrosion of the film material by the acid-base solution is isotropic, and it is impossible to prepare a small-sized phase change unit close to the vertical sidewall, which cannot meet the high requirements. The level of integration and the requirement to reduce the size of the phase change unit to reduce the operating current
At the same time, the solution depth of the film material to be etched in the acid-base solution and the flow rate of the surrounding solution are different, which also leads to the lack of good consistency of the method and is not suitable for large-scale production.

Method used

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  • Preparation method of high-speed low-power-consumption phase change memory
  • Preparation method of high-speed low-power-consumption phase change memory
  • Preparation method of high-speed low-power-consumption phase change memory

Examples

Experimental program
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Effect test

example 1

[0027] The structure of the phase change memory in this example is a "T" type structure, an edge contact structure, a symmetrical structure or an asymmetrical structure.

[0028] (1) Clean the substrate:

[0029] Sonicate the silicon oxide substrate in acetone for 3 minutes, wash it in absolute ethanol and deionized water, blow dry the substrate with a nitrogen gun, and bake it on a hot plate at 103 degrees Celsius to remove moisture on the substrate .

[0030] (2) Deposit metal film and insulating layer film:

[0031] Apply photoresist on the surface of a clean substrate, bake it on a hot plate at 97 degrees Celsius for 3 minutes, select the pattern required on the photolithography mask board, expose it for 30 seconds, and then bake it on a hot plate at 112 degrees Celsius for 110 seconds. After flood exposure for 30 seconds and soaking in the developer for 20 seconds, the required photoresist pattern is formed. Then use magnetron sputtering to deposit a 150nm thick TiW fi...

example 2~5

[0047] The key of the inventive method lies in steps (3) and (5), and all the other steps are basically the same as the prior art, and the metal thin film in steps (2), (7) is Pt or Au or TiW or Ag of 30nm~200nm or Cu or Al or TiN, the insulating layer film is 30nm ~ 200nm SiO 2 or Si 3 N 4 ; In the photolithography process of process step (4), the baking time is 1-10 minutes, the exposure time is 1-8 minutes, and the developing time is 1-5 minutes; removing photoresist in process step (6) is Soak in acetone for 1 to 2 hours, then sonicate for 5 to 10 minutes. The photolithography process includes optical lithography, electron beam lithography and nanoimprint lithography. The inductively coupled plasma dry etching gas contains Cl 2 , HBr, BCl 3 Mixed gas of halogen element gas such as Ar and inert gas such as Ar. The substrate can be a silicon dioxide substrate, a silicon substrate, a gallium arsenide substrate, etc.

[0048] The method of the present invention i...

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Abstract

The invention discloses a method for preparing a high-speed and low-power phase change memory. The method adopts a superlattice film material with fast phase change speed and low thermal conductivity as a phase change material, and uses inductively coupled plasma dry method to etch the materials to form phase-change memory cells with excellent morphology, steep sidewalls, and good consistency. The steps are: ①cleaning the substrate; ②depositing a metal film and an insulating layer film in sequence; ③depositing a superlattice film phase change material; ④coating and photolithography to form a photoresist as an etching mask; ⑤using inductively coupled plasma The etching equipment etches the superlattice film material; ⑥ removes the photoresist mask; ⑦ deposits the insulating layer film and the metal film in sequence. This process makes full use of the characteristics of anisotropy and consistency in the etching of superlattice phase-change thin film materials by inductively coupled plasma dry etching, so that the prepared phase-change memory has high-speed and low-power consumption performance, and can be well It is applied to high-density integration and large-scale industrial production.

Description

technical field [0001] The invention belongs to the technical field of microelectronic technology in microelectronics, and in particular relates to an etching process used for making a phase-change memory. Background technique [0002] Phase-change random access memory is a non-volatile storage device. The thermal effect generated by the action of current causes the phase-change material to undergo reversible transition between polycrystalline state and amorphous state. It utilizes polycrystalline state (low resistance) and amorphous state ( High resistance) to record the value "0" and "1" according to the difference in the resistance level. Phase-change random access memory not only has the advantages of non-volatility, fast speed, high reliability, low power consumption, long life, and compatibility with CMOS technology, it is suitable for being widely used in daily electronic products, and it is also anti-radiation, anti-vibration, and can realize multiple Value storage,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00
CPCH01L45/141H01L45/1675H01L45/06H10N70/231H10N70/882H10N70/063
Inventor 缪向水陈莹周文利
Owner HUAZHONG UNIV OF SCI & TECH
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