Method for crystallizing amorphous silicon thin films in multi-cycle rapid thermal annealing auxiliary metal induced mode
An amorphous silicon thin film and auxiliary metal technology, which is applied in the manufacture of semiconductor/solid state devices, electrical components, circuits, etc. Induction, low cost, effect of reducing the amount of residual metal contamination
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[0022] Specific embodiments of the present invention will be further described as follows in conjunction with the accompanying drawings.
[0023] The process and steps in the embodiment of the present invention are as follows:
[0024] 1) Cut a common glass slide into a size of 1cm×1cm, ultrasonically clean the surface of the sample with acetone, ethanol and deionized water respectively, and then dry it with nitrogen. Put the cleaned glass substrate into the film deposition chamber, and use plasma enhanced chemical vapor deposition (PECVD) equipment to deposit a layer of amorphous silicon (a-Si) film on the glass substrate with a thickness of about 200nm. When the substrate temperature is 200°C, the deposition pressure is 10 -5 Pa, gas glow pressure range 50Pa~250Pa, RF power supply 13.56MHz, gas source is 100% pure silane (SiH 4 ), hydrogen used as dilute silane (H 2 ) with a purity of 5N.
[0025] 2) Prepare ethanol and toluene solution (volume ratio 1:4), add ethyl cell...
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