Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Vacuum film plating method with combined magnetic field, lined straight pipe and multihole baffle combined

A porous baffle and vacuum coating technology, which is applied in vacuum evaporation coating, sputtering coating, ion implantation coating, etc., can solve the problems of film composition pollution, large particle defects, low film deposition efficiency, etc., and achieve high utilization Efficiency, the effect of ensuring uniformity

Pending Publication Date: 2019-07-09
魏永强
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to solve the problem of low ionization rate and thin film deposition efficiency of traditional magnetron sputtering technology, the limitation of high melting point target material use, and the current high-power pulse magnetron sputtering. The plating method uses high melting point targets, low melting point pure metals (such as aluminum, tin) or multi-element alloy materials (such as AlSi alloys) and non-metallic materials (such as graphite and semiconductor materials Si) as targets that are prone to large particle defects, bending Low efficiency of arc plasma transmission caused by type magnetic filter technology, limitation of target element usage and uniform ablation, thin film deposition density and defects, deposition position limitation caused by vacuum chamber space and target source layout design, workpiece shape limitation and different target In order to solve problems such as contamination of film components caused by secondary sputtering of residues in multi-level magnetic field devices, pure metals with low melting points (such as aluminum, tin) or multi-element alloy materials (such as AlSi alloys) and non-metallic materials (such as graphite and Semiconductor material Si, etc.) as the target material of high-power pulsed magnetron sputtering, and then use the arc ion plating method to realize the high melting point refractory target material to produce continuous and stable plasma with high ionization rate, combined with multi-level magnetic field filtering method and The shape constraints of the lined bias straight tube and the porous baffle combined device and the composite effect of the bias electric field attraction eliminate the large particle defects contained in the arc plasma, and at the same time ensure that the arc plasma passes through the inner tube with high transmission efficiency. The combination device of lined bias straight pipe and porous baffle and multi-stage magnetic field filter device, and then use the combined effect of the magnetic field constraint of the movable coil device and the self-bias electric field attraction to eliminate the interference from the multi-stage magnetic field device and lined bias straight pipe The large particle defects contained in the arc plasma transmitted by the combined device with the porous baffle, while using the movable coil device to control the transmission direction of the composite plasma of the twin target high-power pulse magnetron sputtering and arc ion plating in the vacuum chamber, Realize the control and adjustment of film deposition and film composition on the surface of the substrate workpiece at any position in the vacuum chamber, reduce the loss of composite plasma in the vacuum chamber, and overcome the problem of uneven film deposition caused by the limitation of the position of the vacuum chamber and the target source or the limitation of the shape of the substrate. Thoroughly remove the large particle defects that may remain in the arc plasma transmitted from the multi-stage magnetic field device and the combination device of the lined bias straight tube and the porous baffle, so that the ion energy can be adjusted on the surface of the workpiece under the condition of applying a negative bias , use the bias electric field suppression on the surface of the substrate to remove large particle defects in the arc plasma, prepare continuous and dense high-quality films, and at the same time realize the control of the content of target elements in the film, reduce the production cost of using alloy targets, and improve The transmission efficiency of the plasma, the increase of the deposition rate of the film and the reduction or even elimination of the adverse effects of large particle defects on the microstructure of the film, continuous dense deposition and performance, propose a combination of magnetic field and lined straight tube and porous baffle Vacuum coating method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Vacuum film plating method with combined magnetic field, lined straight pipe and multihole baffle combined
  • Vacuum film plating method with combined magnetic field, lined straight pipe and multihole baffle combined
  • Vacuum film plating method with combined magnetic field, lined straight pipe and multihole baffle combined

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0025] Specific implementation mode one: the following combination Figure 1-6Describe this embodiment. In this embodiment, a vacuum coating method that combines a magnetic field with a lined straight pipe and a porous baffle is used. The device includes a bias power supply (1), an arc power supply (2), an arc ion plating target source (3 ), twin target high power pulse magnetron sputtering power supply (4), twin target high power pulse magnetron sputtering target source (5), bias power waveform oscilloscope (6), twin target high power pulse magnetron sputtering power supply Waveform oscilloscope (7), waveform synchronous matching device (8), movable coil device (9), movable coil device power supply (10), rheostat device (11), multi-level magnetic field device (12), multi-level magnetic field device power supply (13 ), liner bias straight tube and porous baffle combined device (14), liner bias power supply (15), sample stage (16) and vacuum chamber (17);

[0026] In this devi...

specific Embodiment approach 2

[0044] Embodiment 2: The difference between this embodiment and Embodiment 1 is that a combined magnetic field is connected with the vacuum coating method of lining the straight pipe and the porous baffle, and the arc power supply (2) is turned on, and the multi-stage magnetic field power supply is turned on. (5) Adjust the multi-stage magnetic field device (12), turn on the lining bias power supply (15), adjust the bias voltage of the lining bias straight tube and porous baffle assembly (14), turn on the movable coil device power supply (10) to adjust The movable coil device (9) adjusts the output resistance of the rheostat device (10), and the waveform synchronous matching device (8) controls the bias power supply (1) and the twin target high-power pulse magnetron sputtering power supply (4) to be turned on simultaneously, and the twin target The period of the output pulse of the target high-power pulse magnetron sputtering power supply (4) is an integer multiple of the outpu...

specific Embodiment approach 3

[0045] Embodiment 3: The difference between this embodiment and Embodiment 1 is that a combined magnetic field is connected with a vacuum coating method in which the lined straight tube and the porous baffle are combined, the arc power supply (2) is turned on, and the multi-stage magnetic field power supply is turned on (5) Adjust the multi-stage magnetic field device (12), turn on the lining bias power supply (15), adjust the bias voltage of the lining bias straight tube and porous baffle assembly (14), turn on the movable coil device power supply (10) to adjust The movable coil device (9) adjusts the output resistance of the rheostat device (10), and the waveform synchronous matching device (8) controls the bias power supply (1) and the twin target high-power pulse magnetron sputtering power supply (4) to be turned on simultaneously, and the twin target The target high-power pulse magnetron sputtering power supply (4) outputs high-power pulses and the bias pulse waveform outp...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a vacuum film plating method with a combined magnetic field, a lined straight pipe and a multihole baffle combined, and belongs to the technical field of material surface treatment. The vacuum film plating method with the combined magnetic field, the lined straight pipe and the multihole baffle combined aims to solve the problems such as the pollution of macroparticles to athin film, the use limitation of a target material, the loss of magnetically-filtered arc plasma and the instability of high-power pulsed magnetron sputtering discharge in arc ion plating. Devices relating to the vacuum film plating method comprise a bias voltage power source, an arc ion plating target source, a power source of the arc ion plating target source, a multistage magnetic field device, a power source of the multistage magnetic field device, a movable coil device, a power source of the movable coil device, a waveform matching device, a high-power pulsed magnetron sputtering targetsource, a power source of the high-power pulsed magnetron sputtering target source, a combined device of the lined bias voltage straight pipe and the multihole baffle, a power source of the combined device of the lined bias voltage straight pipe and the multihole baffle and the like. Thin film deposition comprises the steps that the devices are connected; a system is started; when the vacuum degree in a vacuum chamber is less than 10<-4> Pa, a working gas is introduced into the vacuum chamber, a film plating power source is started, the bias voltage power source adjusts the energy of the plasma, the multistage magnetic field device and the movable coil device eliminate defects of the macroparticles and guide the transmission of the composite plasma, the loss in the vacuum chamber is reduced, and technical parameters are set.

Description

technical field [0001] The invention relates to a vacuum coating method in which a combined magnetic field is combined with a lined straight pipe and a porous baffle, and belongs to the technical field of material surface treatment. Background technique [0002] In the process of preparing thin films by arc ion plating, due to the arc spot current density as high as 2.5~5×10 10 A / m 2 , causing molten liquid metal to appear at the arc spot position on the target surface, which is splashed out in the form of droplets under the action of local plasma pressure, and adheres to the surface of the film or is embedded in the film to form "macroparticles" (Macroparticles) Defects (BoxmanR L, Goldsmith S. Macroparticle contamination in cathodic arc coatings: generation, transport and control [J]. Surf Coat Tech, 1992, 52(1): 39-50.). In the arc plasma, since the movement speed of electrons is much greater than that of ions, the number of electrons reaching the surface of large parti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): C23C14/32C23C14/35C23C14/54
CPCC23C14/325C23C14/352C23C14/3485C23C14/54
Inventor 魏永强王好平宗晓亚侯军兴蒋志强
Owner 魏永强
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products