The invention relates to a method for collecting data of three-dimensional electron diffraction, in particular to a method for collecting data of three-dimensional electron diffraction, in particular to a method for collecting data of three-dimensional electron diffraction, in particular to a method for collecting data of three-dimensional electron diffraction, in particular to a method for collecting data of three-dimensional electron diffraction, which is named as continuous precession electron diffraction tomography (cPEDT), and the method is a combination of precession electron diffraction tomography (PEDT) and continuous precession electron diffraction (cRED). By using the cPEDT method, the unnecessary electron dose introduced in the step-by-step process in the PEDT method can be avoided, and meanwhile, the data collected by the cPEDT can be used for dynamic refinement so as to determine the accurate structure of the material. According to the method, the application of three-dimensional electron diffraction on some electron beam sensitive materials, such as metal-organic framework materials (MOFs), covalent organic framework materials (COFs), some organic matter crystals, some inorganic matter crystals and the like, can be promoted.