1. The name of the design product: ATE tester
data analysis tool
graphical user interface for
electronic equipment. 2. The use of the design product: for
electronic equipment. 3. The design points of the design product: the
graphical user interface content displayed on the
electronic equipment. 4. The picture or photo that best shows the design points: front view. 5. The conventional design, omit the rear view, left view, right view, top view, bottom view. 6. The use of the
graphical user interface: for the analysis of ATE tester data. 7. The human-computer
interaction mode of the graphical
user interface: the front view is the main interface, click the "Select CSV file" button, a "Select CSV file"
dialog box pops up, enter
state diagram 1; in the "Select CSV file"
dialog box of
state diagram 1, select a "csv" suffix document, click the "Open (O)" button, the "Select CSV file"
dialog box automatically closes, loads the selected file, and a "Load successful" dialog box pops up, enter
state diagram 2; in state diagram 2, click the "OK" button of the "Load successful" dialog box to close it, click the drop-down
list box behind the "Select testItem:" text in the interface to open the
list items of the drop-down
list box, enter state diagram 3; select the "Contact" list item of the drop-down
list box, click the "Start analysis" button in the interface, and the analysis tool analyzes the Contact (
contact test) data. After the analysis is completed, the CDF
scatter plot and
wafer distribution plot of Contact are generated, and state diagram 4 is entered; move the mouse arrow to the CDF
scatter plot area below the "Value vs CDF Output" text, turn the mouse wheel down, and the CDF
scatter plot area is displayed in a smaller size, enter state diagram 5; click the drop-down
list box behind the "Select testItem:" text in the interface to open the list items of the drop-down
list box, enter state diagram 6; select the "Mon_VARY" list item of the drop-down list box, click the "Start analysis" button in the interface, and the analysis tool analyzes the Mon_VARY (bit
high voltage test) data. After the analysis is completed, the CDF scatter plot and
wafer distribution plot of Mon_VARY data are generated, and state diagram 7 is entered.