Method for preparing n-type crystalline silica double-side solar cell
A double-sided solar cell, crystalline silicon technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of poor square resistance distribution uniformity of the diffusion layer, incomplete solutions, changes in silicon wafer performance, etc., and achieve square resistance distribution. Uniform, precise and controllable doping concentration, and excellent performance
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Embodiment 1
[0022] The tubular PECVD method is used to deposit various types of silicon oxide films required for diffusion, which are specifically realized through the following technical solutions.
[0023] (1) Texture and clean the surface of the silicon wafer.
[0024] (2) Tubular PECVD method deposits a layer of non-doped silicon oxide film on the side where phosphorus needs to be diffused, with a thickness of 10nm.
[0025] (3) Tubular PECVD method deposits heavily boron-doped silicon oxide film with a thickness of 100nm on the side where boron needs to be diffused, using borane as a dopant.
[0026] (4) Tubular PECVD method uses phosphine as a dopant to deposit a heavily phosphorus-doped oxide film on the side where phosphorus needs to be diffused, with a thickness of 80nm.
[0027] (5) Diffusion under normal pressure and high temperature in a clean air atmosphere in a quartz tube furnace to simultaneously prepare a doped n-type layer and a doped p-type layer.
[0028] (6) HF acid...
Embodiment 2
[0034] Various types of silicon oxide films required for diffusion are deposited by magnetron sputtering, which is specifically realized through the following technical solutions.
[0035] (1) Texture and clean the surface of the silicon wafer.
[0036] (2) The magnetron sputtering method uses a boron-doped silicon target, and deposits a heavily boron-doped silicon oxide film on the side where boron needs to be diffused by reactive sputtering, with a thickness of 100nm.
[0037] (3) The magnetron sputtering method uses a phosphorus-doped silicon target, and deposits a heavily phosphorus-doped silicon oxide film on the side where phosphorus needs to be diffused by reactive sputtering, with a thickness of 100nm.
[0038] (4) Diffusion under normal pressure and high temperature in a clean air atmosphere in a quartz tube furnace to simultaneously prepare a doped n-type layer and a doped p-type layer.
[0039] (5) HF acid removes the oxide on both sides of the silicon wafer, and c...
Embodiment 3
[0045] Various types of silicon oxide films required for diffusion are deposited by magnetron sputtering, which is specifically realized through the following technical solutions.
[0046] (1) Texture and clean the surface of the silicon wafer.
[0047] (2) Deposit a layer of non-doped silicon oxide film on the side where phosphorus needs to be diffused by reactive magnetron sputtering, with a thickness of 20nm.
[0048] (3) The magnetron sputtering method uses a boron-doped silicon target, and deposits a heavily boron-doped silicon oxide film on the side where boron needs to be diffused by reactive sputtering, with a thickness of 100nm.
[0049] (4) The magnetron sputtering method uses a phosphorus-doped silicon target, and deposits a silicon oxide film heavily doped with phosphorus on the side where phosphorus needs to be diffused by reactive sputtering, with a thickness of 100nm.
[0050] (5) Diffusion under normal pressure and high temperature in a clean air atmosphere in...
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