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Spectral selective radiation infrared stealth material and preparation method thereof

A stealth material and selective technology, which is applied in chemical instruments and methods, optics, optical components, etc., can solve the problems of immature application of selective radiation materials, complex structure and process, and material structure damage, and facilitate large-scale preparation and application, the preparation process is simple and feasible, and the effect of low equipment requirements

Active Publication Date: 2020-05-15
NAT UNIV OF DEFENSE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the application of selective radiation materials in the field of infrared stealth is still immature
Chinese patent CN104865617A discloses an infrared stealth film with spectral selectivity and low emissivity and its preparation method. The infrared stealth film is composed of high refractive index material germanium and low refractive index material magnesium fluoride, but the material structure and The process is relatively complicated, the number of film layers is large and the film is thick, the internal stress of the material increases, and the structure of the material is easily damaged in a high temperature environment

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  • Spectral selective radiation infrared stealth material and preparation method thereof
  • Spectral selective radiation infrared stealth material and preparation method thereof
  • Spectral selective radiation infrared stealth material and preparation method thereof

Examples

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Embodiment 1

[0033] A kind of spectrum selective radiation infrared stealth material of the present invention, structure such as figure 1 As shown, it includes silicon substrate 1, aluminum nitride layer 2 (thickness 1mm), first germanium layer 3 (thickness 313nm), magnesium fluoride layer 4 (thickness 117nm) and second germanium layer 5 (thickness 313nm).

[0034] The preparation method of the spectrally selective radiation infrared stealth material in this embodiment comprises the following steps:

[0035] (1) Clean the silicon wafer with deionized water, then soak it in absolute ethanol for ultrasonic cleaning, and dry it;

[0036] (2) High-purity aluminum nitride powder is used as the raw material, and the sintering aid is yttrium oxide (Y 2 o 3 ) and Al 2 Y 4 o 9 , the raw materials and sintering aids, conventional binders and solvents are prepared to obtain casting slurry; the casting tape with uniform thickness is obtained by scraper casting method, and then die-cutting, lamina...

Embodiment 2

[0041] A spectrally selective radiation infrared stealth material of the present invention, comprising an aluminum sheet substrate, an aluminum nitride layer (thickness 1.5mm), a first silicon layer (thickness 345nm), a zinc sulfide layer (thickness 227nm) and a second silicon layer (thickness 342nm).

[0042] The preparation method of the spectrally selective radiation infrared stealth material in this embodiment comprises the following steps:

[0043] (1) Clean the aluminum sheet with deionized water first, then soak it in absolute ethanol for ultrasonic cleaning, and dry it;

[0044] (2) Using the magnetron sputtering method (DC reactive sputtering, power 200W, deposition temperature at room temperature, flow ratio of nitrogen and argon: 1:2, deposition pressure: 0.8Pa), prepare a layer of thickness 1.5 on the surface of the aluminum sheet mm of aluminum nitride layer;

[0045] (3) Using magnetron sputtering technology, first deposit a silicon film with a thickness of 345...

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Abstract

The invention discloses a spectral selective radiation infrared stealth material which sequentially comprises a substrate, an aluminum nitride layer and a dielectric layer, the dielectric layer is composed of a plurality of dielectric layers A and dielectric layers B which are arranged alternately; the dielectric layer A is made of any one of germanium, tellurium and silicon, and the dielectric layer B is made of any one of zinc sulfide, zinc selenide, magnesium fluoride, barium fluoride and calcium fluoride. The preparation method of the material comprises the following steps: (1) cleaning and drying the substrate; (2) preparing an aluminum nitride layer on the surface of the substrate by adopting a magnetron sputtering or tape casting method; and (3) adopting magnetron sputtering or electron beam evaporation, depositing a dielectric layer A on the aluminum nitride layer firstly, then depositing a dielectric layer B on the aluminum nitride layer, depositing the dielectric layer A andthe dielectric layer B repeatedly and alternately until the designed number of layers is reached, and completing preparation of the infrared stealth material. The spectral selective radiation infraredstealth material disclosed by the invention considers the requirements of low emissivity and radiation heat dissipation, and has important significance for better realizing infrared stealth.

Description

technical field [0001] The invention belongs to the field of new materials, in particular to a spectral selective radiation infrared stealth material and a preparation method thereof. Background technique [0002] With the rapid development of photoelectric technology, various reconnaissance techniques have emerged as the times require. Stealth technology plays an increasingly important role in modern warfare. In various stealth technologies, infrared stealth occupies a very important position. Infrared stealth refers to eliminating or reducing the difference in the radiation characteristics of the two atmospheric windows (3.0μm~5.0μm, 8.0μm~14.0μm) in the middle and far infrared bands between the target and the background. [0003] At present, the use of low-emissivity infrared stealth materials is still the most important way of infrared stealth. Traditional infrared low-emissivity materials have low emissivity in the entire infrared band, covering the 3.0 μm to 5.0 μm ...

Claims

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Application Information

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IPC IPC(8): G02B1/10B32B9/00B32B9/04B32B15/04
CPCG02B1/10B32B9/00B32B9/04B32B15/04B32B2307/306
Inventor 刘东青彭亮程海峰
Owner NAT UNIV OF DEFENSE TECH
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