Spectral selective radiation infrared stealth material and preparation method thereof
A stealth material and selective technology, which is applied in chemical instruments and methods, optics, optical components, etc., can solve the problems of immature application of selective radiation materials, complex structure and process, and material structure damage, and facilitate large-scale preparation and application, the preparation process is simple and feasible, and the effect of low equipment requirements
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Embodiment 1
[0033] A kind of spectrum selective radiation infrared stealth material of the present invention, structure such as figure 1 As shown, it includes silicon substrate 1, aluminum nitride layer 2 (thickness 1mm), first germanium layer 3 (thickness 313nm), magnesium fluoride layer 4 (thickness 117nm) and second germanium layer 5 (thickness 313nm).
[0034] The preparation method of the spectrally selective radiation infrared stealth material in this embodiment comprises the following steps:
[0035] (1) Clean the silicon wafer with deionized water, then soak it in absolute ethanol for ultrasonic cleaning, and dry it;
[0036] (2) High-purity aluminum nitride powder is used as the raw material, and the sintering aid is yttrium oxide (Y 2 o 3 ) and Al 2 Y 4 o 9 , the raw materials and sintering aids, conventional binders and solvents are prepared to obtain casting slurry; the casting tape with uniform thickness is obtained by scraper casting method, and then die-cutting, lamina...
Embodiment 2
[0041] A spectrally selective radiation infrared stealth material of the present invention, comprising an aluminum sheet substrate, an aluminum nitride layer (thickness 1.5mm), a first silicon layer (thickness 345nm), a zinc sulfide layer (thickness 227nm) and a second silicon layer (thickness 342nm).
[0042] The preparation method of the spectrally selective radiation infrared stealth material in this embodiment comprises the following steps:
[0043] (1) Clean the aluminum sheet with deionized water first, then soak it in absolute ethanol for ultrasonic cleaning, and dry it;
[0044] (2) Using the magnetron sputtering method (DC reactive sputtering, power 200W, deposition temperature at room temperature, flow ratio of nitrogen and argon: 1:2, deposition pressure: 0.8Pa), prepare a layer of thickness 1.5 on the surface of the aluminum sheet mm of aluminum nitride layer;
[0045] (3) Using magnetron sputtering technology, first deposit a silicon film with a thickness of 345...
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