GaN (gallium nitride)-based semiconductor laser and manufacturing method thereof
A gallium nitride based technology and a manufacturing method, applied in semiconductor lasers, lasers, laser parts, etc., can solve problems such as crystal quality decline, defect concentration increase, laser increase, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0031] In order to further illustrate the effect of the device structure, we take a GaN-based laser with an operating wavelength of 405nm as an example to illustrate the preparation process of the device structure. The material and thickness of each layer are shown in Table 1. The details are as follows: the device structure is grown on the gallium nitride substrate 10 of the (0001) plane by using the MOCVD method. The structure includes, n-type Al 0.2 Ga 0.8 N / GaN superlattice lower confinement layer 11 (thickness is 0.76 μ m, GaN well width is 2.0 nm, Al 0.2 Ga 0.8N barrier width is 2.0nm, doping concentration is 3.0×10 18 cm -3 ), n-type Al 0.25 Ga 0.75 N / GaN multi-quantum well quantum cascade radiation layer 12, this layer has three periods in total, and each period is Al from bottom to top 0.25 Ga 0.75 N(2.0nm) / GaN(2.8nm) / Al 0.25 Ga 0.75 N(2.0nm) / GaN(1.8nm) / Al 0.25 Ga 0.75 N(1.6nm) / GaN(1.8nm), the doping concentration is 3.0×10 16 cm -3 , n-type GaN lower w...
Embodiment 2
[0035] In order to illustrate the application value of the present invention, we take a GaN-based laser with an operating wavelength of 450 nm as an example to illustrate the characteristics of the device structure. Compared with Example 1, the material and thickness of each layer are changed to In except for the active area 0.3 Ga 0.7 N / In 0.02 Ga 0.98 N multiple quantum wells (multiple quantum wells are 3 periods, In 0.3 Ga 0.7 N well width is 3nm, In 0.02 Ga 0.98 N barrier width is 5nm, Si impurity concentration is 3.0×10 16 cm -3 ), the parameters, growth conditions, device size and fabrication process of other layers are exactly the same as those in Example 1, as shown in Table 1. The post-production process of the device is also the same as that of Embodiment 1.
[0036] The energy level of the active region of the quantum cascade radiation layer is calculated by self-consistently solving the Schrödinger equation and the Poisson equation. The energy level interv...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com