This invention relates to the field of defect detection technology, specifically to a PCB defect detection method for industrial incremental scenarios. It includes a
feature fusion method based on a lightweight segmentation strategy that combines random
pruning with separate
processing of strong and weak features. This strategy simplifies redundant computation by using a
feature selector, and differentiates and recombines defect features of varying saliency during the
feature fusion stage. This significantly improves
inference speed while maintaining the precision of segmentation, solving the problems of high computational cost and difficulty in capturing minute defects in existing methods. The method also includes an
incremental learning approach employing a background classifier
adaptation mechanism and local semantic
distillation. Class-specific regularization and spatially weighted logical alignment
distillation work synergistically. By dynamically calibrating the background prediction logic and constructing a pixel-level
semantic relevance matrix, it achieves deep alignment between new and old knowledge and
background distribution. This effectively solves the catastrophic forgetting problem caused by the evolution of PCB background texture in existing
incremental learning methods, significantly enhancing detection stability and the adaptability of the enhanced model.