Propagation delays that can occur in and between the conductors of multi-core cables, with or without connectors, with or without typical transmitting and receiving components, due to and with different constructions and configurations on and between individual lines, conductors, conductor pairs, or conductor groups, often only exhibit propagation delays in the low
picosecond range and are therefore difficult to measure. Consequently, errors in very fast
data transmission often go undetected, and their cause remains unclear. By simultaneously injecting a high-frequency
digital signal with a frequency f1 as a measurement
signal onto all conductors or conductor pairs, so that this measurement
signal travels in parallel through all conductors of the cable to the cable end, and all measurement signals are sampled at the
injection point near the cable entry and after passing through the cable at the cable end on each conductor or conductor pair at the exact same time with a frequency f2 = f1+df, digital, very low-frequency signals of frequency df are generated. The phase relationships of these signals correspond to the phase relationships of the high-frequency measurement
signal at different locations. This allows even small
propagation delay differences in the
picosecond range and below to be measured and their causes often only then identified. This allows comparative measurements of the signal transmission characteristics of cables for RJ connectors, RJ45, (modular connectors),
USB, IO-Link, SPE, LAN,
Ethernet, DVI,
HDMI, Sub-D, BNC, IEC
bus, pin headers for device-specific internal connections, including those of other technologies and cable types.