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3results about How to "Improve upload efficiency" patented technology

General semiconductor test data full life cycle management system

PendingCN121958196AImplement unified access analysisImplement normalizationData processing applicationsFile system administrationFull life cycleData mining
The invention provides a general semiconductor test data full life cycle management system, and the system comprises a test source data access module which is used for uploading a source test file in a test machine to the system; the full test data analysis and standard model conversion module is used for converting the uploaded source test file into a test file in a standard data format and transmitting the test file to the multi-dimensional KPI atomic model operation and persistent storage module; the multi-dimensional KPI atomic model operation and persistence storage module is used for calculating a multi-dimensional KPI atomic result according to the data in the test file in the standard data format and storing the multi-dimensional KPI atomic result to a persistence layer database; and the unified service output module is used for receiving a user query request, performing aggregation calculation on the multi-dimensional KPI atomic result in the persistent layer database according to the user query request, and returning a KPI result meeting the user query request. The system can improve the utilization efficiency of semiconductor test data and reduce the operation cost.
Owner:SUZHOU TF AMD SEMICON CO LTD

Method and system for uploading TBox log based on dynamically configured fragment number

The invention provides a TBox log uploading method and system based on the number of dynamically configured fragments, and belongs to the technical field of the Internet of Vehicles, and the method comprises the steps: responding to a TBox log uploading instruction, obtaining network parameters of an environment where a target vehicle is located, which are collected through an operation system network interface, and obtaining equipment operation parameters collected through a TBox hardware monitoring interface; calculating an optimal fragment number according to the network parameters and the equipment operation parameters; and obtaining a corresponding number of pre-signature addresses according to the optimal fragment number, cutting the TBox log file into a corresponding number of fragments according to the optimal fragment number, and uploading the fragments to a cloud according to the pre-signature addresses. According to the method and the device, the log data can be uploaded with the optimal fragment size, so that network resources are utilized to the maximum extent, and the time required for uploading is shortened. In addition, a plurality of data blocks are allowed to be processed in parallel through fragmentation uploading, the overall uploading speed is further increased, and the advantage is more obvious especially in a high-speed network environment.
Owner:DONGFENG MOTOR GRP

Test data uploading method, device and system

PendingCN122261867AImprove upload efficiencyAvoid copying dataInput/output to record carriersInterprogram communicationSemaphoreTest board
A test data uploading method, device and system are disclosed. Based on a first test vector, a corresponding test board card is controlled to perform a first test operation, and the first test operation includes writing test output data corresponding to the first test operation into a first storage area of a memory of the test board card. During the execution of the first test operation by each test board card, in response to receiving a first semaphore, test output data in a second storage area of the memory of the test board card is synchronously written into shared memory, and the test output data in the second storage area is test output data corresponding to a second test operation performed before the first test operation. In response to the test output data corresponding to the second test operation being successfully written into the shared memory, a second semaphore is sent to an upper computer, and the upper computer reads the test output data corresponding to the second test operation from the shared memory according to the second semaphore, so that test data uploading is realized during the test process, and the data uploading efficiency is improved.
Owner:HANGZHOU CHANGCHUAN TECH CO LTD