The application discloses a
chip test probe, which comprises a
chip probe, a needle tube and a temperature change inlay core. The needle tube with the built-in spiral spring is located in a needle sleeve, the
tail of the needle head is located in the needle tube, the head of the needle head extends out of the needle tube, the
tail of the needle head has a hollow wide-mouth tube with a
diameter larger than the needle head, the hollow wide-mouth tube is composed of a plurality of strip petals arranged at intervals in the circumferential direction, a plurality of the strip petals enclose a storage cavity, and a line groove is arranged between the adjacent strip petals; the temperature change inlay core is embedded in the storage cavity of the hollow wide-mouth tube, one end of the spiral spring is in contact with the temperature change inlay core, and the other end is in contact with the
tail of the needle tube. The
chip test probe improves the sensitivity and accuracy of the detection
signal, avoids the risk of
electric spark, improves the safety hidden danger, further improves the stability of the detection data, and improves the consistency and comparability of the data.